SBAS693C March   2015  – December 2023 AFE2256

PRODUCTION DATA  

  1.   1
  2. 1Features
  3. 2Applications
  4. 3Description
  5. 4Device and Documentation Support
    1. 4.1 Documentation Support
      1. 4.1.1 Related Documentation
    2. 4.2 Trademarks
    3. 4.3 Electrostatic Discharge Caution
    4. 4.4 Glossary
  6. 5Revision History
  7. 6Mechanical, Packaging, and Orderable Information

Package Options

Refer to the PDF data sheet for device specific package drawings

Mechanical Data (Package|Pins)
  • TDR|325
  • TDU|320
  • TBN|325
Thermal pad, mechanical data (Package|Pins)
Orderable Information

1 Features

  • 256 Channels
  • On-Chip, 16-Bit ADC
  • Photodiode Short Immunity
  • High Performance:
    • Noise: 750 Electrons RMS
      (1.2-pC Input Charge Range)
    • Low Correlated Noise
    • Integral Nonlinearity:
      ±2 LSB with Internal 16-Bit ADC
    • Scan Time: < 20 µs to 204.8 µs
  • Integration:
    • Six Selectable, Full-Scale Input Ranges:
      0.6 pC (Minimum) to 9.6 pC (Maximum)
    • Internal Timing Generator (TG)
    • Built-In Correlated Double Sampler
    • Pipelined Integrate-and-Read for Improved Throughput—Data-Read During Integration
    • Serial LVDS Output
  • Simple Power-Supply Scheme:
    • AVDD1 = 1.85 V
    • AVDD2 = 3.3 V
  • Low Power Consumption
  • Nap and Total Power-Down Modes
  • Custom Chip-On-Film (COF) Packages