SLUSCM6E June   2016  – April 2019 BQ35100

PRODUCTION DATA.  

  1. 1 Features
  2. 2 Applications
  3. 3 Description
    1.     Device Images
      1.      Simplified Schematic
  4. 4 Revision History
  5. 5 Pin Configuration and Functions
    1.     Pin Functions
  6. 6 Specifications
    1. 6.1  Absolute Maximum Ratings
    2. 6.2  ESD Ratings
    3. 6.3  Recommended Operating Conditions
    4. 6.4  Thermal Information
    5. 6.5  Power Supply Current Static Modes
    6. 6.6  Digital Input and Outputs
    7. 6.7  Power-On Reset
    8. 6.8  LDO Regulator
    9. 6.9  Internal Temperature Sensor
    10. 6.10 Internal Clock Oscillators
    11. 6.11 Integrating ADC (Coulomb Counter)
    12. 6.12 ADC (Temperature and Voltage Measurements)
    13. 6.13 Data Flash Memory
    14. 6.14 I2C-Compatible Interface Timing Characteristics
    15. 6.15 Typical Characteristics
  7. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1 Basic Measurement Systems
        1. 7.3.1.1 Voltage
        2. 7.3.1.2 Temperature
        3. 7.3.1.3 Coulombs
        4. 7.3.1.4 Current
      2. 7.3.2 Battery Gauging
        1. 7.3.2.1 ACCUMULATOR (ACC) Mode
        2. 7.3.2.2 STATE-OF-HEALTH (SOH) Mode
          1. 7.3.2.2.1 Low State-of-Health Alert
        3. 7.3.2.3 END-OF-SERVICE (EOS) Mode
          1. 7.3.2.3.1 Initial EOS Learning
            1. 7.3.2.3.1.1 End-Of-Service Detection
      3. 7.3.3 Power Control
      4. 7.3.4 Battery Condition Warnings
        1. 7.3.4.1 Battery Low Warning
        2. 7.3.4.2 Temperature Low Warning
        3. 7.3.4.3 Temperature High Warning
        4. 7.3.4.4 Battery Low SOH Warning
        5. 7.3.4.5 Battery EOS OCV BAD Warning
      5. 7.3.5 ALERT Signal
      6. 7.3.6 Lifetime Data Collection
      7. 7.3.7 SHA-1 Authentication
      8. 7.3.8 Data Commands
        1. 7.3.8.1 Command Summary
        2. 7.3.8.2 0x00, 0x01 AltManufacturerAccess() and 0x3E, 0x3F AltManufacturerAccess()
        3. 7.3.8.3 Control(): 0x00/0x01
      9. 7.3.9 Communications
        1. 7.3.9.1 I2C Interface
    4. 7.4 Device Functional Modes
  8. 8 Application and Implementation
    1. 8.1 Application Information
    2. 8.2 Typical Applications
      1. 8.2.1 Design Requirements
      2. 8.2.2 Detailed Design Procedure
        1. 8.2.2.1 Preparation for Gauging
        2. 8.2.2.2 Gauging Mode Selection
          1. 8.2.2.2.1 ACCUMULATOR Mode
            1. 8.2.2.2.1.1 STATE-OF-HEALTH (Voltage Correlation) Mode
            2. 8.2.2.2.1.2 END-OF-SERVICE (Resistance Correlation) Mode
        3. 8.2.2.3 Voltage Measurement Selection
        4. 8.2.2.4 Temperature Measurement Selection
        5. 8.2.2.5 Current Sense Resistor Selection
        6. 8.2.2.6 Expected Device Usage Profiles
        7. 8.2.2.7 Using the BQ35100 Fuel Gauge with a Battery and Capacitor in Parallel
          1. 8.2.2.7.1 ACCUMULATOR Mode
          2. 8.2.2.7.2 STATE-OF-HEALTH Mode
          3. 8.2.2.7.3 END-OF-SERVICE Mode
      3. 8.2.3 EOS Mode Load Pulse Synchronization
      4. 8.2.4 Benefits of the BQ35100 Gauge Compared to Alternative Monitoring Techniques
      5. 8.2.5 Application Curves
  9. 9 Power Supply Recommendations
  10. 10Layout
    1. 10.1 Layout Guidelines
      1. 10.1.1 Introduction
      2. 10.1.2 Power Supply Decoupling Capacitor
      3. 10.1.3 Capacitors
      4. 10.1.4 Communication Line Protection Components
    2. 10.2 Layout Example
      1. 10.2.1 Ground System
      2. 10.2.2 Kelvin Connections
      3. 10.2.3 Board Offset Considerations
    3. 10.3 ESD Spark Gap
  11. 11Device and Documentation Support
    1. 11.1 Documentation Support
      1. 11.1.1 Related Documentation
    2. 11.2 Receiving Notification of Documentation Updates
    3. 11.3 Community Resources
    4. 11.4 Trademarks
    5. 11.5 Electrostatic Discharge Caution
    6. 11.6 Glossary
  12. 12Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

7.3.4.5 Battery EOS OCV BAD Warning

The device assumes that when GE is asserted the cell is at rest and uses the initialization voltage reading to determine the Open Circuit Voltage (OCV). If the cell were not fully relaxed at that point, then the voltage after the pulse could rise above the OCV. This causes an incorrect impedance to be calculated.