SLASE60B September   2015  – January 2019 ADC31JB68

PRODUCTION DATA.  

  1. 1 Features
    1.     Transmitted Eye at Output of 18-Inch, 5-mil. FR4 Microstrip Trace at 5 Gb/s With Optimized De-Emphasis
  2. 2 Applications
  3. 3 Description
    1.     Spectrum With –1-dBFS, 450-MHz Input
  4. 4 Revision History
  5. 5 Pin Configuration and Functions
    1.     Pin Functions
  6. 6 Specifications
    1. 6.1 Absolute Maximum Ratings
    2. 6.2 ESD Ratings
    3. 6.3 Recommended Operating Conditions
    4. 6.4 Thermal Information
    5. 6.5 Electrical Characteristics: Converter Performance
    6. 6.6 Electrical Characteristics: Power Supply
    7. 6.7 Electrical Characteristics: Interface
    8. 6.8 Timing Requirements
    9. 6.9 Typical Characteristics
  7. 7 Parameter Measurement Information
    1. 7.1 Interface Circuits
  8. 8 Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagram
    3. 8.3 Feature Description
      1. 8.3.1  Analog Inputs and Input Buffer
      2. 8.3.2  Amplitude and Phase Imbalance Correction
      3. 8.3.3  Over-Range Detection
      4. 8.3.4  Input Clock Divider
      5. 8.3.5  SYSREF Detection Gate
      6. 8.3.6  Serial Differential Output Drivers
        1. 8.3.6.1 De-Emphasis Equalization
        2. 8.3.6.2 Serial Lane Inversion
      7. 8.3.7  ADC Core Calibration
      8. 8.3.8  Data Format
      9. 8.3.9  JESD204B Supported Features
      10. 8.3.10 JESD204B Interface
      11. 8.3.11 Transport Layer Configuration
        1. 8.3.11.1 Lane Configuration
        2. 8.3.11.2 Frame Format
        3. 8.3.11.3 ILA Information
      12. 8.3.12 Test Pattern Sequences
      13. 8.3.13 JESD204B Link Initialization
        1. 8.3.13.1 Frame Alignment
        2. 8.3.13.2 Code Group Synchronization
      14. 8.3.14 SPI
    4. 8.4 Device Functional Modes
      1. 8.4.1 Power-Down and Sleep Modes
    5. 8.5 Register Map
      1. 8.5.1 Register Descriptions
        1. 8.5.1.1  CONFIG_A (address = 0x0000) [reset = 0x3C]
          1. Table 6. CONFIG_A
        2. 8.5.1.2  DEVICE CONFIG (address = 0x0002) [reset = 0x00]
          1. Table 7. DEVICE CONFIG
        3. 8.5.1.3  CHIP_TYPE (address = 0x0003 ) [reset = 0x03]
          1. Table 8. CHIP_TYPE
        4. 8.5.1.4  CHIP_ID (address = 0x0005, 0x0004) [reset = 0x00, 0x1B]
          1. Table 9. CHIP_ID
        5. 8.5.1.5  CHIP_VERSION (address =0x0006) [reset = 0x00]
          1. Table 10. CHIP_VERSION
        6. 8.5.1.6  VENDOR_ID (address = 0x000D, 0x000C) [reset = 0x04, 0x51]
          1. Table 11. VENDOR_ID
        7. 8.5.1.7  SPI_CFG (address = 0x0010 ) [reset = 0x01]
          1. Table 12. SPI_CFG
        8. 8.5.1.8  OM1 (Operational Mode 1) (address = 0x0012) [reset = 0xC1]
          1. Table 13. OM1 (Operational Mode 1)
        9. 8.5.1.9  OM2 (Operational Mode 2) (address = 0x0013) [reset = 0x20]
          1. Table 14. OM2 (Operational Mode 2)
        10. 8.5.1.10 IMB_ADJ (Imbalance Adjust) (address = 0x0014) [reset = 0x00]
          1. Table 15. IMB_ADJ (Imbalance Adjust)
        11. 8.5.1.11 OVR_EN (Over-Range Enable) (address = 0x003A) [reset = 0x00]
          1. Table 16. OVR_EN (Over-Range Enable)
        12. 8.5.1.12 OVR_HOLD (Over-Range Hold) (address = 0x003B) [reset = 0x00]
          1. Table 17. OVR_HOLD (Over-Range Hold)
        13. 8.5.1.13 OVR_TH (Over-Range Threshold) (address = 0x003C) [reset = 0x00]
          1. Table 18. OVR_TH (Over-Range Threshold)
        14. 8.5.1.14 DC_MODE (DC Offset Correction Mode) (address = 0x003D) [reset = 0x00]
          1. Table 19. DC_MODE (DC Offset Correction Mode)
        15. 8.5.1.15 SER_CFG (Serial Lane Transmitter Configuration) (address = 0x0047) [reset = 0x00]
          1. Table 20. SER_CFG (Serial Lane Transmitter Configuration)
        16. 8.5.1.16 JESD_CTRL1 (JESD Configuration Control 1) (address = 0x0060) [reset = 0x7F]
          1. Table 21. JESD_CTRL1 (JESD Configuration Control 1)
        17. 8.5.1.17 JESD_CTRL2 (JESD Configuration Control 2) (address = 0x0061) [reset = 0x00]
          1. Table 22. JESD_CTRL2 (JESD Configuration Control 2)
        18. 8.5.1.18 JESD_RSTEP (JESD Ramp Pattern Step) (address = 0x0063, 0x0062) [reset = 0x00, 0x01]
          1. Table 23. JESD_RSTEP (JESD Ramp Pattern Step)
        19. 8.5.1.19 SER_INV (Serial Lane Inversion Control) (address = 0x0064) [reset = 0x00]
          1. Table 24. SER_INV (Serial Lane Inversion Control)
        20. 8.5.1.20 JESD_STATUS (JESD Link Status) (address = 0x006C) [reset = N/A]
          1. Table 25. JESD_STATUS (JESD Link Status)
  9. 9 Application and Implementation
    1. 9.1 Application Information
      1. 9.1.1 Optimizing Converter Performance
        1. 9.1.1.1 Internal Noise Sources
        2. 9.1.1.2 External Noise Sources
      2. 9.1.2 Analog Input Considerations
        1. 9.1.2.1 Differential Analog Inputs and Full Scale Range
        2. 9.1.2.2 Analog Input Network Model
        3. 9.1.2.3 Input Bandwidth
        4. 9.1.2.4 Driving the Analog Input
        5. 9.1.2.5 Clipping and Over-Range
      3. 9.1.3 CLKIN, SYSREF, and SYNCb Input Considerations
        1. 9.1.3.1 Driving the CLKIN+ and CLKIN– Input
        2. 9.1.3.2 Driving the SYSREF Input
        3. 9.1.3.3 SYSREF Signaling
        4. 9.1.3.4 SYSREF Timing
        5. 9.1.3.5 Effectively Using the Detection Gate Feature
        6. 9.1.3.6 Driving the SYNCb Input
      4. 9.1.4 Output Serial Interface Considerations
        1. 9.1.4.1 Output Serial-Lane Interface
        2. 9.1.4.2 Voltage Swing and De-Emphasis Optimization
        3. 9.1.4.3 Minimizing EMI
      5. 9.1.5 JESD204B System Considerations
        1. 9.1.5.1 Frame and LMFC Clock Alignment Procedure
        2. 9.1.5.2 Link Interruption
        3. 9.1.5.3 Clock Configuration Examples
      6. 9.1.6 SPI
    2. 9.2 Typical Application
      1. 9.2.1 Design Requirements
      2. 9.2.2 Design Procedure
      3. 9.2.3 Application Curve
  10. 10Power Supply Recommendations
    1. 10.1 Power Supply Design
    2. 10.2 Decoupling
  11. 11Layout
    1. 11.1 Layout Guidelines
    2. 11.2 Layout Example
  12. 12Device and Documentation Support
    1. 12.1 Related Documentation
    2. 12.2 Receiving Notification of Documentation Updates
    3. 12.3 Community Resources
    4. 12.4 Trademarks
    5. 12.5 Electrostatic Discharge Caution
    6. 12.6 Glossary
  13. 13Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

8.3.12 Test Pattern Sequences

The SPI may enable the following test pattern sequences. Short- and long-transport layer, RPAT, and JSPAT sequences are not supported.

Table 4. Supported Test Pattern Sequences

Test Pattern Description Common Purpose
D21.5 Data is transmitted across a normal link but ADC sampled data is replaced with D21.5 symbols, resulting in an alternating 1 and 0 pattern (101010...) on each serial lane. After enabling this pattern, the JESD204B link must be re-initialized. Jitter or system debug
K28.5 Continuous K28.5 symbols are output on each serial lane. Link initialization is not possible nor required. System debug
Repeated ILA ILA repeats indefinitely on each serial lane. After enabling this pattern, the JESD204B link must be reinitialized. System debug
Ramp Data is transmitted across a normal link but ADC sampled data is replaced with a ramp pattern. The ramp ascends through a 16-bit range and the step is programmable. After enabling this pattern, the JESD204B link must be reinitialized. System debug and transport layer verification
PRBS Standard pseudo-random bit sequences are output on each serial lane. PRBS 7/15/23 Complies with ITU-T O.150 specification and is compatible with J-BERT equipment. Link initialization is not possible nor required. Jitter and bit error rate testing