SLAS669E September   2010  – may 2020 ADS5400-SP

PRODUCTION DATA.  

  1. 1 Features
  2. 2 Applications
  3. 3 Description
    1.     Block Diagram
  4. 4 Revision History
  5. 5 Pin Configuration and Functions
    1.     Pin Functions
  6. 6 Specifications
    1. 6.1 Absolute Maximum Ratings
    2. 6.2 ESD Ratings
    3. 6.3 Recommended Operating Conditions
    4. 6.4 Thermal Information
    5. 6.5 Electrical Characteristics
    6. 6.6 Switching Characteristics
    7. 6.7 Timing Characteristics
    8. 6.8 Interleaving Adjustments
    9. 6.9 Typical Characteristics
  7. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1  Input Configuration
      2. 7.3.2  Voltage Reference
      3. 7.3.3  Analog Input Over-Range Recovery Error
      4. 7.3.4  Clock Inputs
      5. 7.3.5  Over Range
      6. 7.3.6  Data Scramble
      7. 7.3.7  Test Patterns
      8. 7.3.8  Die Identification and Revision
      9. 7.3.9  Die Temperature Sensor
      10. 7.3.10 Interleaving
        1. 7.3.10.1 Gain Adjustment
        2. 7.3.10.2 Offset Adjustment
        3. 7.3.10.3 Input Clock Coarse Phase Adjustment
        4. 7.3.10.4 Input Clock Fine Phase Adjustment
    4. 7.4 Device Functional Modes
      1. 7.4.1 Output Bus and Clock Options
      2. 7.4.2 Reset and Synchronization
      3. 7.4.3 LVDS
    5. 7.5 Programming
      1. 7.5.1 Serial Interface
        1. Table 2. Instruction Byte of the Serial Interface
    6. 7.6 Serial Register Map
      1. 7.6.1 Description of Serial Registers
  8. 8 Application and Implementation
    1. 8.1 Application Information
    2. 8.2 Typical Application
      1. 8.2.1 Design Requirements
      2. 8.2.2 Detailed Design Procedure
        1. 8.2.2.1 Clocking Source for ADS5400-SP
        2. 8.2.2.2 Amplifier Selection
      3. 8.2.3 Application Curve
  9. 9 Power Supply Recommendations
  10. 10Layout
    1. 10.1 Layout Guidelines
    2. 10.2 Layout Example
  11. 11Device and Documentation Support
    1. 11.1 Device Support
      1. 11.1.1 Device Nomenclature
        1. 11.1.1.1 Definition of Specifications
    2. 11.2 Documentation Support
    3. 11.3 Receiving Notification of Documentation Updates
    4. 11.4 Support Resources
    5. 11.5 Trademarks
    6. 11.6 Electrostatic Discharge Caution
    7. 11.7 Glossary
  12. 12Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

7.3.7 Test Patterns

Determining the closure of timing or validating the digital interface can be difficult in normal operation. Therefore, test patterns are available in register 0x06. One pattern toggles the outputs between all 1s and all 0s. Another pattern generates a 7-bit PRBS (pseudo-random bit sequence).

In dual bus mode, the toggle mode could be in the same phase on bus A and B (bus A and B outputting 1s or 0s together), or could be out of phase (bus A outputting 1s while bus B outputs 0s). The start phase cannot be controlled.

The PRBS output sequence is a standard 27-1 pseudo-random sequence generated by a feedback shift register where the two last bits of the shift register are exclusive-OR’ed and fed back to the first bit of the shift register. The standard notation for the polynomial is x7 + x6 + 1. The PRBS generator is not reset, so there is no initial position in the sequence. The pattern may start at any position in the repeating 127-bit long pattern and the pattern repeats as long as the PRBS mode is enabled. The data pattern from the PRBS generator is used for all of the LVDS parallel outputs, so when the pattern is ‘1’ then all of the LVDS outputs are outputting ‘1’ and when the pattern is ‘0’ then all of the LVDS drivers output ‘0’. To determine if the digital interface is operating properly with the PRBS sequence, the user must generate the same sequence in the receiving device, and do a shift-and-compare until a matching sequence is confirmed.