SLASF43 December   2023 AFE782H1 , AFE882H1

PRODUCTION DATA  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Pin Configuration and Functions
  6. 5 Specifications
    1. 5.1  Absolute Maximum Ratings
    2. 5.2  ESD Ratings
    3. 5.3  Recommended Operating Conditions
    4. 5.4  Thermal Information
    5. 5.5  Electrical Characteristics
    6. 5.6  Timing Requirements
    7. 5.7  Timing Diagrams
    8. 5.8  Typical Characteristics: VOUT DAC
    9. 5.9  Typical Characteristics: ADC
    10. 5.10 Typical Characteristics: Reference
    11. 5.11 Typical Characteristics: HART Modem
    12. 5.12 Typical Characteristics: Power Supply
  7. 6 Detailed Description
    1. 6.1 Overview
    2. 6.2 Functional Block Diagram
    3. 6.3 Feature Description
      1. 6.3.1  Digital-to-Analog Converter (DAC) Overview
        1. 6.3.1.1 DAC Resistor String
        2. 6.3.1.2 DAC Buffer Amplifier
        3. 6.3.1.3 DAC Transfer Function
        4. 6.3.1.4 DAC Gain and Offset Calibration
        5. 6.3.1.5 Programmable Slew Rate
        6. 6.3.1.6 DAC Register Structure and CLEAR State
      2. 6.3.2  Analog-to-Digital Converter (ADC) Overview
        1. 6.3.2.1 ADC Operation
        2. 6.3.2.2 ADC Custom Channel Sequencer
        3. 6.3.2.3 ADC Synchronization
        4. 6.3.2.4 ADC Offset Calibration
        5. 6.3.2.5 External Monitoring Inputs
        6. 6.3.2.6 Temperature Sensor
        7. 6.3.2.7 Self-Diagnostic Multiplexer
        8. 6.3.2.8 ADC Bypass
      3. 6.3.3  Programmable Out-of-Range Alarms
        1. 6.3.3.1 Alarm-Based Interrupts
        2. 6.3.3.2 Alarm Action Configuration Register
        3. 6.3.3.3 Alarm Voltage Generator
        4. 6.3.3.4 Temperature Sensor Alarm Function
        5. 6.3.3.5 Internal Reference Alarm Function
        6. 6.3.3.6 ADC Alarm Function
        7. 6.3.3.7 Fault Detection
      4. 6.3.4  IRQ
      5. 6.3.5  HART Interface
        1. 6.3.5.1  FIFO Buffers
          1. 6.3.5.1.1 FIFO Buffer Access
          2. 6.3.5.1.2 FIFO Buffer Flags
        2. 6.3.5.2  HART Modulator
        3. 6.3.5.3  HART Demodulator
        4. 6.3.5.4  HART Modem Modes
          1. 6.3.5.4.1 Half-Duplex Mode
          2. 6.3.5.4.2 Full-Duplex Mode
        5. 6.3.5.5  HART Modulation and Demodulation Arbitration
          1. 6.3.5.5.1 HART Receive Mode
          2. 6.3.5.5.2 HART Transmit Mode
        6. 6.3.5.6  HART Modulator Timing and Preamble Requirements
        7. 6.3.5.7  HART Demodulator Timing and Preamble Requirements
        8. 6.3.5.8  IRQ Configuration for HART Communication
        9. 6.3.5.9  HART Communication Using the SPI
        10. 6.3.5.10 HART Communication Using UART
        11. 6.3.5.11 Memory Built-In Self-Test (MBIST)
      6. 6.3.6  Internal Reference
      7. 6.3.7  Integrated Precision Oscillator
      8. 6.3.8  Precision Oscillator Diagnostics
      9. 6.3.9  One-Time Programmable (OTP) Memory
      10. 6.3.10 GPIO
      11. 6.3.11 Timer
      12. 6.3.12 Unique Chip Identifier (ID)
      13. 6.3.13 Scratch Pad Register
    4. 6.4 Device Functional Modes
      1. 6.4.1 DAC Power-Down Mode
      2. 6.4.2 Register Built-In Self-Test (RBIST)
      3. 6.4.3 Reset
    5. 6.5 Programming
      1. 6.5.1 Communication Setup
        1. 6.5.1.1 SPI Mode
        2. 6.5.1.2 UART Mode
        3. 6.5.1.3 SPI Plus UART Mode
        4. 6.5.1.4 HART Functionality Setup Options
      2. 6.5.2 GPIO Programming
      3. 6.5.3 Serial Peripheral Interface (SPI)
        1. 6.5.3.1 SPI Frame Definition
        2. 6.5.3.2 SPI Read and Write
        3. 6.5.3.3 Frame Error Checking
        4. 6.5.3.4 Synchronization
      4. 6.5.4 UART Interface
        1. 6.5.4.1 UART Break Mode (UBM)
          1. 6.5.4.1.1 Interface With FIFO Buffers and Register Map
      5. 6.5.5 Status Bits
      6. 6.5.6 Watchdog Timer
  8. 7 Register Maps
    1. 7.1 AFEx82H1 Registers
  9. 8 Application and Implementation
    1. 8.1 Application Information
      1. 8.1.1 Multichannel Configuration
    2. 8.2 Typical Application
      1. 8.2.1 4-mA to 20-mA Current Transmitter
        1. 8.2.1.1 Design Requirements
        2. 8.2.1.2 Detailed Design Procedure
          1. 8.2.1.2.1 Current Loop Control
          2. 8.2.1.2.2 HART Connections
          3. 8.2.1.2.3 Input Protection and Rectification
          4. 8.2.1.2.4 System Current Budget
        3. 8.2.1.3 Application Curves
    3. 8.3 Initialization Setup
    4. 8.4 Power Supply Recommendations
    5. 8.5 Layout
      1. 8.5.1 Layout Guidelines
      2. 8.5.2 Layout Example
  10. 9 Device and Documentation Support
    1. 9.1 Documentation Support
      1. 9.1.1 Related Documentation
    2. 9.2 Receiving Notification of Documentation Updates
    3. 9.3 Support Resources
    4. 9.4 Trademarks
    5. 9.5 Electrostatic Discharge Caution
    6. 9.6 Glossary
  11. 10Revision History
  12. 11Mechanical, Packaging, and Orderable Information

Package Options

Refer to the PDF data sheet for device specific package drawings

Mechanical Data (Package|Pins)
  • RRU|24
Thermal pad, mechanical data (Package|Pins)
Orderable Information

6.3.1.4 DAC Gain and Offset Calibration

The AFEx82H1 provide DAC gain and offset calibration capability to correct for end-point errors present in the system. Implement the gain and offset calibration using two registers, DAC_GAIN.GAIN and DAC_OFFSET.OFFSET. Update DAC_DATA register after gain or offset codes are changed for the new values to take effect. The DAC_GAIN can be programmed from 0.5 to 1.499985 using Equation 2.

Equation 2. D A C _ G A I N = 1 2 + G A I N 2 N

where

  • N = DAC_GAIN resolution in bits: 16 for the AFE882H1 and 14 for the AFE782H1.
  • GAIN is the decimal value of the DAC_GAIN register setting.
  • GAIN data are left justified; the last two LSBs in the DAC_GAIN register are ignored for the AFE782H1.

The example DAC_GAIN settings for the AFE882H1 are shown in Table 6-1.

Table 6-1 DAC_GAIN Setting vs GAIN Code
DAC_GAIN GAIN (HEX)
0.5 0x0000
1.0 0x8000
1.499985 0xFFFF

The DAC_OFFSET is stored in the DAC_OFFSET register using 2's-complement encoding. The DAC_OFFSET value can be programmed from –2(N–1) to 2(N–1) – 1 using Equation 3.

Equation 3. D A C _ O F F S E T = - O F F S E T M S B × 2 ( N - 1 ) + ∑ i = 0 ( N - 2 ) O F F S E T i × 2 i

where

  • N = DAC_OFFSET resolution in bits: 16 for the AFE882H1 and 14 for the AFE782H1.
  • OFFSETMSB = MSB bit of the DAC_OFFSET register.
  • OFFSETi = The rest of the bits of the DAC_OFFSET register.
  • i = Position of the bit in the DAC_OFFSET register.
  • OFFSET data are left justified; the last two LSBs in the DAC_OFFSET register are ignored for the device.

The most significant bit determines the sign of the number and is called the sign bit. The sign bit has the weight of –2(N–1) as shown in Equation 3.

The example DAC_OFFSET settings for the AFE882H1 are shown in Table 6-2.

Table 6-2 DAC_OFFSET Setting vs OFFSET Code
DAC_OFFSET OFFSET (HEX)
32767 0x7FFF
1 0x0001
0 0x0000
–1 0xFFFF
–2 0xFFFE
–32768 0x8000

The following transfer function is applied to the DAC_DATA.DATA based on the DAC_GAIN and DAC_OFFSET values:

Equation 4. D A C _ C O D E = ( D A T A × D A C _ G A I N ) + D A C _ O F F S E T

where

  • DAC_CODE is the internal signal applied to the DAC.
  • DATA is the decimal value of the DAC_DATA register.
  • DAC_GAIN and DAC_OFFSET are the user calibration settings.
  • DATA data are left justified; the last two LSBs in the DAC_DATA register are ignored for the AFE782H1.

Substituting DAC_GAIN and DAC_OFFSET in Equation 4 with Equation 2 and Equation 3 results in:

Equation 5. D A C _ C O D E = ( D A T A × 1 2 + G A I N 2 N ) - O F F S E T M S B × 2 ( N - 1 ) + ∑ i = 0 ( N - 2 ) O F F S E T i × 2 i

The multiplier is implemented using truncation instead of rounding. This truncation can cause a difference of one LSB if rounding is expected. Figure 6-2 shows the DAC calibration path.

GUID-20220613-SS0I-HMRW-0FLQ-WGWFTPRVJGB4-low.svg Figure 6-2 DAC Calibration Path