SBAS500B june   2022  – august 2023 ADC32RF54 , ADC32RF55

PRODUCTION DATA  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Revision History
  6. 5 Pin Configuration and Functions
  7. 6 Specifications
    1. 6.1  Absolute Maximum Ratings
    2. 6.2  ESD Ratings
    3. 6.3  Recommended Operating Conditions
    4. 6.4  Thermal Information
    5. 6.5  Electrical Characteristics - Power Consumption
    6. 6.6  Electrical Characteristics - DC Specifications
    7. 6.7  Electrical Characteristics - ADC32RF54 AC Specifications (Dither DISABLED)
    8. 6.8  Electrical Characteristics - ADC32RF54 AC Specifications (Dither ENABLED)
    9. 6.9  Electrical Characteristics - ADC32RF55 AC Specifications (Dither DISABLED)
    10. 6.10 Electrical Characteristics - ADC32RF55 AC Specifications (Dither ENABLED)
    11. 6.11 Timing Requirements
    12. 6.12 Typical Characteristics - ADC32RF54
    13. 6.13 Typical Characteristics - ADC32RF55
  8. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1 Analog Inputs
        1. 7.3.1.1 Input Bandwidth and Full-Scale
        2. 7.3.1.2 Input Imbalance
        3. 7.3.1.3 Overrange Indication
        4. 7.3.1.4 Analog out-of-band dither
      2. 7.3.2 Sampling Clock Input
      3. 7.3.3 SYSREF
        1. 7.3.3.1 SYSREF Capture Detection
      4. 7.3.4 ADC Foreground Calibration
        1. 7.3.4.1 Calibration Control
        2. 7.3.4.2 ADC Switch
        3. 7.3.4.3 Calibration Configuration
      5. 7.3.5 Decimation Filter
        1. 7.3.5.1 Decimation Filter Response
        2. 7.3.5.2 Decimation Filter Configuration
        3. 7.3.5.3 20-bit Output Mode
        4. 7.3.5.4 Dynamic Switching
          1. 7.3.5.4.1 2 Lane Mode
          2. 7.3.5.4.2 1 Lane Mode
        5. 7.3.5.5 Numerically Controlled Oscillator (NCO)
        6. 7.3.5.6 NCO Frequency Programming
        7. 7.3.5.7 Fast Frequency Hopping
          1. 7.3.5.7.1 Fast frequency hopping Using the GPIO1/2 pins
          2. 7.3.5.7.2 Fast frequency hopping using GPIO1/2, SEN and SDIO pins
          3. 7.3.5.7.3 Fast Frequency Hopping Using the Fast SPI
      6. 7.3.6 JESD204B Interface
        1. 7.3.6.1 JESD204B Initial Lane Alignment (ILA)
          1. 7.3.6.1.1 SYNC Signal
        2. 7.3.6.2 JESD204B Frame Assembly
        3. 7.3.6.3 JESD204B Frame Assembly in Bypass Mode
        4. 7.3.6.4 JESD204B Frame Assembly with Complex Decimation - Single Band
        5. 7.3.6.5 JESD204B Frame Assembly with Real Decimation - Single Band
        6. 7.3.6.6 JESD204B Frame Assembly with Complex Decimation - Dual Band
        7. 7.3.6.7 JESD204B Frame Assembly with Complex Decimation - Quad Band
      7. 7.3.7 SERDES Output MUX
      8. 7.3.8 Test Pattern
        1. 7.3.8.1 Transport Layer
        2. 7.3.8.2 Link Layer
        3. 7.3.8.3 Internal Capture Memory Buffer
    4. 7.4 Device Functional Modes
      1. 7.4.1 Digital Averaging
    5. 7.5 Programming
      1. 7.5.1 GPIO Pin Control
      2. 7.5.2 Configuration Using the SPI Interface
        1. 7.5.2.1 Register Write
        2. 7.5.2.2 Register Read
    6. 7.6 Register Maps
      1. 7.6.1 Detailed Register Description
  9. 8 Application and Implementation
    1. 8.1 Application Information
    2. 8.2 Typical Applications
      1. 8.2.1 Wideband RF Sampling Receiver
        1. 8.2.1.1 Design Requirements
          1. 8.2.1.1.1 Input Signal Path
          2. 8.2.1.1.2 Clocking
        2. 8.2.1.2 Detailed Design Procedure
          1. 8.2.1.2.1 Sampling Clock
        3. 8.2.1.3 Application Curves
    3. 8.3 Initialization Set Up
      1. 8.3.1 Initial Device Configuration After Power-Up
        1. 8.3.1.1  STEP 1: RESET
        2. 8.3.1.2  STEP 2: Device Configuration
        3. 8.3.1.3  STEP 3: JESD Interface Configuration (1)
        4. 8.3.1.4  STEP 4: SYSREF Synchronization
        5. 8.3.1.5  STEP 5: JESD Interface Configuration (2)
        6. 8.3.1.6  STEP 6: Analog Trim Settings
        7. 8.3.1.7  STEP 7: Calibration Configuration
        8. 8.3.1.8  STEP 8: SYSREF Synchronization
        9. 8.3.1.9  STEP 9: Run Power up Calibration
        10. 8.3.1.10 STEP 10: JESD Interface Synchronization
    4. 8.4 Power Supply Recommendations
    5. 8.5 Layout
      1. 8.5.1 Layout Guidelines
      2. 8.5.2 Layout Example
  10. 9 Device and Documentation Support
    1. 9.1 Receiving Notification of Documentation Updates
    2. 9.2 Support Resources
    3. 9.3 Trademarks
    4. 9.4 Electrostatic Discharge Caution
    5. 9.5 Glossary
  11. 10Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

7.3.8 Test Pattern

The ADC32RF5x provides two different options to output test patterns instead of the actual output data of the ADC in order to simplify the serial interface and system debug of the JESD204B digital interface link. The output data path is shown in Figure 7-44.

GUID-20201008-CA0I-VDLD-WQFH-BJXF012SVV7V-low.gifFigure 7-44 Test Pattern Options

The available test patterns in each block are described in Table 7-47. Both test pattern blocks replace output data from the digital block, and not from the ADC; therefore, it is available in decimation or decimation bypass mode. The test patterns are synchronized with the SYSREF signal.

Table 7-47 Test Pattern Overview
TEST PATTERN LOCATIONTYPE8b/10b encodedREGISTER PAGEREGISTER
TRANSPORT LAYERCUSTOM PATTERNYesJESD
0x05 0x04		0x2E, D0
TOGGLE 1010 PATTERNYes0x2E, D1
RAMP PATTERNYes0x2E, D2
LINK LAYERJESD204B TEST PATTERNSDepends0x2D, D2-D0
PRBS PATTERN (27.. 231)No0x2F, D6-D4

The RAMP pattern provides two different output options. Internally each ADC data bus consists of parallel data streams (1 stream per serdes lane). The RAMP pattern is generated for each stream and a different starting value can be set for each stream. By default, the starting values are 0. For example, a LMFS mode using 4 lanes/ADC would show a slow ramp which increments once every 4 clock cycles with starting values set to 0 and ramp increment = 1. Also, a RAMP pattern which increments every clock cycle can be set using different starting values (such as 0, 1, 2, 3) for the 4 streams/lanes and setting the RAMP increment to 4. The follow table shows how to enable the RAMP test pattern.

Table 7-48 RAMP Test Pattern
ADDRDATADESCRIPTION
0x050x04Select JESD page
0x320x01Set lane DOUT1 starting value = 1
0x340x02Set lane DOUT2 starting value = 2
0x360x03Set lane DOUT3 starting value = 3
0x420x01Set lane DOUT5 starting value = 1
0x440x02Set lane DOUT6 starting value = 2
0x460x03Set lane DOUT7 starting value = 3
0x2E0x34Enable RAMP pattern, RAMP increment = 4