SBASAM0B March   2024  – November 2024 ADS127L18

PRODMIX  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Pin Configuration and Functions
  6. 5 Specifications
    1. 5.1 Absolute Maximum Ratings
    2. 5.2 ESD Ratings
    3. 5.3 Recommended Operating Conditions
    4. 5.4 Thermal Information
    5. 5.5 Electrical Characteristics
    6. 5.6 Timing Requirements
    7. 5.7 Switching Characteristics
    8. 5.8 Timing Diagrams
    9. 5.9 Typical Characteristics
  7. 6 Parameter Measurement Information
    1. 6.1  Offset Error Measurement
    2. 6.2  Offset Drift Measurement
    3. 6.3  Gain Error Measurement
    4. 6.4  Gain Drift Measurement
    5. 6.5  NMRR Measurement
    6. 6.6  CMRR Measurement
    7. 6.7  PSRR Measurement
    8. 6.8  SNR Measurement
    9. 6.9  INL Error Measurement
    10. 6.10 THD Measurement
    11. 6.11 IMD Measurement
    12. 6.12 SFDR Measurement
    13. 6.13 Noise Performance
  8. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1 Analog Inputs (AINP, AINN)
        1. 7.3.1.1 Input Range
      2. 7.3.2 Reference Voltage (REFP, REFN)
        1. 7.3.2.1 Reference Voltage Range
      3. 7.3.3 Clock Operation
        1. 7.3.3.1 Clock Dividers
        2. 7.3.3.2 Internal Oscillator
        3. 7.3.3.3 External Clock
      4. 7.3.4 Power-On Reset (POR)
      5. 7.3.5 VCM Output Voltage
      6. 7.3.6 GPIO
      7. 7.3.7 Modulator
      8. 7.3.8 Digital Filter
        1. 7.3.8.1 Wideband Filter
        2. 7.3.8.2 Low-Latency Filter (Sinc)
          1. 7.3.8.2.1 Sinc4 Filter
          2. 7.3.8.2.2 Sinc4 + Sinc1 Cascade Filter
          3. 7.3.8.2.3 Sinc3 Filter
          4. 7.3.8.2.4 Sinc3 + Sinc1 Filter
    4. 7.4 Device Functional Modes
      1. 7.4.1  Reset
        1. 7.4.1.1 RESET Pin
        2. 7.4.1.2 Reset by SPI Register
        3. 7.4.1.3 Reset by SPI Input Pattern
      2. 7.4.2  Idle and Standby Modes
      3. 7.4.3  Power-Down
      4. 7.4.4  Speed Modes
      5. 7.4.5  Synchronization
        1. 7.4.5.1 Synchronized Control Mode
        2. 7.4.5.2 Start/Stop Control Mode
      6. 7.4.6  Conversion-Start Delay Time
      7. 7.4.7  Calibration
        1. 7.4.7.1 Offset Calibration Registers
        2. 7.4.7.2 Gain Calibration Registers
        3. 7.4.7.3 Calibration Procedure
      8. 7.4.8  Data Averaging
      9. 7.4.9  Diagnostics
        1. 7.4.9.1 ERROR Pin and ERR_FLAG Bit
        2. 7.4.9.2 SPI CRC
        3. 7.4.9.3 Register Map CRC
        4. 7.4.9.4 ADC Error
        5. 7.4.9.5 SPI Address Range
        6. 7.4.9.6 SCLK Counter
        7. 7.4.9.7 Clock Counter
        8. 7.4.9.8 Frame-Sync CRC
        9. 7.4.9.9 Self Test
      10. 7.4.10 Frame-Sync Data Port
        1. 7.4.10.1  Data Packet
        2. 7.4.10.2  Data Format
        3. 7.4.10.3  STATUS_DP Header Byte
        4. 7.4.10.4  FSYNC Pin
        5. 7.4.10.5  DCLK Pin
        6. 7.4.10.6  DOUTx Pins
        7. 7.4.10.7  DINx Pins
        8. 7.4.10.8  Time Division Multiplexing
        9. 7.4.10.9  Daisy Chain
        10. 7.4.10.10 DOUTx Timing
    5. 7.5 Programming
      1. 7.5.1 Hardware Programming
      2. 7.5.2 SPI Programming
        1. 7.5.2.1 Chip Select (CS)
        2. 7.5.2.2 Serial Clock (SCLK)
        3. 7.5.2.3 Serial Data Input (SDI)
        4. 7.5.2.4 Serial Data Output (SDO)
      3. 7.5.3 SPI Frame
      4. 7.5.4 Commands
        1. 7.5.4.1 Write Register Command
        2. 7.5.4.2 Read Register Command
      5. 7.5.5 SPI Daisy-Chain
  9. 8 Register Map
  10. 9 Application and Implementation
    1. 9.1 Application Information
      1. 9.1.1 Input Driver
      2. 9.1.2 Antialias Filter
      3. 9.1.3 Reference Voltage
    2. 9.2 Typical Application
      1. 9.2.1 Design Requirements
      2. 9.2.2 Detailed Design Procedure
      3. 9.2.3 Application Curves
    3. 9.3 Power Supply Recommendations
      1. 9.3.1 AVDD1 and AVSS
      2. 9.3.2 AVDD2
      3. 9.3.3 IOVDD
      4. 9.3.4 CAPA and CAPD
    4. 9.4 Layout
      1. 9.4.1 Layout Guidelines
      2. 9.4.2 Layout Example
  11. 10Device and Documentation Support
    1. 10.1 Documentation Support
      1. 10.1.1 Related Documentation
    2. 10.2 Receiving Notification of Documentation Updates
    3. 10.3 Support Resources
    4. 10.4 Trademarks
    5. 10.5 Electrostatic Discharge Caution
    6. 10.6 Glossary
  12. 11Revision History
  13. 12Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

6.6 CMRR Measurement

Common-mode rejection ratio (CMRR) specifies the ability of the ADC to reject common-mode input signals. CMRR is expressed as dc and ac parameters. For measurement of CMRR (dc), three common-mode test voltages are applied with the inputs externally shorted together. These test voltages are equal to AVSS + 50mV, (AVDD1 + AVSS) / 2, and AVDD1 – 50mV. The maximum change of the ADC offset voltage is recorded versus the change in common-mode test voltage. Equation 12 shows how CMRR (dc) is computed.

Equation 4. CMRR (dc) (dB) = 20 · log(ΔVCM / ΔVOS)

where:

  • ΔVCM = Change of dc common-mode test voltage
  • ΔVOS = Change of corresponding offset voltage

For the measurement of CMRR (ac), an ac common-mode signal is applied at various test frequencies at 95% full-scale range. An FFT is computed from the ADC data with the common-mode signal applied. Equation 7 shows that the nine largest amplitude spurious frequencies in the frequency spectrum are summed as powers. These frequencies are then related to the amplitude of the common-mode test signal.

Equation 5. PSRR (ac) (dB) = 20 · log(VCM / VO)

where:

  • VCM (RMS) = Common-mode input signal amplitude
  • VO (RMS) = Root-sum-square amplitude of spurious frequencies = √(V02 + V12 + ...V82)