over operating free–air temperature range (unless otherwise
noted)(1)(2)
PARAMETER |
MIN |
MAX |
UNIT |
VDD_*(3) |
Core supplies |
–0.3 |
1.05 |
V |
VDDAR_*(3) |
RAM supplies |
–0.3 |
1.05 |
V |
VDDA_0P8_*(3) |
Analog supplies for 0.8V domains |
–0.3 |
1.05 |
V |
VDDA_1P8_*(3) |
Analog supplies for 1.8 V PHY domains |
–0.3 |
2.2 |
V |
VDDA_3P3_USB |
Analog supply for 3.3V USB domain |
–0.3 |
3.8 |
V |
VDDA_*(3) |
Analog supply for 1.8V PLL and other domains |
–0.3 |
2.2 |
V |
VDDS_DDR_*(3) |
DDR inteface power supplies |
–0.3 |
1.2 |
V |
VDDS_MMC0 |
MMC0 IO supply |
–0.3 |
2.2 |
V |
VDDSHV*(3) |
Dual Voltage LVCMOS IO supplies |
1.8 V |
–0.3 |
2.2 |
V |
3.3 V |
–0.3 |
3.8 |
VPP_CORE VPP MCU |
Supply voltage range for EFUSE domains |
–0.3 |
1.89 |
V |
USB0_VBUS(9) |
Voltage range for USB VBUS comparator input |
–0.3 |
3.6 |
V |
Steady State Max. Voltage at all fail–safe
IO pins |
I2C0_SCL, I2C0_SDA, WKUP_I2C0_SCL, WKUP_I2C0_SDA, MCU_I2C0_SCL,
MCU_I2C0_SDA, EXTINTn |
–0.3 |
3.8 |
V |
MCU_PORz, PORz |
–0.3 |
3.8 |
V |
Steady State Max. Voltage at all other IO
pins(4) |
VMON1_ER_VSYS(8),
VMON3_IR_VEXT1P8, VMON4_IR_VEXT1P8 |
–0.3 |
2.2 |
V |
VMON2_IR_VCPU |
–0.3 |
1.05 |
V |
VMON5_IR_VEXT3P3 |
–0.3 |
3.8 |
V |
All other IO pins |
–0.3 |
IO supply voltage + 0.3 |
V |
Transient Overshoot and Undershoot specification at IO
pin |
20% of IO supply voltage for up to 20% of signal period Figure 6-1 (see IO Transient Voltage Ranges) |
|
0.2 × VDD(7) |
V |
Latch–up Performance, Class II (125°C)(5) |
I–Test |
–100 |
100 |
mA |
Over–Voltage (OV) Test |
NA |
1.5 × VDD(7) |
V |
TSTG(6) |
Storage temperature |
–55 |
+150 |
°C |
(1) Operation outside the Absolute Maximum
Ratings may cause permanent device damage. Absolute Maximum Ratings do not imply
functional operation of the device at these or any other conditions beyond those listed
under
Recommended Operating
Conditions. If used outside the Recommended Operating Conditions but within
the Absolute Maximum Ratings, the device may not be fully functional, and this may affect
device reliability, functionality, performance, and shorten the device lifetime.
(2) All voltage values are with respect to their associated VSS or VSSA_x,
unless otherwise noted.
(3) VDD_* includes: VDD_CORE, VDD_CPU,
VDD_MCU, VDD_MCU_WAKE1, VDD_WAKE0
VDDAR_* includes:
VDDAR_CORE, VDDAR_CPU, VDDAR_MCU
VDDA_0P8_* includes:
VDDA_0P8_CSIRX0_1, VDDA_0P8_CSIRX2, VDDA_0P8_DLL_MMC0, VDDA_0P8_DSITX, VDDA_0P8_DSITX_C,
VDDA_0P8_PLL_DDR0, VDDA_0P8_PLL_DDR1, VDDA_0P8_PLL_DDR2, VDDA_0P8_PLL_DDR3,
VDDA_0P8_SERDES_C0_1, VDDA_0P8_SERDES_C2, VDDA_0P8_SERDES_C4, VDDA_0P8_SERDES0_1,
VDDA_0P8_SERDES2, VDDA_0P8_SERDES4, VDDA_0P8_UFS, VDDA_0P8_USB
VDDA_1P8_* includes: VDDA_1P8_CSIRX0_1, VDDA_1P8_CSIRX2, VDDA_1P8_DSITX,
VDDA_1P8_SERDES0_1, VDDA_1P8_SERDES2, VDDA_1P8_SERDES2_4, VDDA_1P8_SERDES4, VDDA_1P8_UFS,
VDDA_1P8_USB
VDDA_* includes: VDDA_ADC0, VDDA_ADC1,
VDDA_MCU_PLLGRP0, VDDA_MCU_TEMP, VDDA_OSC1, VDDA_PLLGRP0, VDDA_PLLGRP1, VDDA_PLLGRP10,
VDDA_PLLGRP12, VDDA_PLLGRP13, VDDA_PLLGRP2, VDDA_PLLGRP5, VDDA_PLLGRP6, VDDA_PLLGRP7,
VDDA_PLLGRP8, VDDA_PLLGRP9, VDDA_POR_WKUP, VDDA_TEMP0, VDDA_TEMP1, VDDA_TEMP2, VDDA_TEMP3,
VDDA_TEMP4, VDDA_WKUP
VDDS_DDR_* includes: VDDS_DDR,
VDDS_DDR_C0, VDDS_DDR_C1, VDDS_DDR_C2, VDDS_DDR_C3
VDDSHV*
includes: VDDSHV0, VDDSHV0_MCU, VDDSHV1_MCU, VDDSHV2, VDDSHV2_MCU, VDDSHV5
(4) This parameter applies to all IO pins which are not fail-safe and the
requirement applies to all values of IO supply voltage. For example, if the voltage
applied to a specific IO supply is 0 volts the valid input voltage range for any IO
powered by that supply will be –0.3 to +0.3 volts. Special attention should be applied
anytime peripheral devices are not powered from the same power sources used to power the
respective IO supply. It is important the attached peripheral never sources a voltage
outside the valid input voltage range, including power supply ramp–up and ramp–down
sequences.
(5) For current pulse injection:
Pins
stressed per JEDEC JESD78E (Class II) and passed with specified I/O pin injection current
and clamp voltage of 1.5 times maximum recommended I/O voltage and negative 0.5 times
maximum recommended I/O voltage.
For overvoltage
performance:
Supplies stressed per JEDEC JESD78E (Class II)
and passed specified voltage injection.
(6) For tape and reel the storage temperature range is [–10°C; +50°C] with
a maximum relative humidity of 70%. TI recommends returning to ambient room temperature
before usage.
(7) VDD is the voltage on the corresponding power-supply pin(s) for the
IO.
(9) An external resistor divider is required to limit the voltage
applied to this device pin. For more information, see the
USB VBUS Design Guidelines.
Fail-safe IO terminals are designed such they do
not have dependencies on the respective IO power supply voltage. This allows external
voltage sources to be connected to these IO terminals when the respective IO power supplies
are turned off. The I2C0_SCL, I2C0_SDA, I2C1_SCL, I2C1_SDA, DDR_FS_RESETn, and NMIn are the
only fail–safe IO terminals. All other IO terminals are not fail–safe and the voltage
applied to them should be limited to the value defined by the Steady State Max. Voltage at
all IO pins parameter in Absolute Maximum
Ratings.