SBASAZ5 October 2024 AMC0386-Q1
ADVANCE INFORMATION
Refer to the PDF data sheet for device specific package drawings
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|---|
tH | DOUT hold time after rising edge of CLKIN | CLOAD = 15pF | 10 | ns | ||
tD | Rising edge of CLKIN to DOUT valid delay | CLOAD = 15pF | 35 | ns | ||
tr | DOUT rise time | 10% to 90%, 2.7V ≤ DVDD ≤ 3.6V, CLOAD = 15pF | 2.5 | 6 | ns | |
10% to 90%, 4.5V ≤ DVDD ≤ 5.5V, CLOAD = 15pF | 3.2 | 6 | ||||
tf | DOUT fall time | 10% to 90%, 2.7V ≤ DVDD ≤ 3.6V, CLOAD = 15pF | 2.2 | 6 | ns | |
10% to 90%, 4.5V ≤ DVDD ≤ 5.5V, CLOAD = 15pF | 2.9 | 6 | ||||
tSTART | Device start-up time | AVDD step from 0 to 3.0V with AVDD ≥ 2.7V to bitstream valid, 0.1% settling | 100 | µs |