SBAS774B May 2016 – December 2021 ADC32RF80 , ADC32RF83
PRODUCTION DATA
7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
LINK LAYER TESTMODE | LINKLAY RPAT | LMFC MASKRESET | JESDMODE1 | JESDMODE2 | RAMP12BIT | ||
R/W-0h | R/W-0h | R/W-0h | R/W-1h | R/W-0h | R/W-0h |
Bit | Field | Type | Reset | Description |
7-5 | LINK LAYER TESTMODE | R/W | 0h |
These bits generate a pattern according to section 5.3.3.8.2 of the JESD204B document. 000= Normal ADC data 001= D21.5 (high-frequency jitter pattern) 010 = K28.5 (mixed-frequency jitter pattern) 011= Repeat initial lane alignment (generates a K28.5 character and repeats lane alignment sequences continuously) 100= 12-octet RPAT jitter pattern |
4 | LINKLAY RPAT | R/W | 0h |
This bit changes the running disparity in a modified RPAT pattern test mode (only when link layer test mode = 100). 0 = Normal operation 1= Changes disparity |
3 | LMFCMASK RESET | R/W | 0h | 0= Normal operation |
2 | JESDMODE1 | R/W | 1h | These bits select the configuration register to configure the correct LMFS frame assemblies for different decimation settings; see the JESD frame assembly tables in the Section 8.4.2.2 section |
1 | JESDMODE2 | R/W | 0h | These bits select the configuration register to configure the correct LMFS frame assemblies for different decimation settings; see the JESD frame assembly tables in the Section 8.4.2.2 section |
0 | RAMP12BIT | R/W | 0h |
12-bit RAMP test pattern.0 = Normal data output 1= Digital output is the RAMP pattern |