SNAS717A April   2017  – October 2021 ADC12D1620QML-SP

PRODUCTION DATA  

  1. 1 Features
  2. 2 Applications
  3. 3 Description
  4. 4 Revision History
  5. 5 Pin Configuration and Functions
  6. 6 Specifications
    1. 6.1  Absolute Maximum Ratings
    2. 6.2  ESD Ratings
    3. 6.3  Recommended Operating Conditions
    4. 6.4  Thermal Information
    5. 6.5  Converter Electrical Characteristics: Static Converter Characteristics
    6. 6.6  Converter Electrical Characteristics: Dynamic Converter Characteristics
    7. 6.7  Converter Electrical Characteristics: Analog Input/Output and Reference Characteristics
    8. 6.8  Converter Electrical Characteristic: Channel-to-Channel Characteristics
    9. 6.9  Converter Electrical Characteristics: LVDS CLK Input Characteristics
    10. 6.10 Electrical Characteristics: AutoSync Feature
    11. 6.11 Converter Electrical Characteristics: Digital Control and Output Pin Characteristics
    12. 6.12 Converter Electrical Characteristics: Power Supply Characteristics
    13. 6.13 Converter Electrical Characteristics: AC Electrical Characteristics
    14. 6.14 Electrical Characteristics: Delta Parameters
    15. 6.15 Timing Requirements: Serial Port Interface
    16. 6.16 Timing Requirements: Calibration
    17. 6.17 Quality Conformance Inspection
    18. 6.18 Timing Diagrams
    19. 6.19 Typical Characteristics
  7. 7 Detailed Description
    1. 7.1 Overview
      1. 7.1.1 Operation Summary
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1 Input Control and Adjust
        1. 7.3.1.1 AC- and DC-Coupled Modes
        2. 7.3.1.2 Input Full-Scale Range Adjust
        3. 7.3.1.3 Input Offset Adjust
        4. 7.3.1.4 Low-Sampling Power-Saving Mode (LSPSM)
        5. 7.3.1.5 DES Timing Adjust
        6. 7.3.1.6 Sampling Clock Phase Adjust
      2. 7.3.2 Output Control and Adjust
        1. 7.3.2.1 SDR / DDR Clock
        2. 7.3.2.2 LVDS Output Differential Voltage
        3. 7.3.2.3 LVDS Output Common-Mode Voltage
        4. 7.3.2.4 Output Formatting
        5. 7.3.2.5 Test-Pattern Mode
        6. 7.3.2.6 Time Stamp
      3. 7.3.3 Calibration Feature
        1. 7.3.3.1 Calibration Control Pins and Bits
        2. 7.3.3.2 How to Execute a Calibration
        3. 7.3.3.3 On-Command Calibration
        4. 7.3.3.4 Calibration Adjust
          1. 7.3.3.4.1 Read/Write Calibration Settings
        5. 7.3.3.5 Calibration and Power-Down
        6. 7.3.3.6 Calibration and the Digital Outputs
      4. 7.3.4 Power Down
      5. 7.3.5 Low-Sampling Power-Saving Mode (LSPSM)
    4. 7.4 Device Functional Modes
      1. 7.4.1 DES/Non-DES Mode
      2. 7.4.2 Demux/Non-Demux Mode
    5. 7.5 Programming
      1. 7.5.1 Control Modes
        1. 7.5.1.1 Non-ECM
          1. 7.5.1.1.1  Dual-Edge Sampling Pin (DES)
          2. 7.5.1.1.2  Non-Demultiplexed Mode Pin (NDM)
          3. 7.5.1.1.3  Dual Data-Rate Phase Pin (DDRPh)
          4. 7.5.1.1.4  Calibration Pin (CAL)
          5. 7.5.1.1.5  Low-Sampling Power-Saving Mode Pin (LSPSM)
          6. 7.5.1.1.6  Power-Down I-Channel Pin (PDI)
          7. 7.5.1.1.7  Power-Down Q-Channel Pin (PDQ)
          8. 7.5.1.1.8  Test-Pattern Mode Pin (TPM)
          9. 7.5.1.1.9  Full-Scale Input-Range Pin (FSR)
          10. 7.5.1.1.10 AC- or DC-Coupled Mode Pin (VCMO)
          11. 7.5.1.1.11 LVDS Output Common-Mode Pin (VBG)
        2. 7.5.1.2 Extended Control Mode
          1. 7.5.1.2.1 Serial Interface
    6. 7.6 Register Maps
      1. 7.6.1 Register Definitions
  8. 8 Application Information Disclaimer
    1. 8.1 Application Information
      1. 8.1.1 Analog Inputs
        1. 8.1.1.1 Acquiring the Input
        2. 8.1.1.2 Driving the ADC in DES Mode
        3. 8.1.1.3 FSR and the Reference Voltage
        4. 8.1.1.4 Out-Of-Range Indication
        5. 8.1.1.5 AC-Coupled Input Signals
        6. 8.1.1.6 DC-Coupled Input Signals
        7. 8.1.1.7 Single-Ended Input Signals
      2. 8.1.2 Clock Inputs
        1. 8.1.2.1 CLK Coupling
        2. 8.1.2.2 CLK Frequency
        3. 8.1.2.3 CLK Level
        4. 8.1.2.4 CLK Duty Cycle
        5. 8.1.2.5 CLK Jitter
        6. 8.1.2.6 CLK Layout
      3. 8.1.3 LVDS Outputs
        1. 8.1.3.1 Common-Mode and Differential Voltage
        2. 8.1.3.2 Output Data Rate
        3. 8.1.3.3 Terminating Unused LVDS Output Pins
      4. 8.1.4 Synchronizing Multiple ADC12D1620 Devices in a System
        1. 8.1.4.1 AutoSync Feature
        2. 8.1.4.2 DCLK Reset Feature
      5. 8.1.5 Temperature Sensor
    2. 8.2 Radiation Environments
      1. 8.2.1 Total Ionizing Dose
      2. 8.2.2 Single Event Latch-Up and Functional Interrupt
      3. 8.2.3 Single Event Upset
    3. 8.3 Cold Sparing
  9. 9 Power Supply Recommendations
    1. 9.1 System Power-On Considerations
      1. 9.1.1 Control Pins
      2. 9.1.2 Power On in Non-ECM
      3. 9.1.3 Power On in ECM
      4. 9.1.4 Power-on and Data Clock (DCLK)
  10. 10Layout
    1. 10.1 Layout Guidelines
      1. 10.1.1 Power Planes
      2. 10.1.2 Bypass Capacitors
      3. 10.1.3 Ground Planes
      4. 10.1.4 Power System Example
    2. 10.2 Layout Example
    3. 10.3 Thermal Considerations
    4. 10.4 Board Mounting Recommendation
  11. 11Device and Documentation Support
    1. 11.1 Device Support
      1. 11.1.1 Device Nomenclature
      2. 11.1.2 Third-Party Products Disclaimer
    2. 11.2 Receiving Notification of Documentation Updates
    3. 11.3 Support Resources
    4. 11.4 Trademarks
    5. 11.5 Electrostatic Discharge Caution
    6. 11.6 Glossary
  12. 12Mechanical, Packaging, and Orderable Information
    1. 12.1 Engineering Samples

Package Options

Refer to the PDF data sheet for device specific package drawings

Mechanical Data (Package|Pins)
  • FVA|256
  • NAA|376
Thermal pad, mechanical data (Package|Pins)
Orderable Information
7.5.1.1.1 Dual-Edge Sampling Pin (DES)

The dual-edge sampling (DES) pin selects whether the ADC12D1620 is in DES mode (logic-high) or non-DES mode (logic-low). DES mode means that a single analog input is sampled by both I and Q channels in a time-interleaved manner. One of the ADCs samples the input signal on the rising sampling clock edge (duty cycle corrected); the other ADC samples the input signal on the falling sampling clock edge (duty cycle corrected). In non-ECM, only the I input may be used for DES mode, also known as DESI mode. In ECM, the Q input may be selected through the DEQ bit of the Configuration Register (Addr: 0h; Bit: 6), also known as DESQ mode. In ECM, both the I and Q inputs may be selected, also known as DESIQ or DESCLKIQ mode.

To use this feature in ECM, use the DES bit in the Configuration Register (Addr: 0h; Bit: 7). See DES/Non-DES Mode for more information.