SBAS614C May 2013 – March 2019 ADS8866
PRODUCTION DATA.
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |||
---|---|---|---|---|---|---|---|---|
ANALOG INPUT | ||||||||
Full-scale input span(1) | AINP – AINN | 0 | VREF | V | ||||
Operating input range(1) | AINP | –0.1 | VREF + 0.1 | V | ||||
AINN | –0.1 | + 0.1 | ||||||
CI | Input capacitance | AINP and AINN terminal to GND | 59 | pF | ||||
Input leakage current | During acquisition for dc input | 5 | nA | |||||
EXTERNAL REFERENCE INPUT | ||||||||
VREF | Input range | 2.5 | 5 | V | ||||
Reference input current | During conversion, 100-kHz sample rate, mid-code | 35 | μA | |||||
Reference leakage current | 250 | nA | ||||||
CREF | Decoupling capacitor at the REF input | 10 | 22 | µF | ||||
SYSTEM PERFORMANCE | ||||||||
Resolution | 16 | Bits | ||||||
NMC | No missing codes | 16 | Bits | |||||
DNL | Differential linearity | –0.99 | ±0.6 | 1 | LSB(2) | |||
INL | Integral linearity(5) | –2 | ±0.8 | 2 | LSB(2) | |||
EO | Offset error(3) | –4 | ±1 | 4 | mV | |||
Offset error drift with temperature | ±1.5 | µV/°C | ||||||
EG | Gain error | –0.01 | ±0.005 | 0.01 | %FSR | |||
Gain error drift with temperature | ±0.15 | ppm/°C | ||||||
CMRR | Common-mode rejection ratio | With common-mode input signal = 5 VPP at dc | 90 | 100 | dB | |||
PSRR | Power-supply rejection ratio | At mid-code | 80 | dB | ||||
Transition noise | 0.5 | LSB | ||||||
SAMPLING DYNAMICS | ||||||||
tconv | Conversion time | 500 | 8800 | ns | ||||
tACQ | Acquisition time | 1200 | ns | |||||
Maximum throughput rate
with or without latency |
100 | kHz | ||||||
Aperture delay | 4 | ns | ||||||
Aperture jitter, RMS | 5 | ps | ||||||
Step response | Settling to 16-bit accuracy | 1200 | ns | |||||
Overvoltage recovery | Settling to 16-bit accuracy | 1200 | ns | |||||
DYNAMIC CHARACTERISTICS | ||||||||
SINAD | Signal-to-noise + distortion(7) | At 1 kHz, VREF = 5 V | 90.5 | 92.9 | dB | |||
At 10 kHz, VREF = 5 V | 92.9 | |||||||
At 49 kHz, VREF = 5 V | 88.2 | |||||||
SNR | Signal-to-noise ratio(7) | At 1 kHz, VREF = 5 V | 92 | 93 | dB | |||
At 10 kHz, VREF = 5 V | 93 | |||||||
At 49 kHz, VREF = 5 V | 88.5 | |||||||
THD | Total harmonic distortion(7)(4) | At 1 kHz, VREF = 5 V | –108 | dB | ||||
At 10 kHz, VREF = 5 V | –108 | |||||||
At 49 kHz, VREF = 5 V | –101 | |||||||
SFDR | Spurious-free dynamic range(7) | At 1 kHz, VREF = 5 V | 108 | dB | ||||
At 10 kHz, VREF = 5 V | 108 | |||||||
At 49 kHz, VREF = 5 V | 101 | |||||||
BW–3dB | –3-dB small-signal bandwidth | 30 | MHz | |||||
POWER-SUPPLY REQUIREMENTS | ||||||||
Power-supply voltage | AVDD | Analog supply | 2.7 | 3 | 3.6 | V | ||
DVDD | Digital supply range | 1.65 | 1.8 | 3.6 | ||||
Supply current | AVDD | 100-kHz sample rate, AVDD = 3 V | 0.23 | 0.4 | mA | |||
PVA | Power dissipation | 100-kHz sample rate, AVDD = 3 V | 0.7 | 1.2 | mW | |||
10-kHz sample rate, AVDD = 3 V | 70 | μW | ||||||
IAPD | Device power-down current(6) | 50 | nA | |||||
DIGITAL INPUTS: LOGIC FAMILY (CMOS) | ||||||||
VIH | High-level input voltage | 1.65 V < DVDD < 2.3 V | 0.8 × DVDD | DVDD + 0.3 | V | |||
2.3 V < DVDD < 3.6 V | 0.7 × DVDD | DVDD + 0.3 | ||||||
VIL | Low-level input voltage | 1.65 V < DVDD < 2.3 V | –0.3 | 0.2 × DVDD | V | |||
2.3 V < DVDD < 3.6 V | –0.3 | 0.3 × DVDD | ||||||
ILK | Digital input leakage current | ±10 | ±100 | nA | ||||
DIGITAL OUTPUTS: LOGIC FAMILY (CMOS) | ||||||||
VOH | High-level output voltage | IO = 500-μA source, CLOAD = 20 pF | 0.8 × DVDD | DVDD | V | |||
VOL | Low-level output voltage | IO = 500-μA sink, CLOAD = 20 pF | 0 | 0.2 × DVDD | V | |||
TEMPERATURE RANGE | ||||||||
TA | Operating free-air temperature | –40 | 85 | °C |