SLLS849E april   2008  – august 2023 AM26LV32E

PRODUCTION DATA  

  1.   1
  2. Features
  3. Applications
  4. Description
  5. Revision History
  6. Pin Configuration and Functions
  7. Specifications
    1. 6.1 Absolute Maximum Ratings
    2. 6.2 ESD Ratings
    3. 6.3 Recommended Operating Conditions
    4. 6.4 Thermal Information
    5. 6.5 Electrical Characteristics
    6. 6.6 Switching Characteristics
    7. 6.7 Typical Characteristics
  8. Parameter Measurement Information
  9. Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagram
    3. 8.3 Feature Description
      1. 8.3.1 ±7-V Common-Mode Range With ±200-mV Sensitivity
      2. 8.3.2 Input Fail-Safe Circuitry
      3. 8.3.3 Active-High and Active-Low
    4. 8.4 Device Functional Modes
      1. 8.4.1 Enable and Disable
  10. Application Information Disclaimer
    1. 9.1 Application Information
    2. 9.2 Typical Application
      1. 9.2.1 Design Requirements
      2. 9.2.2 Detailed Design Procedure
      3. 9.2.3 Application Curve
  11. 10Power Supply Recommendations
  12. 11Layout
    1. 11.1 Layout Guidelines
    2. 11.2 Layout Example
  13. 12Device and Documentation Support
    1. 12.1 Receiving Notification of Documentation Updates
    2. 12.2 Support Resources
    3. 12.3 Trademarks
    4. 12.4 Electrostatic Discharge Caution
    5. 12.5 Glossary
  14. 13Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

Revision History

Changes from Revision D (December 2020) to Revision E (August 2023)

  • Changed the Device Information table to the Package Information tableGo
  • Changed the Thermal Information Go
  • Changed the Typical Characteristics Go

Changes from Revision C (July 2018) to Revision D (December 2020)

  • Changed feature From: Open Circuit, Short Circuit, and Terminated Fail-Safe To: Open Circuit Fail-Safe Go
  • Deleted text from the Description: shorted fail-safe, and terminated fail-safe To: Open Circuit Fail-Safe Go
  • Deleted text from the last paragraph in Input Fail-Safe Circuitry: terminated or short Go
  • Deleted text from Table 8-1: shorted, or terminated Go

Changes from Revision B (July 2015) to Revision C (July 2018)

  • Changed the pinout image appearance Go
  • Changed the A and B Input signals on the waveform of Figure 7-1 Go

Changes from Revision A (May 2008) to Revision B (July 2015)

  • Added Pin Configuration and Functions section, ESD Ratings table, Feature Description section, Device Functional Modes, Application and Implementation section, Power Supply Recommendations section, Layout section, Device and Documentation Support section, and Mechanical, Packaging, and Orderable Information section Go