Internet Explorer is not a supported browser for TI.com. For the best experience, please use a different browser.

Test & measurement

Achieve higher density testing, lower test times and higher accuracy with our analog and embedded processing products and expertise

Create innovative and differentiated instrumentation & electronic test equipment with our high-performance signal chain, power, and processors products. By providing both industry-leading products and application-specific reference design resources, we can help you solve your top design challenges and accelerate your time-to-market. We also enable scalability and high-performance in applications such as battery formation and semiconductor ATE.

Featured applications

Design accurate DAQs over a wide range of bandwidths and applications with our high-performance signal chains

Why choose TI for your test & measurement applications?

checkmark

Design for the lowest noise

Achieve the highest SNR performance with our high-performance signal chain and low-noise power products and reference designs to accelerate your time to market.

checkmark

Maximize channel density

Reduce the size of your signal chain and power solutions with our innovative package technology and products for design integration.

checkmark

Achieve high precision & accuracy

Meet your performance needs and enhance your performance-to-cost ratio with the latest precision ADCs and amplifiers.

Engineering what's next in test and measurement

The growing demand for ICs is driving an increase in both test channel density as well as an increase in voltages and currents that VI instruments need to support. Our power amplifiers, switches, and power modules allow for reduced solution sizes, enabling an increase in test channel density.

Application brief
Pairing up Op Amp and Buffer for Higher Output Power Plus Speed in ATE
This application note discusses a composite amplifier loop that uses a precision-amplifier and a high-output current buffer to achieve key system requirements.
PDF
Application brief
How to Select Precision Amplifiers for Semiconductor Testers (Rev. A)
Semiconductor test equipment is an important and ever-evolving industry. As semiconductors and integrated circuits continue to become more advanced and stretch the limits on electronics, test equipment must continue to improve.
PDF | HTML
Application note
When to Replace a Relay With a Multiplexer (Rev. A)
Photorelays, mechanical relays and flat on-resistance multiplexers - In this application note, we go over the differences in performance, cost, size, and reliability between these three solutions.
PDF | HTML
Featured products for test channel density
NEW TSMU818A030 ACTIVE 8-channel, 18-bit, 30V, 100mA output, high-capacitive- drive parametric measurement unit (PMU)
NEW DAC80516 ACTIVE 16-channel 16-bit voltage-output (0-5V) with internal 2.5V reference and 50mA drive capability
NEW TMUXS7614D PREVIEW 50V, SPI-controlled, 1Ω RON, high-density, 1:1 (SPST) 8-channel precision switch with 1.8V logic

Minimizing noise is a common challenge for engineers designing a power supply for noise-sensitive systems for test and measurement applications, such as clocks, data converters or amplifiers. Although the term “noise” can mean different things to different people, we define noise as low-frequency thermal noise generated by resistors and transistors in the circuit.

You can identify noise through a spectral noise-density curve in microvolts per square-root hertz, and as integrated output noise in root-mean-square microvolts, typically over a specific range from 100 Hz to 100 kHz. We offer products and reference designs that help mitigate potential noise coupling that can affect the performance of devices in the signal chain.

Technical article
What is a low noise inverting buck converter?
Do you need a negative voltage to power your data converter or amplifier? These types of systems usually require low noise to power such sensitive analog circuitry. How does a low-noise inverting buck converter work? Read more.
PDF | HTML
Product overview
1µV Ultra-Low Noise 12 Vin 3.3 Vout 1-A Power Supply
This application brief goes over the process of creating a high efficiency (> 75%) and ultra low noise (<10µVRMS) power supply by combining a switching converter and an LDO.
PDF | HTML
More literature
Low-noise and low-ripple techniques for a supply without an LDO PPT
Power supply design seminar: Detailed summary of Low-noise and low-ripple techniques for a supply without an LDO
PDF
Featured products for low-noise power
NEW REF80 PREVIEW Temperature-controlled buried-Zener reference with 0.05ppm/°C drift and <1ppm stability
NEW TPSM82916 PREVIEW 17V VIN, 6A low-noise low-ripple buck module with integrated ferrite bead filter compensation
NEW LM65645-Q1 PREVIEW Automotive, 3V to 65V, 4.5A synchronous step-down converter optimized for power density and low EMI

Design & development resources

Reference design
4-channel, 50A, digital control battery cell tester reference design
The reference design illustrates a method to control the current and voltage of a bidirectional buck converter power stage using a C2000™ real-time microcontroller (MCU) and a precision analog-to-digital converter (ADC) ADS8588S. The design achieves less than ±10mA current regulation error and (...)
Reference design
Digital control cost-optimized 10-A battery formation and test reference design
This reference design provides a cost-effective solution for battery formation and test applications. This design uses the C2000™ real-time control MCU for high-resolution pulse-width modulation (PWM) generation, and constant-current (CC) and constant-voltage (CV)
control loops. It efficiently (...)
Reference design
Precision signal chain for digital multimeters reference design

This reference design explains the theory, design and testing of a high-performance signal chain for DC measurements. The main target application is digital multimeters (DMMs), however the design can also be applicable to other applications, such as data acquisition (DAQ) and condition monitoring. (...)

Reference designs related to Test & measurement

Use our reference design selection tool to find designs that best match your application and parameters.

Featured products

NEW Analog switches & muxes TMUX7612 ACTIVE 50V, 1.3Ω RON, 1:1 (SPST) four-channel precision multiplexer with 1.8V logic
Analog switches & muxes TMUX8212 ACTIVE 100-V, flat RON, 1:1 (SPST), four-channel switches with latch-up Immunity and 1.8-V
NEW Opto-emulators ISOM8610 ACTIVE DC input, normally open output, single-channel isolated switch opto-emulator
Precision ADCs ADS8686S ACTIVE 16-channel 16-bit 1-MSPS dual simultaneous-sampling ADC with integrated analog front end (AFE)
NEW Precision ADCs ADS127L21B ACTIVE 24bit, 512kSPS wide-bandwidth delta-sigma ADC with high-linearity of 0.8 ppm max INL
Linear & low-dropout (LDO) regulators TPS7A96 ACTIVE 2-A, ultra-low noise ultra-high PSRR RF voltage regulator

Technical resources

Resource
Resource
Analog engineer's calculator
The Analog Engineer’s Calculator is designed to speed up many of the repetitive calculations that analog circuit design engineers use on a regular basis.
Resource
Resource
PSpice® for TI design and simulation tool
PSpice® for TI is a design and simulation environment that helps evaluate functionality of analog circuits. This full-featured, design and simulation suite uses an analog analysis engine from Cadence®.
Resource
Resource
Adapter card to connect precision ADC evaluation modules to TMDS64GPEVM or TMDS243GPEVM PRU
Interface to more than 25 precision analog-to-digital converter (ADC) evaluation modules (EVMs) for communication, data capture and software development.