SBAS745B December 2015 – January 2023 ADS54J66
PRODUCTION DATA
MIN | TYP | MAX | UNIT | |||
---|---|---|---|---|---|---|
Sample Timing Characteristics (TBD are any of these Switching Characteristics?) | ||||||
Aperture delay | 0.75 | 1.6 | ns | |||
Aperture delay matching between two channels on the same device | ±70 | ps | ||||
Aperture delay matching between two devices at the same temperature and supply voltage | ±270 | ps | ||||
Aperture jitter | 135 | fS rms | ||||
Wake-up time to valid data after coming out of global power-down | 150 | µs | ||||
Data latency(1): ADC sample to digital output | 77 | Input clock cycles | ||||
OVR latency: ADC sample to OVR bit | 44 | Input clock cycles | ||||
tPDI | Clock propagation delay: input clock rising edge cross-over to output clock rising edge cross-over | 4 | ns | |||
tSU_SYSREF(2) | Setup time for SYSREF, referenced to input clock falling edge | 300 | ps | |||
tH_SYSREF(2) | Hold time for SYSREF, referenced to input clock falling edge | 100 | ps | |||
JESD Output Interface Timing Characteristics | ||||||
Unit interval | 100 | 400 | ps | |||
Serial output data rate | 2.5 | 10 | Gbps | |||
Total jitter for BER of 1E-15 and lane rate = 10 Gbps | 26 | ps | ||||
Random jitter for BER of 1E-15 and lane rate = 10 Gbps | 0.75 | ps rms | ||||
Deterministic jitter for BER of 1E-15 and lane rate = 10 Gbps | 12 | ps, pk-pk | ||||
tR, tF | Data rise time, data fall time: rise and fall times measured from 20% to 80%, differential output waveform, 2.5 Gbps ≤ bit rate ≤ 10 Gbps | 35 | ps |