SBASAJ4B June   2022  – October 2024 ADC12QJ1600-EP

PRODUCTION DATA  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Pin Configuration and Functions
  6. 5 Specifications
    1. 5.1  Absolute Maximum Ratings
    2. 5.2  ESD Ratings
    3. 5.3  Recommended Operating Conditions
    4. 5.4  Thermal Information
    5. 5.5  Electrical Characteristics: DC Specifications
    6. 5.6  Electrical Characteristics: Power Consumption
    7. 5.7  Electrical Characteristics: AC Specifications
    8. 5.8  Switching Characteristics
    9. 5.9  Timing Requirements
    10. 5.10 Typical Characteristics
  7. 6 Detailed Description
    1. 6.1 Overview
    2. 6.2 Functional Block Diagram
    3. 6.3 Feature Description
      1. 6.3.1 Analog Input
        1. 6.3.1.1 Analog Input Protection
        2. 6.3.1.2 Full-Scale Voltage (VFS) Adjustment
        3. 6.3.1.3 Analog Input Offset Adjust
        4. 6.3.1.4 ADC Core
          1. 6.3.1.4.1 ADC Theory of Operation
          2. 6.3.1.4.2 ADC Core Calibration
          3. 6.3.1.4.3 Analog Reference Voltage
          4. 6.3.1.4.4 ADC Over-range Detection
          5. 6.3.1.4.5 Code Error Rate (CER)
      2. 6.3.2 Temperature Monitoring Diode
      3. 6.3.3 Timestamp
      4. 6.3.4 Clocking
        1. 6.3.4.1 Converter PLL (C-PLL) for Sampling Clock Generation
        2. 6.3.4.2 LVDS Clock Outputs (PLLREFO±, TRIGOUT±)
        3. 6.3.4.3 Optional CMOS Clock Outputs (ORC, ORD)
        4. 6.3.4.4 SYSREF for JESD204C Subclass-1 Deterministic Latency
          1. 6.3.4.4.1 SYSREF Capture for Multi-Device Synchronization and Deterministic Latency
          2. 6.3.4.4.2 SYSREF Position Detector and Sampling Position Selection (SYSREF Windowing)
      5. 6.3.5 JESD204C Interface
        1. 6.3.5.1  Transport Layer
        2. 6.3.5.2  Scrambler
        3. 6.3.5.3  Link Layer
        4. 6.3.5.4  8B or 10B Link Layer
          1. 6.3.5.4.1 Data Encoding (8B or 10B)
          2. 6.3.5.4.2 Multiiframes and the Local Multiframe Clock (LMFC)
          3. 6.3.5.4.3 Code Group Synchronization (CGS)
          4. 6.3.5.4.4 Initial Lane Alignment Sequence (ILAS)
          5. 6.3.5.4.5 Frame and Multiframe Monitoring
        5. 6.3.5.5  64B or 66B Link Layer
          1. 6.3.5.5.1 64B or 66B Encoding
          2. 6.3.5.5.2 Multiblocks, Extended Multiblocks and the Local Extended Multiblock Clock (LEMC)
            1. 6.3.5.5.2.1 Block, Multiblock and Extended Multiblock Alignment using Sync Header
              1. 6.3.5.5.2.1.1 Cyclic Redundancy Check (CRC) Mode
              2. 6.3.5.5.2.1.2 Forward Error Correction (FEC) Mode
          3. 6.3.5.5.3 Initial Lane Alignment
          4. 6.3.5.5.4 Block, Multiblock and Extended Multiblock Alignment Monitoring
        6. 6.3.5.6  Physical Layer
          1. 6.3.5.6.1 SerDes Pre-Emphasis
        7. 6.3.5.7  JESD204C Enable
        8. 6.3.5.8  Multi-Device Synchronization and Deterministic Latency
        9. 6.3.5.9  Operation in Subclass 0 Systems
        10. 6.3.5.10 Alarm Monitoring
          1. 6.3.5.10.1 Clock Upset Detection
          2. 6.3.5.10.2 FIFO Upset Detection
    4. 6.4 Device Functional Modes
      1. 6.4.1 Low Power Mode and High Performance Mode
      2. 6.4.2 JESD204C Modes
        1. 6.4.2.1 JESD204C Transport Layer Data Formats
        2. 6.4.2.2 64B or 66B Sync Header Stream Configuration
        3. 6.4.2.3 Redundant Data Mode (Alternate Lanes)
      3. 6.4.3 Power-Down Modes
      4. 6.4.4 Test Modes
        1. 6.4.4.1 Serializer Test-Mode Details
        2. 6.4.4.2 PRBS Test Modes
        3. 6.4.4.3 Clock Pattern Mode
        4. 6.4.4.4 Ramp Test Mode
        5. 6.4.4.5 Short and Long Transport Test Mode
          1. 6.4.4.5.1 Short Transport Test Pattern
        6. 6.4.4.6 D21.5 Test Mode
        7. 6.4.4.7 K28.5 Test Mode
        8. 6.4.4.8 Repeated ILA Test Mode
        9. 6.4.4.9 Modified RPAT Test Mode
      5. 6.4.5 Calibration Modes and Trimming
        1. 6.4.5.1 Foreground Calibration Mode
        2. 6.4.5.2 Background Calibration Mode
        3. 6.4.5.3 Low-Power Background Calibration (LPBG) Mode
      6. 6.4.6 Offset Calibration
      7. 6.4.7 Trimming
    5. 6.5 Programming
      1. 6.5.1 Using the Serial Interface
      2. 6.5.2 SCS
      3. 6.5.3 SCLK
      4. 6.5.4 SDI
      5. 6.5.5 SDO
      6. 6.5.6 Streaming Mode
      7. 6.5.7 SPI_Register_Map Registers
  8. 7 Application and Implementation
    1. 7.1 Application Information
    2. 7.2 Typical Applications
      1. 7.2.1 Light Detection and Ranging (LiDAR) Digitizer
        1. 7.2.1.1 Design Requirements
        2. 7.2.1.2 Detailed Design Procedure
          1. 7.2.1.2.1 Analog Front-End Requirements
          2. 7.2.1.2.2 Calculating Clock and SerDes Frequencies
        3. 7.2.1.3 Application Curves
    3. 7.3 Initialization Set Up
    4. 7.4 Power Supply Recommendations
      1. 7.4.1 Power Sequencing
    5. 7.5 Layout
      1. 7.5.1 Layout Guidelines
      2. 7.5.2 Layout Example
  9. 8 Device and Documentation Support
    1. 8.1 Device Support
    2. 8.2 Receiving Notification of Documentation Updates
    3. 8.3 Support Resources
    4. 8.4 Trademarks
    5. 8.5 Electrostatic Discharge Caution
    6. 8.6 Glossary
  10. 9 Revision History
  11. 10Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

6.4.4.9 Modified RPAT Test Mode

A 12-octet repeating pattern is defined in INCITS TR-35-2004. The purpose of this pattern is to generate white spectral content for JESD204C compliance and jitter testing. Table 6-51 lists the pattern before and after 8B/10B encoding. This mode only applies to 8B/10B modes.

Table 6-51 Modified RPAT Pattern Values
OCTET NUMBERDx.y NOTATION8-BIT INPUT TO 8B/10B ENCODER20b OUTPUT OF 8B/10B ENCODER
(Two Characters)
0D30.50xBE0x86BA6
1D23.60xD7
2D3.10x230xC6475
3D7.20x47
4D11.30x6B0xD0E8D
5D15.40x8F
6D19.50xB30xCA8B4
7D20.00x14
8D30.20x5E0x7949E
9D27.70xFB
10D21.10x350xAA665
11D25.20x59