SBAS774B May 2016 – December 2021 ADC32RF80 , ADC32RF83
PRODUCTION DATA
7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
0 | 0 | 0 | 0 | 0 | 0 | 0 | USE COMMON TEST PATTERN |
W-0h | W-0h | W-0h | W-0h | W-0h | W-0h | W-0h | R/W-0h |
Bit | Field | Type | Reset | Description |
---|---|---|---|---|
7-1 | 0 | W | 0h | Must write 0 |
0 | USE COMMON TEST PATTERN | R/W | 0h | 0 = Each data stream sends test patterns programmed by bits[3:0] of register 37h. 1 = Test patterns are individually programmed for the I and Q stream of each DDC using the TEST PATTERN DDCx y-DATA register bits (where x = 1 or 2 and y = I or Q). |