SLUS763D July 2007 – April 2016
PRODUCTION DATA.
Refer to the PDF data sheet for device specific package drawings
MIN | MAX | UNIT | ||
---|---|---|---|---|
Input voltage | IN (with respect to VSS) | –0.3 | 30 | V |
OUT (with respect to VSS) | –0.3 | 12 | ||
ILIM, FAULT, CE, VBAT (with respect to VSS) | –0.3 | 7 | ||
Input current | IN | 2 | A | |
Output current | OUT | 2 | A | |
Output sink current | FAULT | 15 | mA | |
Junction temperature, TJ | –40 | 150 | °C | |
Storage temperature, Tstg | –65 | 150 | °C |
VALUE | UNIT | |||
---|---|---|---|---|
V(ESD) | Electrostatic discharge | Human body model (HBM), per ANSI/ESDA/JEDEC JS-001(1) | ±2000 | V |
Charged device model (CDM), per JEDEC specification JESD22-C101(2) | ±500 |
MIN | MAX | UNIT | ||
---|---|---|---|---|
VIN | Input voltage | 3.3 | 26 | V |
IIN | Input current, IN pin | 1.5 | A | |
IOUT | Output current, OUT pin | 1.5 | A | |
RILIM | OCP programming resistor | 15 | 90 | kΩ |
TJ | Junction temperature | 0 | 125 | °C |
THERMAL METRIC(1) | bq24314, bq24316 | UNIT | ||
---|---|---|---|---|
DSG (WSON) | DSJ (VSON) | |||
8 PINS | 12 PINS | |||
RθJA | Junction-to-ambient thermal resistance | 58.6 | 49.8 | °C/W |
RθJC(top) | Junction-to-case (top) thermal resistance | 67.9 | 60.1 | °C/W |
RθJB | Junction-to-board thermal resistance | 29.7 | 24.9 | °C/W |
ψJT | Junction-to-top characterization parameter | 1.2 | 2.4 | °C/W |
ψJB | Junction-to-board characterization parameter | 30.3 | 24.9 | °C/W |
RθJC(bot) | Junction-to-case (bottom) thermal resistance | 7.6 | 11.9 | °C/W |
MIN | NOM | MAX | UNIT | |||
---|---|---|---|---|---|---|
IN | ||||||
tDGL(PGOOD) | Deglitch time, input power detected status | CE = Low. Time measured from VIN 0 V → 5 V, 1-μs rise-time, to output turning ON |
8 | ms | ||
INPUT OVERVOLTAGE PROTECTION | ||||||
tPD(OVP) | Input OV propagation delay(1) | CE = Low | 1 | μs | ||
tON(OVP) | Recovery time from input overvoltage condition | CE = Low, Time measured from VIN 7.5 V → 5 V, 1-μs fall-time |
8 | ms | ||
INPUT OVERCURRENT PROTECTION | ||||||
tBLANK(OCP) | Blanking time, input overcurrent detected | 176 | μs | |||
tREC(OCP) | Recovery time from input overcurrent condition | 64 | ms | |||
BATTERY OVERVOLTAGE PROTECTION | ||||||
tDGL(BOVP) | Deglitch time, battery overvoltage detected | CE = Low, VIN > 4.4 V. Time measured from VVBAT rising from 4.1 V to 4.4 V to FAULT going low. | 176 | μs |
Test conditions (unless otherwise noted) for typical operating performance: VIN = 5 V, CIN = 1 μF, COUT = 1 μF, RILIM = 25 kΩ, RBAT = 100 kΩ, TA = 25°C, VPU = 3.3 V (see Figure 11 for the Typical Application Circuit)