4 Revision History
Changes from Revision C (December 2016) to Revision D (April 2023)
- Added TUV IEC 62368 Certification FeatureGo
- Changed BTST from anode to cathode and REGN from cathode to anode in
descriptionsGo
- Updated inclusive terminology throughout data sheetGo
Changes from Revision A (October 2013) to Revision B (November 2014)
- Added Handling Rating table, Feature Description section, Device Functional Modes, Application and Implementation section, Power Supply Recommendations section, Layout section, Device and Documentation Support section, and Mechanical, Packaging, and Orderable Information section.Go
- Changed front page schematicGo
- Changed REG01[4] = 1 to REG01[5] = 1 in OTG
descriptionGo
- Added (10kΩ NTC thermister only) to QON descriptionGo
- Added ESD information to Handling Ratings Go
- Changed ICHG = 1792 mA in IICHG_REG_ACC test
conditionsGo
- Changed falling to rising in VHTF
Go
- Changed VHTF TYP to 47.2% Go
- Changed Input high threshold (OTG) MIN to 1.1 VGo
- Changed Table 9-2
Go
- Changed Figure 9-5
Go
- Changed RT1 = 5.25 kΩ Go
- Deleted and LSFET from Voltage and Current Monitoring in Buck Mode descriptionGo
- Deleted HSFET and from Voltage and Current Monitoring in Boost
Mode descriptionGo
- Changed text in Section 9.3.5.4.1
Go
- Changed REG09[5] to REG09[3] in Battery Over-Voltage Protection (BATOVP) sectionGo
- Changed REG09 Bit 3 description 1 – Battery OVP Go
Changes from Revision * (September 2013) to Revision A (October 2013)
- Deleted H from BQ24297 PART NUMBERGo