SPRSP65G April 2021 – May 2024 AM2431 , AM2432 , AM2434
PRODUCTION DATA
Refer to the PDF data sheet for device specific package drawings
The estimated POH data for continuous device operation at specific junction temperatures is provided in the table below.
Temperature Rating |
Temperature Range | JUNCTION TEMP (TJ)(1) |
ESTIMATED(2) LIFETIME (POH)(3) |
---|---|---|---|
A | -40°C to 105°C | 105°C | 100000 |
I | -40°C to 125°C | 105°C | 100000 |
110°C | 64000 | ||
115°C | 41000 | ||
120°C | 26500 | ||
125°C | 17500 |
Calculating Useful Lifetimes of Embedded Processors
This application report provides a methodology for calculating the useful lifetime of TI embedded processors (EP) under power when used in electronic systems. The document is intended for general engineers who wish to determine if the reliability of the TI EP device meets the end system reliability requirement. Electro-migration is the primary failure mechanism being modeled.
AM243x Extended Power-On Hours
This application report provides guidelines for extending the operational lifetime of an AM243x device from 100k Power-On Hours (POH) up to 200k POH.
TI provides a detailed quality and reliability section on the TI website which discusses quality and reliability for all TI devices, including the AM243x processor at http://www.ti.com/quality.