SLUSB15J September 2012 – May 2021 BQ2947
PRODUCTION DATA
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|---|
VOLTAGE PROTECTION THRESHOLDS | ||||||
VOV | V(PROTECT) Overvoltage Detection | BQ294700, RIN = 1 kΩ | 4.350 | V | ||
BQ294701, RIN = 1 kΩ | 4.250 | V | ||||
BQ294702, RIN = 1 kΩ | 4.300 | V | ||||
BQ294703, RIN = 1 kΩ | 4.325 | V | ||||
BQ294704, RIN = 1 kΩ | 4.400 | V | ||||
BQ294705, RIN = 1 kΩ | 4.450 | V | ||||
BQ294706, RIN = 1 kΩ | 4.550 | V | ||||
BQ294707, RIN = 1 kΩ | 4.225 | V | ||||
BQ294708, RIN = 1 kΩ | 4.500 | V | ||||
BQ294711, RIN = 1 kΩ | 4.220 | V | ||||
BQ294712, RIN = 1 kΩ | 4.125 | V | ||||
BQ294713, RIN = 1 kΩ | 4.600 | V | ||||
VHYS | OV Detection Hysteresis | BQ2947(1) | 250 | 300 | 400 | mV |
VOA | OV Detection Accuracy | TA = 25°C | –10 | 10 | mV | |
VOADRIFT | OV Detection Accuracy Across Temperature | TA = –40°C | –40 | 40 | mV | |
TA = 0°C | –20 | 20 | mV | |||
TA = 60°C | –24 | 24 | mV | |||
TA = 110°C | –54 | 54 | mV | |||
SUPPLY AND LEAKAGE CURRENT | ||||||
IDD | Supply Current | (V4–V3) = (V3–V2) = (V2–V1) = (V1–VSS) = 4.0 V at TA = 25°C (See Figure 8-4.) | 1 | 2 | µA | |
IIN | Input Current at Vx Pins | (V4–V3) = (V3–V2) = (V2–V1) = (V1–VSS) = 4.0 V at TA = 25°C (See Figure 8-4.) | –0.1 | 0.1 | µA | |
ICELL | Input Current (ALL Vx and VDD Input Pins) | Current Consumption at Power down, (V4–V3) = (V3–V2) = (V2–V1) =
(V1–VSS) = 2.30 V at TA = 25°C |
1.1 | µA | ||
OUTPUT DRIVE OUT, CMOS ACTIVE HIGH VERSIONS ONLY | ||||||
VOUT | Output Drive Voltage, Active High | (V4–V3), (V3–V2), (V2–V1), or (V1–VSS) > VOV, VDD = 14.4 V, IOH = 100 µA | 6 | V | ||
If three of four cells are short circuited, only one cell remains powered and > VOV, VDD = Vx (cell voltage), IOH = 100 µA | VDD – 0.3 | V | ||||
(V4–V3), (V3–V2), (V2–V1), and (V1–VSS) < VOV, VDD = 14.4 V, IOL = 100 µA measured into OUT pin. | 250 | 400 | mV | |||
IOUTH | OUT Source Current (during OV) | (V4–V3), (V3–V2), (V2–V1), or (V1–VSS) > VOV, VDD =
14.4 V, OUT = 0 V, measured out of OUT pin. |
4.5 | mA | ||
IOUTL | OUT Sink Current (no OV) | (V4–V3), (V3–V2), (V2–V1), and (V1–VSS) < VOV, VDD =
14.4 V, OUT = VDD, measured into OUT pin .Pull resistor RPU = 5 kΩ to VDD = 14.4 V |
0.5 | 14 | mA | |
OUTPUT DRIVE OUT, CMOS OPEN DRAIN ACTIVE LOW VERSIONS ONLY | ||||||
VOUT | Output Drive Voltage, Active High | (V4–V3), (V3–V2), (V2–V1), and (V1–VSS) < VOV, VDD = 14.4 V, IOL = 100 µA measured into OUT pin. | 250 | 400 | mV | |
IOUTL | OUT Sink Current (no OV) | (V4–V3), (V3–V2), (V2–V1), and (V1–VSS) < VOV, VDD =
14.4 V, OUT = VDD, measured into OUT pin. Pull resistor RPU = 5 kΩ to VDD = 14.4 V |
0.5 | 14 | mA | |
IOUTLK | OUT pin leakage | (V4–V3), (V3–V2), (V2–V1), and (V1–VSS) < VOV, VDD =
14.4 V, OUT = VDD, measured into OUT pin. |
100 | nA | ||
DELAY TIMER | ||||||
tCD | OV Delay Time | CCD = 0.1 µF (see Section 8.3.1.4) | 1 | 1.5 | 2 | s |
tCD_GND | OV Delay Time with CD pin = 0 V | Delay due to CCD capacitor shorted to ground for Customer Test Mode | 20 | 170 | ms |