It is recommended to perform thermal simulations at the system level
with the worst case device power consumption.
NO. |
PARAMETER |
DESCRIPTION |
AND
PACKAGE |
°C/W(1)(3) |
AIR FLOW (m/s)(2) |
T1 |
RΘJC |
Junction-to-case |
0.16 |
N/A |
T2 |
RΘJB |
Junction-to-board |
1.47 |
N/A |
T3 |
RΘJA |
Junction-to-free air |
9.22 |
0 |
T4 |
Junction-to-moving air |
5.07 |
1 |
T5 |
4.31 |
2 |
T7 |
ΨJT |
Junction-to-package top |
0.10 |
0 |
T8 |
0.10 |
1 |
T9 |
0.10 |
2 |
T11 |
ΨJB |
Junction-to-board |
1.30 |
0 |
T12 |
1.23 |
1 |
T13 |
1.18 |
2 |
(1) These values are based on a JEDEC defined 2S2P system (with the exception of the Theta JC [RΘJC] value, which is based on a JEDEC defined 1S0P system) and will change based on environment as well as application. For more information, see these EIA/JEDEC standards:
- JESD51-2, Integrated Circuits Thermal Test Method Environment Conditions - Natural Convection (Still Air)
- JESD51-3, Low Effective Thermal Conductivity Test Board for Leaded Surface Mount Packages
- JESD51-6, Integrated Circuit Thermal Test Method Environmental Conditions - Forced Convection (Moving Air)
- JESD51-7, High Effective Thermal Conductivity Test Board for Leaded Surface Mount Packages
- JESD51-9, Test Boards for Area Array Surface Mount Packages
(2) m/s = meters per second.
(3) °C/W = degrees Celsius per watt.