The Texas Instruments bq27220 battery fuel gauge is a single-cell gauge that requires minimal user-configuration and system microcontroller firmware development, leading to quick system bring-up. The bq27220 device uses the Compensated End-of-Discharge Voltage (CEDV) algorithm for fuel gauging, and provides information such as remaining battery capacity (mAh), state-of-charge (%), runtime-to-empty (min), battery voltage (mV), temperature (°C), and state-of-health (%).
The bq27220 battery fuel gauge has ultra-low power consumption in NORMAL (50 μA) and SLEEP (9 μA) modes, leading to longer battery runtime. Configurable interrupts help save system power and free up the host from continuous polling. Accurate temperature sensing is supported via an external thermistor.
Customers can use preloaded CEDV parameters in ROM or can generate custom chemistry parameters using TI's web-based tool, GAUGEPARCAL. Custom-generated parameters can be either programmed in the device RAM by the host on power up of the system or customers can program the parameters to an onboard One-Time Programmable (OTP) memory.
Battery fuel gauging with the bq27220 device requires connections only to PACK+ (P+) and PACK– (P–) for a removable battery pack or embedded battery circuit. The tiny, 9-ball, 1.62 mm × 1.58 mm, 0.5-mm pitch NanoFree™ chip scale package (DSBGA) is ideal for space-constrained applications.
PART NUMBER | PACKAGE | BODY SIZE (NOM) |
---|---|---|
bq27220 | YZF (9) | 1.62 mm × 1.58 mm |
DATE | REVISION | NOTES |
---|---|---|
April 2016 | A | PRODUCT PREVIEW to Production Data |
PIN | TYPE | DESCRIPTION | |
---|---|---|---|
NAME | NUMBER | ||
BAT | C3 | PI, AI(1) | LDO regulator input and battery voltage measurement input. Kelvin sense connect to the positive battery terminal (PACKP). Connect a capacitor (1 µF) between BAT and VSS. Place the capacitor close to the gauge. |
BIN | B1 | DI | Battery insertion detection input. If OpConfig [BI_PU_EN] = 1 (default), a logic low on the pin is detected as battery insertion. For a removable pack, the BIN pin can be connected to VSS through a pulldown resistor on the pack, typically the 10-kΩ thermistor; the system board should use a 1.8-MΩ pullup resistor to VDD to ensure the BIN pin is high when a battery is removed. If the battery is embedded in the system or in the pack, it is recommended to leave [BI_PU_EN] = 1 and use a 10-kΩ pulldown resistor from BIN to VSS. If [BI_PU_EN] = 0, then the host must inform the gauge of battery insertion and removal with the BAT_INSERT and BAT_REMOVE subcommands. A 10-kΩ pulldown resistor should be placed between BIN and VSS, even if this pin is unused. NOTE: The BIN pin must not be shorted directly to VCC or VSS and any pullup resistor on the BIN pin must be connected only to VDD and not an external voltage rail. If an external thermistor is used for temperature input, the thermistor should be connected between this pin and VSS. |
GPOUT | A1 | DO | This open-drain output can be configured to indicate BAT_LOW when the OpConfig [BATLOWEN] bit is set. By default [BATLOWEN] is cleared and this pin performs an interrupt function (SOC_INT) by pulsing for specific events, such as a change in state-of-charge. Signal polarity for these functions is controlled by the [GPIOPOL] configuration bit. This pin should not be left floating, even if unused; therefore, a 10-kΩ pullup resistor is recommended. If the device is in SHUTDOWN mode, toggling GPOUT makes the gauge exit SHUTDOWN. It is recommended to connect GPOUT to a GPIO of the host MCU so that in case of any inadvertent shutdown condition, the gauge can be commanded to come out of SHUTDOWN. |
SCL | A3 | DIO | Slave I2C serial bus for communication with system (Master). Open-drain pins. Use with external 10-kΩ pullup resistors (typical) for each pin. If the external pullup resistors will be disconnected from these pins during normal operation, recommend using external 1-MΩ pulldown resistors to VSS at each pin to avoid floating inputs. |
SDA | A2 | DIO | |
SRN | C2 | AI | Coulomb counter differential inputs expecting an external 10-mΩ, 1% sense resistor. For system-side configurations, Kelvin sense connect SRP to the positive battery terminal (PACKP) side of the external sense resistor. Kelvin sense connect SRN to the other side of the external sense resistor with the positive connection to the system (VSYS). For pack-side configurations with low-side sensing, connect SRP to PACK– and SRN to Cell–. See the Simplified Schematic. No calibration is required. The fuel gauge is pre-calibrated for a standard 10-mΩ, 1% sense resistor. |
SRP | C1 | AI | |
VDD | B3 | PO | 1.8-V regulator output. Decouple with a 2.2-μF ceramic capacitor to VSS. This pin is not intended to provide power for other devices in the system. |
VSS | B2 | PI | Ground pin |
MIN | MAX | UNIT | ||
---|---|---|---|---|
VBAT | BAT pin input voltage range | –0.3 | 6 | V |
VSR | SRP and SRN pins input voltage range | –0.3 | VBAT + 0.3 | V |
Differential voltage across SRP and SRN. ABS(SRP – SRN) | 2 | V | ||
VDD | VDD pin supply voltage range (LDO output) | –0.3 | 2 | V |
VIOD | Open-drain IO pins (SDA, SCL) | –0.3 | 6 | V |
VIOPP | Push-pull IO pins (BIN) | –0.3 | VDD + 0.3 | V |
TA | Operating free-air temperature range | –40 | 85 | °C |
Storage temperature, Tstg | –65 | 150 | °C |
VALUE | UNIT | |||
---|---|---|---|---|
V(ESD) | Electrostatic discharge | Human body model (HBM), per ANSI/ESDA/JEDEC JS-001(1) | ±1500 | V |
Charged-device model (CDM), per JEDEC specification JESD22-C101(2) | ±250 |
MIN | NOM | MAX | UNIT | |||
---|---|---|---|---|---|---|
CBAT(1) | External input capacitor for internal LDO between BAT and VSS | Nominal capacitor values specified. Recommend a 5% ceramic X5R-type capacitor located close to the device. | 0.1 | μF | ||
CLDO18(1) | External output capacitor for internal LDO between VDD and VSS | 2.2 | μF | |||
VPU(1) | External pullup voltage for open-drain pins (SDA, SCL, GPOUT) | 1.62 | 3.6 | V |
THERMAL METRIC(1) | bq27220 | UNIT | |
---|---|---|---|
YZF (DSBGA) | |||
9 PINS | |||
RθJA | Junction-to-ambient thermal resistance | 64.1 | °C/W |
RθJCtop | Junction-to-case (top) thermal resistance | 59.8 | °C/W |
RθJB | Junction-to-board thermal resistance | 52.7 | °C/W |
ψJT | Junction-to-top characterization parameter | 0.3 | °C/W |
ψJB | Junction-to-board characterization parameter | 28.3 | °C/W |
RθJCbot | Junction-to-case (bottom) thermal resistance | 2.4 | °C/W |
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|---|
ICC(1) | NORMAL mode current | ILOAD > Sleep Current(2) | 50 | μA | ||
ISLP(1) | SLEEP mode current | ILOAD < Sleep Current(2) | 9 | μA | ||
ISD(1) | SHUTDOWN mode current | Fuel gauge in host commanded SHUTDOWN mode. (LDO regulator output disabled) |
0.6 | μA |
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|---|
VIH(OD) | Input voltage, high(2) | External pullup resistor to VPU | VPU × 0.7 | V | ||
VIH(PP) | Input voltage, high (3) | 1.4 | V | |||
VIL | Input voltage, low(2) (3) | 0.6 | V | |||
VOL | Output voltage, low(2) | 0.6 | V | |||
IOH | Output source current, high(2) | 0.5 | mA | |||
IOL(OD) | Output sink current, low(2) | –3 | mA | |||
CIN(1) | Input capacitance(2)(3) | 5 | pF | |||
Ilkg | Input leakage current (SCL, SDA, BIN, GPOUT) |
1 | μA |
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|---|
VBAT | BAT pin regulator input | 2.45 | 4.5 | V | ||
VDD | Regulator output voltage | 1.85 | V | |||
UVLOIT+ | VBAT undervoltage lock-out LDO wake-up rising threshold |
2 | V | |||
UVLOIT– | VBAT undervoltage lock-out LDO auto-shutdown falling threshold |
1.95 | V | |||
VWU+(1) | GPOUT (input) LDO Wake-up rising edge threshold(2) | LDO Wake-up from SHUTDOWN mode | 1.2 | V |
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|---|
tSHDN(1) | SHUTDOWN entry time | Time delay from SHUTDOWN command to LDO output disable. | 250 | ms | ||
tSHUP(1) | SHUTDOWN GPOUT low time | Minimum low time of GPOUT (input) in SHUTDOWN before WAKEUP | 10 | μs | ||
tVDD(1) | Initial VDD output delay | 13 | ms | |||
tWUVDD(1) | Wake-up VDD output delay | Time delay from rising edge of GPOUT (input) to nominal VDD output. | 8 | ms | ||
tPUCD | Power-up communication delay | Time delay from rising edge of BAT to the Active state. Includes firmware initialization time. | 250 | ms |
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|---|
VIN(BAT) | BAT pin voltage measurement range | Voltage divider enabled | 2.45 | 4.5 | V | |
tADC_CONV | Conversion time | 125 | ms | |||
Effective resolution | 15 | bits |
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|---|
VSRCM | Input voltage range of SRN, SRP pins | VSS | VBAT | V | ||
VSRDM | Input differential voltage range of VSRP–VSRN | ± 80 | mV | |||
tSR_CONV | Conversion time | Single conversion | 1 | s | ||
Effective Resolution | Single conversion | 16 | bits |
MIN | NOM | MAX | UNIT | |||
---|---|---|---|---|---|---|
Standard Mode (100 kHz) | ||||||
td(STA) | Start to first falling edge of SCL | 4 | μs | |||
tw(L) | SCL pulse duration (low) | 4.7 | μs | |||
tw(H) | SCL pulse duration (high) | 4 | μs | |||
tsu(STA) | Setup for repeated start | 4.7 | μs | |||
tsu(DAT) | Data setup time | Host drives SDA | 250 | ns | ||
th(DAT) | Data hold time | Host drives SDA | 0 | ns | ||
tsu(STOP) | Setup time for stop | 4 | μs | |||
t(BUF) | Bus free time between stop and start | Includes Command Waiting Time | 66 | μs | ||
tf | SCL or SDA fall time(1) | 300 | ns | |||
tr | SCL or SDA rise time(1) | 300 | ns | |||
fSCL | Clock frequency(2) | 100 | kHz | |||
Fast Mode (400 kHz) | ||||||
td(STA) | Start to first falling edge of SCL | 600 | ns | |||
tw(L) | SCL pulse duration (low) | 1300 | ns | |||
tw(H) | SCL pulse duration (high) | 600 | ns | |||
tsu(STA) | Setup for repeated start | 600 | ns | |||
tsu(DAT) | Data setup time | Host drives SDA | 100 | ns | ||
th(DAT) | Data hold time | Host drives SDA | 0 | ns | ||
tsu(STOP) | Setup time for stop | 600 | ns | |||
t(BUF) | Bus free time between stop and start | Includes Command Waiting Time | 66 | μs | ||
tf | SCL or SDA fall time(1) | 300 | ns | |||
tr | SCL or SDA rise time(1) | 300 | ns | |||
fSCL | Clock frequency(2) | 400 | kHz |