It is recommended to perform thermal simulations at the system level with the worst-case device power consumption.
PARAMETER |
DESCRIPTION |
℃/W(1)(2) |
AIR FLOW (m/s)(3) |
RΘJC |
Junction-to-case |
5.4 |
N/A |
RΘJB |
Junction-to-board |
5.3 |
N/A |
RΘJA |
Junction-to-free air |
18.7 |
0 |
RΘJA |
Junction-to-moving air |
12.4 |
1 |
11.2 |
2 |
10.6 |
3 |
ΨJT |
Junction-to-package top |
0.12 |
0 |
0.35 |
1 |
0.47 |
2 |
0.56 |
3 |
ΨJB |
Junction-to-board |
5.1 |
0 |
4.6 |
1 |
4.6 |
2 |
4.5 |
3 |
(1) These values are based on a JEDEC defined 2S2P system (with the exception of the Theta JC [RΘJC] value, which is based on a JEDEC defined 1S0P system) and will change based on environment as well as application. For more information, see these EIA/JEDEC standards:
• JESD51-2, Integrated Circuits Thermal Test Method Environment Conditions - Natural Convection (Still Air)
• JESD51-3, Low Effective Thermal Conductivity Test Board for Leaded Surface Mount Packages
• JESD51-6, Integrated Circuit Thermal Test Method Environmental Conditions - Forced Convection (Moving Air)
• JESD51-7, High Effective Thermal Conductivity Test Board for Leaded Surface Mount Packages
• JESD51-9, Test Boards for Area Array Surface Mount Packages
(2) ℃/W = degrees Celsius per watt
(3) m/s = meters per second