4 Revision History
Changes from Revision D (December 2020) to Revision E (August 2023)
- Changed the Device Information table to the Package Information
tableGo
- Changed the Thermal Information
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- Changed the Typical Characteristics
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Changes from Revision C (July 2018) to Revision D (December 2020)
- Changed feature From: Open Circuit, Short Circuit, and Terminated
Fail-Safe To: Open Circuit Fail-Safe
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- Deleted text from the Description: shorted fail-safe, and
terminated fail-safe To: Open Circuit Fail-Safe
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- Deleted text from the last paragraph in Input Fail-Safe Circuitry:
terminated or short
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- Deleted text from Table 8-1: shorted,
or terminated
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Changes from Revision B (July 2015) to Revision C (July 2018)
- Changed the pinout image appearance Go
- Changed the A and B Input signals on the waveform of Figure 7-1
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Changes from Revision A (May 2008) to Revision B (July 2015)
- Added Pin Configuration and Functions section, ESD Ratings table,
Feature Description section, Device Functional Modes, Application and
Implementation section, Power Supply Recommendations section, Layout
section, Device and Documentation Support section, and Mechanical,
Packaging, and Orderable Information section
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