SBASAO7 july   2023 AFE7954

PRODUCTION DATA  

  1.   1
  2. 1Features
  3. 2Applications
  4. 3Description
  5. 4Description (continued)
  6. 5Revision History
  7. 6Specifications
    1. 6.1  Absolute Maximum Ratings
    2. 6.2  ESD Ratings
    3. 6.3  Recommended Operating Conditions
    4. 6.4  Thermal Information AFE79xx
    5. 6.5  Transmitter Electrical Characteristics
    6. 6.6  PLL/VCO/Clock Electrical Characteristics
    7. 6.7  Digital Electrical Characteristics
    8. 6.8  Power Supply Electrical Characteristics
    9. 6.9  Timing Requirements
    10. 6.10 Switching Characteristics
  8. 7Device and Documentation Support
    1. 7.1 Receiving Notification of Documentation Updates
    2. 7.2 Support Resources
    3. 7.3 Trademarks
    4. 7.4 Electrostatic Discharge Caution
    5. 7.5 Glossary
  9. 8Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

6.1 Absolute Maximum Ratings

over operating free-air temperature range (unless otherwise noted)(1)
MIN MAX UNIT
Supply Voltage Range DVDD0P9, VDDT0P9 –0.3 1.2 V
VDD1P2RX, VDD1P2TXCLK, VDD1P2TXENC, VDD1P2PLL, VDD1P2PLLCLKREF, VDD1P2FB, VDD1P2FBCML, VDD1P2RXCML –0.3 1.4 V
VDD1P8RX, VDD1P8RXCLK, VDD1P8TX, VDD1P8TXDAC, VDD1P8TXENC, VDD1P8PLL, VDD1P8PLLVCO, VDD1P8FB, VDD1P8FBCLK, VDD1P8GPIO, VDDA1P8 –0.5 2.1 V
Pin Volatge Range {1/2/3/4}TXOUT+/- –0.5 VDDTX1P8+0.3 V
REFCLK+/-, SYSREF+/- –0.3 1.4 V
{1:8}SRX+/- –0.3 1.4 V
GPIO{B/C/D/E}x, SPICLK, SPISDIO, SPISDO, SPISEN, RESETZ, BISTB0, BISTB1 –0.5 VDD1P8GPIO + 0.3 V
IFORCE, VSENSE –0.3 VDDCLK1P8 + 0.3 V
SRDAMUX1, SRDAMUX2 –0.3 VDDA1P8+0.3 V
Peak Input Current any input 20 mA
TJ Junction temperature 150 °C
Tstg Storage temperature –65 150 °C
(1) Stresses beyond those listed under Absolute Maximum Rating may cause permanent damage to the device. These are stress ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Condition. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.