SLUSFF9 November   2023 BQ27Z558

PRODUCTION DATA  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Description (continued)
  6. 5 Pin Configuration and Functions
  7. 6 Specifications
    1. 6.1  Absolute Maximum Ratings
    2. 6.2  ESD Ratings
    3. 6.3  Recommended Operating Conditions
    4. 6.4  Thermal Information
    5. 6.5  Supply Current
    6. 6.6  Internal 1.8-V LDO (REG18)
    7. 6.7  I/O (PULS, INT)
    8. 6.8  Chip Enable (CE)
    9. 6.9  Internal Temperature Sensor
    10. 6.10 NTC Thermistor Measurement Support
    11. 6.11 Coulomb Counter (CC)
    12. 6.12 Analog Digital Converter (ADC)
    13. 6.13 Internal Oscillator Specifications
    14. 6.14 Voltage Reference1 (REF1)
    15. 6.15 Voltage Reference2 (REF2)
    16. 6.16 Flash Memory
    17. 6.17 I2C I/O
    18. 6.18 I2C Timing — 100 kHz
    19. 6.19 I2C Timing — 400 kHz
    20. 6.20 HDQ Timing
    21. 6.21 Typical Characteristics
  8. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1  BQ27Z558 Processor
      2. 7.3.2  Battery Parameter Measurements
        1. 7.3.2.1 Coulomb Counter (CC)
        2. 7.3.2.2 CC Digital Filter
        3. 7.3.2.3 ADC Multiplexer
        4. 7.3.2.4 Analog-to-Digital Converter (ADC)
        5. 7.3.2.5 Internal Temperature Sensor
        6. 7.3.2.6 External Temperature Sensor Support
      3. 7.3.3  Power Supply Control
      4. 7.3.4  Bus Communication Interface
      5. 7.3.5  Low Frequency Oscillator
      6. 7.3.6  High Frequency Oscillator
      7. 7.3.7  1.8-V Low Dropout Regulator
      8. 7.3.8  Internal Voltage References
      9. 7.3.9  Gas Gauging
      10. 7.3.10 Charge Control Features
      11. 7.3.11 Authentication
    4. 7.4 Device Functional Modes
      1. 7.4.1 Lifetime Logging Features
      2. 7.4.2 Configuration
        1. 7.4.2.1 Coulomb Counting
        2. 7.4.2.2 Cell Voltage Measurements
        3. 7.4.2.3 Auto Calibration
        4. 7.4.2.4 Temperature Measurements
  9. 8 Applications and Implementation
    1. 8.1 Application Information
    2. 8.2 Typical Applications
      1. 8.2.1 Design Requirements (Default)
      2. 8.2.2 Detailed Design Procedure
        1. 8.2.2.1 Changing Design Parameters
      3. 8.2.3 Calibration Process
      4. 8.2.4 Gauging Data Updates
        1. 8.2.4.1 Application Curve
    3. 8.3 Power Supply Recommendations
    4. 8.4 Layout
      1. 8.4.1 Layout Guidelines
      2. 8.4.2 Layout Example
  10. 9 Device and Documentation Support
    1. 9.1 Device Support
      1. 9.1.1 Third-Party Products Disclaimer
    2. 9.2 Documentation Support
      1. 9.2.1 Related Documentation
    3. 9.3 Receiving Notification of Documentation Updates
    4. 9.4 Support Resources
    5. 9.5 Trademarks
    6. 9.6 Electrostatic Discharge Caution
    7. 9.7 Glossary
  11. 10Revision History
  12. 11Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

6.18 I2C Timing — 100 kHz

Unless otherwise noted, characteristics noted under conditions of TA = –40℃ to 85℃. Device supports 100 kHz when SCL and SDA pins are pulled up to VPULL-UP = 1.2 V, 1.8 V, 2.5 V, or 3.3 V
PARAMETERTEST CONDITIONSMINNOMMAXUNIT
fSCLClock operating frequencySCL duty cycle = 50%100kHz
tHD:STAStart condition hold time4.0µs
tLOWLow period of the SCL Clock4.7µs
tHIGHHigh period of the SCL Clock4.0µs
tSU:STASetup repeated START4.7µs
tHD:DATData hold time (SDA input)0ns
tSU:DATData setup time (SDA input)250ns
tr Clock rise time 30% to 70% of VPULL-UP 1000 ns
tfClock fall time70% to 30% of VPULL-UP300ns
tSU:STOSetup time STOP condition4.0µs
tBUFBus free time STOP to START4.7µs