SLUSFH5A May   2024  – October 2024 BQ25856-Q1

PRODUCTION DATA  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Device Comparison
  6. 5 Pin Configuration and Functions
  7. 6 Specifications
    1. 6.1 Absolute Maximum Ratings
    2. 6.2 ESD Ratings
    3. 6.3 Recommended Operating Conditions
    4. 6.4 Thermal Information
    5. 6.5 Electrical Characteristics
    6. 6.6 Timing Requirements
    7. 6.7 Typical Characteristics
  8. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1  Device Power-On-Reset
      2. 7.3.2  Device Power-Up From Battery Without Input Source
      3. 7.3.3  Device Power Up From Input Source
        1. 7.3.3.1 VAC Operating Window Programming (ACUV and ACOV)
        2. 7.3.3.2 REGN Regulator (REGN LDO)
        3. 7.3.3.3 Compensation-Free Buck-Boost Converter Operation
          1. 7.3.3.3.1 Light-Load Operation
        4. 7.3.3.4 Switching Frequency and Synchronization (FSW_SYNC)
        5. 7.3.3.5 Device HIZ Mode
      4. 7.3.4  Battery Charging Management
        1. 7.3.4.1 Autonomous Charging Cycle
          1. 7.3.4.1.1 Charge Current Programming (ICHG pin and ICHG_REG)
        2. 7.3.4.2 Li-Ion Battery Charging Profile
        3. 7.3.4.3 LiFePO4 Battery Charging Profile
        4. 7.3.4.4 Charging Termination for Li-ion and LiFePO4
        5. 7.3.4.5 Charging Safety Timer
        6. 7.3.4.6 Thermistor Qualification
          1. 7.3.4.6.1 JEITA Guideline Compliance in Charge Mode
          2. 7.3.4.6.2 Cold/Hot Temperature Window in Reverse Mode
      5. 7.3.5  Power Management
        1. 7.3.5.1 Dynamic Power Management: Input Voltage and Input Current Regulation
          1. 7.3.5.1.1 Input Current Regulation
            1. 7.3.5.1.1.1 ILIM_HIZ Pin
          2. 7.3.5.1.2 Input Voltage Regulation
      6. 7.3.6  Switching Frequency Dithering Feature
      7. 7.3.7  Reverse Mode Power Direction
        1. 7.3.7.1 Auto Reverse Mode
      8. 7.3.8  Integrated 16-Bit ADC for Monitoring
      9. 7.3.9  Status Outputs (PG, STAT1, STAT2, and INT)
        1. 7.3.9.1 Power Good Indicator (PG)
        2. 7.3.9.2 Charging Status Indicator (STAT1, STAT2 Pins)
        3. 7.3.9.3 Interrupt to Host (INT)
      10. 7.3.10 Protections
        1. 7.3.10.1 Voltage and Current Monitoring
          1. 7.3.10.1.1 VAC Over-voltage Protection (VAC_OVP)
          2. 7.3.10.1.2 VAC Under-voltage Protection (VAC_UVP)
          3. 7.3.10.1.3 Battery Over-voltage Protection (BAT_OVP)
          4. 7.3.10.1.4 Battery Over-current Protection (BAT_OCP)
          5. 7.3.10.1.5 Reverse Mode Over-voltage Protection (REV_OVP)
          6. 7.3.10.1.6 Reverse Mode Under-voltage Protection (REV_UVP)
          7. 7.3.10.1.7 DRV_SUP Under-voltage and Over-voltage Protection (DRV_OKZ)
          8. 7.3.10.1.8 REGN Under-voltage Protection (REGN_OKZ)
        2. 7.3.10.2 Thermal Shutdown (TSHUT)
      11. 7.3.11 Serial Interface
        1. 7.3.11.1 Data Validity
        2. 7.3.11.2 START and STOP Conditions
        3. 7.3.11.3 Byte Format
        4. 7.3.11.4 Acknowledge (ACK) and Not Acknowledge (NACK)
        5. 7.3.11.5 Target Address and Data Direction Bit
        6. 7.3.11.6 Single Write and Read
        7. 7.3.11.7 Multi-Write and Multi-Read
    4. 7.4 Device Functional Modes
      1. 7.4.1 Host Mode and Default Mode
      2. 7.4.2 Register Bit Reset
    5. 7.5 BQ25856-Q1 Registers
  9. 8 Application and Implementation
    1. 8.1 Application Information
    2. 8.2 Typical Applications
      1. 8.2.1 Typical Application
        1. 8.2.1.1 Design Requirements
        2. 8.2.1.2 Detailed Design Procedure
          1. 8.2.1.2.1 ACUV / ACOV Input Voltage Operating Window Programming
          2. 8.2.1.2.2 Charge Voltage Selection
          3. 8.2.1.2.3 Switching Frequency Selection
          4. 8.2.1.2.4 Inductor Selection
          5. 8.2.1.2.5 Input (VAC) Capacitor
          6. 8.2.1.2.6 Output (VBAT) Capacitor
          7. 8.2.1.2.7 Sense Resistor (RAC_SNS and RBAT_SNS) and Current Programming
          8. 8.2.1.2.8 Power MOSFETs Selection
          9. 8.2.1.2.9 Converter Fast Transient Response
        3. 8.2.1.3 Application Curves
      2. 8.2.2 Typical Application (4s LiFePO4 car battery configuration)
        1. 8.2.2.1 Design Requirements
      3. 8.2.3 Typical Application (Capacitor Backup)
        1. 8.2.3.1 Design Requirements
  10. 9 Power Supply Recommendations
  11. 10Layout
    1. 10.1 Layout Guidelines
    2. 10.2 Layout Example
  12. 11Device and Documentation Support
    1. 11.1 Device Support
      1. 11.1.1 Third-Party Products Disclaimer
    2. 11.2 Receiving Notification of Documentation Updates
    3. 11.3 Support Resources
    4. 11.4 Trademarks
    5. 11.5 Electrostatic Discharge Caution
    6. 11.6 Glossary
  13. 12Revision History
  14. 13Mechanical, Packaging, and Orderable Information

Package Options

Refer to the PDF data sheet for device specific package drawings

Mechanical Data (Package|Pins)
  • RRV|36
Thermal pad, mechanical data (Package|Pins)
Orderable Information

7.3.9.3 Interrupt to Host (INT)

In some applications, the host does not always monitor the charger operation. The INT pin notifies the system host on the device operation. By default, the following events will generate an active-low, 256-µs INT pulse.

  1. Valid input source conditions detected (see conditions for PG pin)
  2. Valid input source conditions removed (see conditions for PG pin)
  3. Entering IAC_DPM regulation through register or ILIM_HIZ pin
  4. Entering VAC_DPM regulation through register or ACUV pin
  5. I2C Watchdog timer expired
  6. Charger status changes state (CHARGE_STAT value change), including Charge Complete
  7. TS_STAT changes state (TS_STAT value change)
  8. Junction temperature shutdown (TSHUT)
  9. Battery overvoltage detected (BATOVP)
  10. A rising edge on any of the *_STAT bits

Each one of these INT sources can be masked off to prevent INT pulses from being sent out when they occur. Three bits exist for each one of these events:

  • The STAT bit holds the current status of each INT source
  • The FLAG bit holds information on which source produced an INT, regardless of the current status
  • The MASK bit is used to prevent the device from sending out INT for each particular event

When one of the above conditions occurs (a rising edge on any of the *_STAT bits), the device sends out an INT pulse and keeps track of which source generated the INT via the FLAG registers. The FLAG register bits are automatically reset to zero after the host reads them, and a new edge on STAT bit is required to re-assert the FLAG.

BQ25856-Q1 INT Generation Behavior ExampleFigure 7-6 INT Generation Behavior Example