SLUSDT5B September   2019  – October 2023 BQ75614-Q1

PRODUCTION DATA  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Revision History
  6. 5 Description (continued)
  7. 6 Pin Configuration and Functions
  8. 7 Specifications
    1. 7.1 Absolute Maximum Ratings
    2. 7.2 ESD Ratings
    3. 7.3 Recommended Operating Conditions
    4. 7.4 Thermal Information
    5. 7.5 Electrical Characteristics
    6. 7.6 Timing Requirements
    7. 7.7 Typical Characteristics
  9. 8 Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagram
    3. 8.3 Feature Description
      1. 8.3.1 Power Supplies
        1. 8.3.1.1 AVAO_REF and AVDD_REF
        2. 8.3.1.2 LDOIN
        3. 8.3.1.3 AVDD
        4. 8.3.1.4 DVDD
        5. 8.3.1.5 CVDD and NEG5V
        6. 8.3.1.6 TSREF
      2. 8.3.2 Measurement System
        1. 8.3.2.1 Main ADC
          1. 8.3.2.1.1 Cell Voltage Measurements
            1. 8.3.2.1.1.1 Analog Front End
            2. 8.3.2.1.1.2 VC Channel Measurements
            3. 8.3.2.1.1.3 Post-ADC Digital LPF
            4. 8.3.2.1.1.4 SRP and SRN Measurements
          2. 8.3.2.1.2 Temperature Measurements
            1. 8.3.2.1.2.1 DieTemp1 Measurement
            2. 8.3.2.1.2.2 GPIOs and TSREF Measurements
          3. 8.3.2.1.3 Main ADC Operation Control
            1. 8.3.2.1.3.1 Operation Modes and Status
        2. 8.3.2.2 AUX ADC
          1. 8.3.2.2.1 AUX Cell Voltage Measurements
            1. 8.3.2.2.1.1 AUX Analog Front End
            2. 8.3.2.2.1.2 CB and Current Sense Channel Measurements
          2. 8.3.2.2.2 AUX Temperature Measurements
            1. 8.3.2.2.2.1 DieTemp2 Measurement
            2. 8.3.2.2.2.2 AUX GPIO Measurements
          3. 8.3.2.2.3 MISC Measurements
          4. 8.3.2.2.4 AUX ADC Operation Control
        3. 8.3.2.3 Synchronization between MAIN and AUX ADC Measurements
        4. 8.3.2.4 CS ADC
      3. 8.3.3 Cell Balancing
        1. 8.3.3.1 Set Up Cell Balancing
          1. 8.3.3.1.1 Step 1: Determine Balancing Channels
          2. 8.3.3.1.2 Step 2: Select Balancing Control Methods
          3. 8.3.3.1.3 Step 3a: Balancing Thermal Management
          4. 8.3.3.1.4 Step 3b: Option to Stop On Cell Voltage Threshold
          5. 8.3.3.1.5 Step 3c: Option to Stop at Fault
        2. 8.3.3.2 Cell Balancing in SLEEP Mode
        3. 8.3.3.3 Pause and Stop Cell Balancing
          1. 8.3.3.3.1 Cell Balancing Pause
          2. 8.3.3.3.2 Cell Balancing Stop
          3. 8.3.3.3.3 Remaining CB Time
      4. 8.3.4 Integrated Hardware Protectors
        1. 8.3.4.1 OVUV Protectors
          1. 8.3.4.1.1 OVUV Operation Modes
          2. 8.3.4.1.2 OVUV Control and Status
            1. 8.3.4.1.2.1 OVUV Control
            2. 8.3.4.1.2.2 OVUV Status
        2. 8.3.4.2 OTUT Protector
          1. 8.3.4.2.1 OTUT Operation Modes
          2. 8.3.4.2.2 OTUT Control and Status
            1. 8.3.4.2.2.1 OTUT Control
            2. 8.3.4.2.2.2 OTUT Status
      5. 8.3.5 GPIO Configuration
      6. 8.3.6 Communication, OTP, Diagnostic Control
        1. 8.3.6.1 Communication
          1. 8.3.6.1.1 Serial Interface
            1. 8.3.6.1.1.1 UART Physical Layer
              1. 8.3.6.1.1.1.1 UART Transmitter
              2. 8.3.6.1.1.1.2 UART Receiver
              3. 8.3.6.1.1.1.3 COMM CLEAR
            2. 8.3.6.1.1.2 Command and Response Protocol
              1. 8.3.6.1.1.2.1 Transaction Frame Structure
                1. 8.3.6.1.1.2.1.1 Frame Initialization Byte
                2. 8.3.6.1.1.2.1.2 Device Address Byte
                3. 8.3.6.1.1.2.1.3 Register Address Bytes
                4. 8.3.6.1.1.2.1.4 Data Bytes
                5. 8.3.6.1.1.2.1.5 CRC Bytes
                6. 8.3.6.1.1.2.1.6 Calculating Frame CRC Value
                7. 8.3.6.1.1.2.1.7 Verifying Frame CRC
              2. 8.3.6.1.1.2.2 Transaction Frame Examples
                1. 8.3.6.1.1.2.2.1 Single Device Read/Write
          2. 8.3.6.1.2 Communication Timeout
            1. 8.3.6.1.2.1 Short Communication Timeout
            2. 8.3.6.1.2.2 Long Communication Timeout
          3. 8.3.6.1.3 SPI Master
          4. 8.3.6.1.4 SPI Loopback
        2. 8.3.6.2 Fault Handling
          1. 8.3.6.2.1 Fault Status Hierarchy
            1. 8.3.6.2.1.1 Debug Registers
          2. 8.3.6.2.2 Fault Masking and Reset
            1. 8.3.6.2.2.1 Fault Masking
            2. 8.3.6.2.2.2 Fault Reset
          3. 8.3.6.2.3 Fault Signaling
        3. 8.3.6.3 Nonvolatile Memory
          1. 8.3.6.3.1 OTP Page Status
          2. 8.3.6.3.2 OTP Programming
        4. 8.3.6.4 Diagnostic Control/Status
          1. 8.3.6.4.1 Power Supplies Check
            1. 8.3.6.4.1.1 Power Supply Diagnostic Check
            2. 8.3.6.4.1.2 Power Supply BIST
          2. 8.3.6.4.2 Thermal Shutdown and Warning Check
            1. 8.3.6.4.2.1 Thermal Shutdown
            2. 8.3.6.4.2.2 Thermal Warning
          3. 8.3.6.4.3 Oscillators Watchdog
          4. 8.3.6.4.4 OTP Error Check
            1. 8.3.6.4.4.1 OTP CRC Test and Faults
            2. 8.3.6.4.4.2 OTP Margin Read
            3. 8.3.6.4.4.3 Error Check and Correct (ECC) OTP
          5. 8.3.6.4.5 Integrated Hardware Protector Check
            1. 8.3.6.4.5.1 Parity Check
            2. 8.3.6.4.5.2 OVUV and OTUT DAC Check
            3. 8.3.6.4.5.3 OVUV Protector BIST
            4. 8.3.6.4.5.4 OTUT Protector BIST
          6. 8.3.6.4.6 Diagnostic Through ADC Comparison
            1. 8.3.6.4.6.1 Cell Voltage Measurement Check
            2. 8.3.6.4.6.2 Temperature Measurement Check
            3. 8.3.6.4.6.3 Cell Balancing FETs Check
            4. 8.3.6.4.6.4 VC and CB Open Wire Check
    4. 8.4 Device Functional Modes
      1. 8.4.1 Power Modes
        1. 8.4.1.1 SHUTDOWN Mode
          1. 8.4.1.1.1 Exit SHUTDOWN Mode
          2. 8.4.1.1.2 Enter SHUTDOWN Mode
        2. 8.4.1.2 SLEEP Mode
          1. 8.4.1.2.1 Exit SLEEP Mode
          2. 8.4.1.2.2 Enter SLEEP Mode
        3. 8.4.1.3 ACTIVE Mode
          1. 8.4.1.3.1 Exit ACTIVE Mode
          2. 8.4.1.3.2 Enter ACTIVE Mode From SHUTDOWN Mode
          3. 8.4.1.3.3 Enter ACTIVE Mode From SLEEP Mode
      2. 8.4.2 Device Reset
      3. 8.4.3 Ping
        1. 8.4.3.1 Ping
    5. 8.5 Register Maps
      1. 8.5.1 OTP Shadow Register Summary
      2. 8.5.2 Read/Write Register Summary
      3. 8.5.3 Read-Only Register Summary
      4. 8.5.4 Register Field Descriptions
        1. 8.5.4.1  Device Addressing Setup
          1. 8.5.4.1.1 DIR0_ADDR_OTP
          2. 8.5.4.1.2 DIR1_ADDR_OTP
          3. 8.5.4.1.3 CUST_MISC1 through CUST_MISC8
          4. 8.5.4.1.4 DIR0_ADDR
          5. 8.5.4.1.5 DIR1_ADDR
        2. 8.5.4.2  Device ID and Scratch Pad
          1. 8.5.4.2.1 PARTID
          2. 8.5.4.2.2 DEV_REVID
          3. 8.5.4.2.3 DIE_ID1 through DIE_ID9
        3. 8.5.4.3  General Configuration and Control
          1. 8.5.4.3.1  DEV_CONF
          2. 8.5.4.3.2  ACTIVE_CELL
          3. 8.5.4.3.3  PWR_TRANSIT_CONF
          4. 8.5.4.3.4  COMM_TIMEOUT_CONF
          5. 8.5.4.3.5  TX_HOLD_OFF
          6. 8.5.4.3.6  COMM_CTRL
          7. 8.5.4.3.7  CONTROL1
          8. 8.5.4.3.8  CONTROL2
          9. 8.5.4.3.9  CUST_CRC_HI
          10. 8.5.4.3.10 CUST_CRC_LO
          11. 8.5.4.3.11 CUST_CRC_RSLT_HI
          12. 8.5.4.3.12 CUST_CRC_RSLT_LO
        4. 8.5.4.4  Operation Status
          1. 8.5.4.4.1 DIAG_STAT
          2. 8.5.4.4.2 ADC_STAT1
          3. 8.5.4.4.3 ADC_STAT2
          4. 8.5.4.4.4 GPIO_STAT
          5. 8.5.4.4.5 BAL_STAT
          6. 8.5.4.4.6 DEV_STAT
        5. 8.5.4.5  ADC Configuration and Control
          1. 8.5.4.5.1  ADC_CONF1
          2. 8.5.4.5.2  ADC_CONF2
          3. 8.5.4.5.3  MAIN_ADC_CAL1
          4. 8.5.4.5.4  MAIN_ADC_CAL2
          5. 8.5.4.5.5  AUX_ADC_CAL1
          6. 8.5.4.5.6  AUX_ADC_CAL2
          7. 8.5.4.5.7  CS_ADC_CAL1
          8. 8.5.4.5.8  CS_ADC_CAL2
          9. 8.5.4.5.9  ADC_CTRL1
          10. 8.5.4.5.10 ADC_CTRL2
          11. 8.5.4.5.11 ADC_CTRL3
        6. 8.5.4.6  ADC Measurement Results
          1. 8.5.4.6.1  VCELL16_HI/LO
          2. 8.5.4.6.2  VCELL15_HI/LO
          3. 8.5.4.6.3  VCELL14_HI/LO
          4. 8.5.4.6.4  VCELL13_HI/LO
          5. 8.5.4.6.5  VCELL12_HI/LO
          6. 8.5.4.6.6  VCELL11_HI/LO
          7. 8.5.4.6.7  VCELL10_HI/LO
          8. 8.5.4.6.8  VCELL9_HI/LO
          9. 8.5.4.6.9  VCELL8_HI/LO
          10. 8.5.4.6.10 VCELL7_HI/LO
          11. 8.5.4.6.11 VCELL6_HI/LO
          12. 8.5.4.6.12 VCELL5_HI/LO
          13. 8.5.4.6.13 VCELL4_HI/LO
          14. 8.5.4.6.14 VCELL3_HI/LO
          15. 8.5.4.6.15 VCELL2_HI/LO
          16. 8.5.4.6.16 VCELL1_HI/LO
          17. 8.5.4.6.17 MAIN_CURRENT_HI/LO
          18. 8.5.4.6.18 CURRENT_HI/MID/LO
          19. 8.5.4.6.19 TSREF_HI/LO
          20. 8.5.4.6.20 GPIO1_HI/LO
          21. 8.5.4.6.21 GPIO2_HI/LO
          22. 8.5.4.6.22 GPIO3_HI/LO
          23. 8.5.4.6.23 GPIO4_HI/LO
          24. 8.5.4.6.24 GPIO5_HI/LO
          25. 8.5.4.6.25 GPIO6_HI/LO
          26. 8.5.4.6.26 GPIO7_HI/LO
          27. 8.5.4.6.27 GPIO8_HI/LO
          28. 8.5.4.6.28 DIETEMP1_HI/LO
          29. 8.5.4.6.29 DIETEMP2_HI/LO
          30. 8.5.4.6.30 AUX_CELL_HI/LO
          31. 8.5.4.6.31 AUX_GPIO_HI/LO
          32. 8.5.4.6.32 AUX_BAT_HI/LO
          33. 8.5.4.6.33 AUX_REFL_HI/LO
          34. 8.5.4.6.34 AUX_VBG2_HI/LO
          35. 8.5.4.6.35 AUX_AVAO_REF_HI/LO
          36. 8.5.4.6.36 AUX_AVDD_REF_HI/LO
          37. 8.5.4.6.37 AUX_OV_DAC_HI/LO
          38. 8.5.4.6.38 AUX_UV_DAC_HI/LO
          39. 8.5.4.6.39 AUX_OT_OTCB_DAC_HI/LO
          40. 8.5.4.6.40 AUX_UT_DAC_HI/LO
          41. 8.5.4.6.41 AUX_VCBDONE_DAC_HI/LO
          42. 8.5.4.6.42 AUX_VCM_HI/LO
          43. 8.5.4.6.43 REFOVDAC_HI/LO
          44. 8.5.4.6.44 DIAG_MAIN_HI/LO
          45. 8.5.4.6.45 DIAG_AUX_HI/LO
        7. 8.5.4.7  Balancing Configuration, Control and Status
          1. 8.5.4.7.1 CB_CELL16_CTRL through CB_CELL1_CTRL
          2. 8.5.4.7.2 VCB_DONE_THRESH
          3. 8.5.4.7.3 OTCB_THRESH
          4. 8.5.4.7.4 BAL_CTRL1
          5. 8.5.4.7.5 BAL_CTRL2
          6. 8.5.4.7.6 BAL_CTRL3
          7. 8.5.4.7.7 CB_COMPLETE1
          8. 8.5.4.7.8 CB_COMPLETE2
          9. 8.5.4.7.9 BAL_TIME
        8. 8.5.4.8  Protector Configuration and Control
          1. 8.5.4.8.1 OV_THRESH
          2. 8.5.4.8.2 UV_THRESH
          3. 8.5.4.8.3 UV_DISABLE1
          4. 8.5.4.8.4 UV_DISABLE2
          5. 8.5.4.8.5 OTUT_THRESH
          6. 8.5.4.8.6 OVUV_CTRL
          7. 8.5.4.8.7 OTUT_CTRL
        9. 8.5.4.9  GPIO Configuration
          1. 8.5.4.9.1 GPIO_CONF1
          2. 8.5.4.9.2 GPIO_CONF2
          3. 8.5.4.9.3 GPIO_CONF3
          4. 8.5.4.9.4 GPIO_CONF4
        10. 8.5.4.10 SPI Master
          1. 8.5.4.10.1 SPI_CONF
          2. 8.5.4.10.2 SPI_EXE
          3. 8.5.4.10.3 SPI_TX3, SPI_TX2, and SPI_TX1
          4. 8.5.4.10.4 SPI_RX3, SPI_RX2, and SPI_RX1
        11. 8.5.4.11 Diagnostic Control
          1. 8.5.4.11.1  DIAG_OTP_CTRL
          2. 8.5.4.11.2  DIAG_COMM_CTRL
          3. 8.5.4.11.3  DIAG_PWR_CTRL
          4. 8.5.4.11.4  DIAG_CBFET_CTRL1
          5. 8.5.4.11.5  DIAG_CBFET_CTRL2
          6. 8.5.4.11.6  DIAG_COMP_CTRL1
          7. 8.5.4.11.7  DIAG_COMP_CTRL2
          8. 8.5.4.11.8  DIAG_COMP_CTRL3
          9. 8.5.4.11.9  DIAG_COMP_CTRL4
          10. 8.5.4.11.10 DIAG_PROT_CTRL
        12. 8.5.4.12 Fault Configuration and Reset
          1. 8.5.4.12.1 FAULT_MSK1
          2. 8.5.4.12.2 FAULT_MSK2
          3. 8.5.4.12.3 FAULT_RST1
          4. 8.5.4.12.4 FAULT_RST2
        13. 8.5.4.13 Fault Status
          1. 8.5.4.13.1  FAULT_SUMMARY
          2. 8.5.4.13.2  FAULT_COMM1
          3. 8.5.4.13.3  FAULT_OTP
          4. 8.5.4.13.4  FAULT_SYS
          5. 8.5.4.13.5  FAULT_PROT1
          6. 8.5.4.13.6  FAULT_PROT2
          7. 8.5.4.13.7  FAULT_OV1
          8. 8.5.4.13.8  FAULT_OV2
          9. 8.5.4.13.9  FAULT_UV1
          10. 8.5.4.13.10 FAULT_UV2
          11. 8.5.4.13.11 FAULT_OT
          12. 8.5.4.13.12 FAULT_UT
          13. 8.5.4.13.13 FAULT_COMP_GPIO
          14. 8.5.4.13.14 FAULT_COMP_VCCB1
          15. 8.5.4.13.15 FAULT_COMP_VCCB2
          16. 8.5.4.13.16 FAULT_COMP_VCOW1
          17. 8.5.4.13.17 FAULT_COMP_VCOW2
          18. 8.5.4.13.18 FAULT_COMP_CBOW1
          19. 8.5.4.13.19 FAULT_COMP_CBOW2
          20. 8.5.4.13.20 FAULT_COMP_CBFET1
          21. 8.5.4.13.21 FAULT_COMP_CBFET2
          22. 8.5.4.13.22 FAULT_COMP_MISC
          23. 8.5.4.13.23 FAULT_PWR1
          24. 8.5.4.13.24 FAULT_PWR2
          25. 8.5.4.13.25 FAULT_PWR3
        14. 8.5.4.14 Debug Control and Status
          1. 8.5.4.14.1 DEBUG_UART_RC
          2. 8.5.4.14.2 DEBUG_UART_RR_TR
          3. 8.5.4.14.3 DEBUG_UART_DISCARD
          4. 8.5.4.14.4 DEBUG_UART_VALID_HI/LO
          5. 8.5.4.14.5 DEBUG_OTP_SEC_BLK
          6. 8.5.4.14.6 DEBUG_OTP_DED_BLK
        15. 8.5.4.15 OTP Programming Control and Status
          1. 8.5.4.15.1 OTP_PROG_UNLOCK1A through OTP_PROG_UNLOCK1D
          2. 8.5.4.15.2 OTP_PROG_UNLOCK2A through OTP_PROG_UNLOCK2D
          3. 8.5.4.15.3 OTP_PROG_CTRL
          4. 8.5.4.15.4 OTP_ECC_TEST
          5. 8.5.4.15.5 OTP_ECC_DATAIN1 through OTP_ECC_DATAIN9
          6. 8.5.4.15.6 OTP_ECC_DATAOUT1 through OTP_ECC_DATAOUT9
          7. 8.5.4.15.7 OTP_PROG_STAT
          8. 8.5.4.15.8 OTP_CUST1_STAT
          9. 8.5.4.15.9 OTP_CUST2_STAT
  10. 9 Application and Implementation
    1. 9.1 Application Information
    2. 9.2 Typical Applications
      1. 9.2.1 Application Circuit
        1. 9.2.1.1 Design Requirements
        2. 9.2.1.2 Detailed Design Procedure
          1. 9.2.1.2.1 Cell Sensing and Balancing Inputs
          2. 9.2.1.2.2 Synchronize Voltage and Current Measurements
          3. 9.2.1.2.3 BAT and External NPN
          4. 9.2.1.2.4 Power Supplies, Reference Input
          5. 9.2.1.2.5 GPIO For Thermistor Inputs
          6. 9.2.1.2.6 Internal Balancing Current
          7. 9.2.1.2.7 UART, NFAULT
          8. 9.2.1.2.8 Current Sense Input
        3. 9.2.1.3 Application Curve
  11. 10Power Supply Recommendations
  12. 11Layout
    1. 11.1 Layout Guidelines
      1. 11.1.1 Ground Planes
      2. 11.1.2 Bypass Capacitors for Power Supplies and Reference
      3. 11.1.3 Cell Voltage Sensing
    2. 11.2 Layout Example
  13. 12Device and Documentation Support
    1. 12.1 Device Support
      1. 12.1.1 Third-Party Products Disclaimer
    2. 12.2 Receiving Notification of Documentation Updates
    3. 12.3 Support Resources
    4. 12.4 Trademarks
    5. 12.5 Electrostatic Discharge Caution
    6. 12.6 Glossary
  14. 13Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information
8.3.6.4.1.2 Power Supply BIST

The device implements a power supply BIST (Built-In Self-Test) function to test the primary power supply failure diagnostic paths that cover the following detections:

  • FAULT_PWR1[AVDD_OV], [AVDD_OSC], [DVDD_OV], [CVDD_OV], [CVDD_UV], [REFHM_OPEN], [DVSS_OPEN], and [CVSS_OPEN]
  • FAULT_PWR2[TSREF_OV], [TSREF_UV], [TSREF_OSC], [NEG5V_UV], [REFHM_OSC],and [PWRBIST_FAIL]

The power supply BIST is essentially a check on the checker and it is a command base function initiated by host.

The power supply BIST, once started, will force a fault on failure detection path on each supply. Take AVDD OV diagnostic path as an example, when the BIST engine tests the AVDD OV path, the following occur:

  1. The BIST engine forces a fail to the AVDD OV comparator
  2. The BIST engine then checks to ensure the signal to trigger FAULT register is asserted, and the signal to trigger NFAULT is also asserted
  3. The BIST engine resets the FAULT register and NFAULT signal (that is, clears the FAULT_PWR1/2/3 registers and deasserts NFAULT)
  4. The BIST engine repeats step 1 to step 3 on the next power supply diagnostic path check (for example, AVDD OSC) until all intended diagnostic paths covered by BIST are tested.

Note:
  • During the BIST run, the NFAULT pin will be toggled on and off. Host ignores the NFAULT pin status or can disable the NFAULT pin output by setting DEV_CONF[NFAULT_EN] = 0.
  • Among all internal power supplies, TSREF is one that can be enabled or disabled by host. To ensure TSREF diagnostic paths are tested during BIST run, host enables TSREF before starting the power supply BIST. Otherwise, the BIST engine will ignore the TSREF diagnostic paths test result during the BIST run.
  • Because other nonpower supply-related faults can also trigger NFAULT, it is recommended to mask all nonpower supply-related faults through FAULT_MSK1/2 registers before the power supply BIST run.
  • Host also ensures there are no power supply faults before starting the power supply BIST run.

Start power supply BIST by sending DIAG_PWR_CTRL[PWR_BIST_GO] = 1. The BIST run will not abort even if a failure is detected during the run. At the end of the BIST run, the result is indicated by the FAULT_PWR2[PWRBIST_FAIL] flag.

The power supply BIST forces a failure and ensures the diagnostic path triggers the fault accordingly. A failure on the BIST run indicates a diagnostic path is unable to trigger in a fault condition. To further examine which path is unable to indicate a failure, host can set the DIAG_PWR_CTRL[BIST_NO_RST] = 1. This bit disables the reset step during the BIST run. Re-start power supply BIST with this option enabled. At the end of the BIST run, examine the FAULT_PWR1 and FAULT_PWR2 registers. Any register flag that remains 0 indicates it is unable to flag a failure.

GUID-01D3F6E2-3F37-488C-8CCC-F7F331071D65-low.gif Figure 8-30 Power Supply BIST