SBAS706D April 2015 – April 2019 ADS54J60
PRODUCTION DATA.
MIN | TYP | MAX | UNITS | |||
---|---|---|---|---|---|---|
SAMPLE TIMING | ||||||
Aperture delay | 0.75 | 1.6 | ns | |||
Aperture delay matching between two channels on the same device | ±70 | ps | ||||
Aperture delay matching between two devices at the same temperature and supply voltage | ±270 | ps | ||||
Aperture jitter | 120 | fS rms | ||||
WAKE-UP TIMING | ||||||
Wake-up time to valid data after coming out of global power-down | 150 | µs | ||||
LATENCY (1) | ||||||
Data latency: ADC sample to digital output | 134 | Input clock cycles | ||||
OVR latency: ADC sample to OVR bit | 62 | Input clock cycles | ||||
FOVR latency: ADC sample to FOVR signal on pin | 18 | Input clock cycles | ||||
tPDI | Propagation delay: logic gates and output buffers delay (does not change with fS) | 4 | ns | |||
SYSREF TIMING | ||||||
tSU_SYSREF | Setup time for SYSREF, referenced to the input clock falling edge | 300 | 900 | ps | ||
tH_SYSREF | Hold time for SYSREF, referenced to the input clock falling edge | 100 | ps | |||
JESD OUTPUT INTERFACE TIMING CHARACTERISTICS | ||||||
Unit interval | 100 | 400 | ps | |||
Serial output data rate | 2.5 | 10 | Gbps | |||
Total jitter for BER of 1E-15 and lane rate = 10 Gbps | 26 | ps | ||||
Random jitter for BER of 1E-15 and lane rate = 10 Gbps | 0.75 | ps rms | ||||
Deterministic jitter for BER of 1E-15 and lane rate = 10 Gbps | 12 | ps, pk-pk | ||||
tR, tF | Data rise time, data fall time: rise and fall times are measured from 20% to 80%,
differential output waveform, 2.5 Gbps ≤ bit rate ≤ 10 Gbps |
35 | ps |