4 Revision History
Changes from G Revision (October 2011) to H Revision
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Added ESD Ratings table, Feature Description section, Device Functional Modes, Application and Implementation section, Power Supply Recommendations section, Layout section, Device and Documentation Support section, and Mechanical, Packaging, and Orderable Information sectionGo
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Updated Features and Description sections to include use in applications other than temperature measurementGo
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Edited Device Comparison Table to include ADS1146, ADS1147, and ADS1148; changed title, deleted footnoteGo
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Merged all Pin Functions into one table, changed IOUT1 and IOUT2 to IEXC1 and IEXC2 to match figuresGo
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Changed compliance voltage for excitation current sources in Electrical Characteristics, now refers to Figure 41 and Figure 42; changed initial error and initial mismatch to absolute error and absolute mismatchGo
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Re-ordered elements in Timing Requirements tables, changed timing references to tCLKGo
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Changed order of Typical Characteristics curves to match order in Electrical Characteristics tableGo
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Added cross-reference for Equation 1 in Noise Performance sectionGo
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Corrected values in Table 2Go
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Modified Low-Noise PGA section to add more detail; added Table 7; added PGA Common-Mode Voltage Requirements and PGA Common-Mode Voltage Calculation Example sectionsGo
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Added fCLK/fMOD column to Table 9Go
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Added cross-reference for Equation 15 to Power-Supply Monitor sectionGo
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Added cross-reference for Equation 16 to External Voltage Reference Monitor sectionGo
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Added Device Functional Modes sectionGo
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Corrected values in Table 15 to remove extra 0 in 800000hGo
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Added text to Chip Select section to say that SCLK will force DRDY high, even with CS highGo
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Added text to Data Output and Data Ready section to say that stop read data continuous mode is not compatible with DRDY MODE set to 1Go
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Modified Figure 74 and Figure 75 to better show DIN transitions with respect to SCLK; replaced Figure 76 to better show full command and DRDY/DOUT falling with NOP.Go
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Added more infomation to Data Format section; added Figure 77Go
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Added cross-reference for Figure 78 to Commands sectionGo
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Modified Figure 78 to include CS status through SLEEP and WAKEUP commandGo
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Updated Figure 79 and Figure 80 to show start of command executionGo
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Added cross-reference for Figure 83 to Commands sectionGo
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Removed figure for SDATAC (Stop Read Data Continuous) commandGo
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Updated Figure 85 to show MUX1 as the start of the data byte for the given command and register locationGo
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Updated Figure 86 to show start of calibration timingGo
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Updated Register Maps section to new formatGo
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Updated Application Information section. Included new typical applications for Ratiometric 3-Wire RTD Measurement System and K-Type Thermocouple Measurement (–200°C to +1250°C) with Cold-Junction CompensationGo
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Updated Figure 112 and Figure 113 to better show timing informationGo
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Removed Hardware-Compensated 3-Wire RTD Measurement application sectionGo
Changes from F Revision (June 2011) to G Revision
Changes from E Revision (December, 2010) to F Revision
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Added footnote to Full-scale input voltage specification in Electrical Characteristics tableGo
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Added test condition for INL parameter of Electrical CharacteristicsGo
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Added tCSPW to minimum specification in Timing Characteristics for Figure 1Go
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Updated Figure 1 to show tCSPW timingGo
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Corrected grid and axis values for Figure 29Go
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Corrected grid and axis values for Figure 30Go
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Updated Figure 51Go
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Added details to Bias Voltage Generation sectionGo
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Corrected Table 14Go
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Added details to Calibration sectionGo
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Added Equation 18 to Calibration sectionGo
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Added section to Calibration CommandsGo
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Added details to Digital Interface sectionGo
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Added Restricted command space to Table 19Go