SBAS988 November   2023 ADC34RF55

PRODUCTION DATA  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Pin Configuration and Functions
  6. 5 Specifications
    1. 5.1  Absolute Maximum Ratings
    2. 5.2  ESD Ratings
    3. 5.3  Recommended Operating Conditions
    4. 5.4  Thermal Information
    5. 5.5  Electrical Characteristics - Power Consumption
    6. 5.6  Electrical Characteristics - DC Specifications
    7. 5.7  Electrical Characteristics - AC Specifications (Dither DISABLED)
    8. 5.8  Electrical Characteristics - AC Specifications (Dither ENABLED)
    9. 5.9  Timing Requirements
    10. 5.10 Typical Characteristics
  7. 6 Detailed Description
    1. 6.1 Overview
    2. 6.2 Functional Block Diagram
    3. 6.3 Feature Description
      1. 6.3.1 Analog Inputs
        1. 6.3.1.1 Input Bandwidth and Full-Scale
        2. 6.3.1.2 Input Imbalance
        3. 6.3.1.3 Over Range Indication
        4. 6.3.1.4 Analog out-of-band dither
      2. 6.3.2 Sampling Clock Input
      3. 6.3.3 ADC Foreground Calibration
        1. 6.3.3.1 Calibration Control
        2. 6.3.3.2 ADC Switch
        3. 6.3.3.3 Calibration Configuration
      4. 6.3.4 SYSREF
        1. 6.3.4.1 SYSREF Capture Detection
      5. 6.3.5 Decimation Filter
        1. 6.3.5.1 Decimation Filter Response
        2. 6.3.5.2 Decimation Filter Configuration
        3. 6.3.5.3 20-bit Output Mode
        4. 6.3.5.4 Numerically Controlled Oscillator (NCO)
        5. 6.3.5.5 NCO Frequency Programming Using the SPI Interface
        6. 6.3.5.6 Fast Frequency Hopping
          1. 6.3.5.6.1 Fast frequency hopping using the GPIO1/2 pins
          2. 6.3.5.6.2 Fast frequency hopping using GPIO1/2, SEN and SDATA pins
          3. 6.3.5.6.3 Fast frequency hopping using the fast SPI
      6. 6.3.6 JESD204B Interface
        1. 6.3.6.1 JESD204B Initial Lane Alignment (ILA)
          1. 6.3.6.1.1 SYNC Signal
        2. 6.3.6.2 JESD204B Frame Assembly
          1. 6.3.6.2.1 JESD204B Frame Assembly in Bypass Mode
          2. 6.3.6.2.2 JESD204B Frame Assembly with Real Decimation - Single Band
          3. 6.3.6.2.3 JESD204B Frame Assembly with Complex Decimation - Single Band
          4. 6.3.6.2.4 JESD204B Frame Assembly with Decimation - Dual Band
        3. 6.3.6.3 SERDES Output MUX
      7. 6.3.7 Test Pattern
        1. 6.3.7.1 Transport Layer
        2. 6.3.7.2 Link Layer
        3. 6.3.7.3 Internal Capture Memory Buffer
    4. 6.4 Device Functional Modes
      1. 6.4.1 Bypass Mode
      2. 6.4.2 Digital Averaging
    5. 6.5 Programming
      1. 6.5.1 GPIO Pin Control
      2. 6.5.2 Configuration using the SPI interface
        1. 6.5.2.1 Register Write
        2. 6.5.2.2 Register Read
    6. 6.6 Register Maps
      1. 6.6.1 Detailed Register Description
  8. 7 Application Information Disclaimer
    1. 7.1 Application Information
    2. 7.2 Typical Application
      1. 7.2.1 Wideband RF Sampling Receiver
      2. 7.2.2 Design Requirements
        1. 7.2.2.1 Input Signal Path
        2. 7.2.2.2 Clocking
      3. 7.2.3 Detailed Design Procedure
        1. 7.2.3.1 Sampling Clock
      4. 7.2.4 Application Curves
    3. 7.3 Initialization Set Up
      1. 7.3.1 Initial Device Configuration After Power-Up
        1. 7.3.1.1  STEP 1: RESET
        2. 7.3.1.2  STEP 2: Device Configuration
        3. 7.3.1.3  STEP 3: JESD Interface Configuration (1)
        4. 7.3.1.4  STEP 4: SYSREF Synchronization
        5. 7.3.1.5  STEP 5: JESD Interface Configuration (2)
        6. 7.3.1.6  STEP 6: Analog Trim Settings
        7. 7.3.1.7  STEP 7: Calibration Configuration
        8. 7.3.1.8  STEP 8: SYSREF Synchronization
        9. 7.3.1.9  STEP 9: Run Power up Calibration
        10. 7.3.1.10 Step 10: JESD Interface Synchronization
        11. 7.3.1.11 Step 11: NCO Configuration
    4. 7.4 Power Supply Recommendations
    5. 7.5 Layout
      1. 7.5.1 Layout Guidelines
      2. 7.5.2 Layout Example
  9. 8 Device and Documentation Support
    1. 8.1 Device Support
      1. 8.1.1 Third-Party Products Disclaimer
    2. 8.2 Receiving Notification of Documentation Updates
    3. 8.3 Support Resources
    4. 8.4 Trademarks
    5. 8.5 Electrostatic Discharge Caution
    6. 8.6 Glossary
  10. 9 Revision History
  11. 10Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

6.3.7.3 Internal Capture Memory Buffer

The ADC includes a small internal capture memory buffer which can store up to 64 samples. Once a strobe is given to the memory using SPI register write, the memory stores the next continuous 64 samples of one ADC channel (selected via SPI register write) and stop. The samples are captured from the ADC cores (prior to averaging or decimation). These samples can be read back using the SPI interface without involving the JESD204B interface.

This mode allows debug of the analog front end during the initial bring-up phase even if the JESD204B interface is not yet operational.

Table 6-43 Register writes to enable the internal sample capture buffer
ADDR DATA DESCRIPTION
0x05 0x02 Select DIGITAL page
0x34 Select ADC channel (D5/D4) and give strobe (D6).
The 64 samples are stored in 0x800 to 0x87F in the digital page