SBAS774B May 2016 – December 2021 ADC32RF80 , ADC32RF83
PRODUCTION DATA
The ADC test pattern replaces the actual output data of the ADC. The test patterns listed in Table 8-12 are available when the DDC is enabled and located in register 37h of the decimation filter page. When programmed, the test patterns are output for each converter (M) stream. The number of converter streams per channel increases by 2 when complex (I, Q) output or dual-band DDC is selected. The test patterns can be synchronized for both ADC channels using the SYSREF signal.
Additionally, a 12-bit test pattern is also available.
The number of converters increases in dual-band DDC mode and with a complex output.
BIT | NAME | DEFAULT | DESCRIPTION |
---|---|---|---|
Address 37h, 38h (bits 7-0) | TEST PATTERN DDC1 I-DATA, TEST PATTERN DDC1 Q-DATA, TEST PATTERN DDC2 I-DATA, TEST PATTERN DDC2 Q-DATA, | 0000 | Test pattern outputs onI and Q stream of channel A and B when DDC option is chosen. 0000 = Normal operation using ADC output data 0001 = Outputs all 0s 0010 = Outputs all 1s 0011 = Outputs toggle pattern: output data are an alternating sequence of 10101010101010 and 01010101010101 0100 = Output digital ramp: output data increment by one LSB every clock cycle from code 0 to 65535 0110 = Single pattern: output data are a custom pattern 1 (75h and 76h) 0111 Double pattern: output data alternate between custom pattern 1 and custom pattern 2 1000 = Deskew pattern: output data are AAAAh 1001 = SYNC pattern: output data are FFFFh |