SWRS046I November   2006  – September 2018 CC1020

PRODUCTION DATA.  

  1. 1Device Overview
    1. 1.1 Features
    2. 1.2 Applications
    3. 1.3 Description
    4. 1.4 Functional Block Diagram
  2. 2Revision History
  3. 3Terminal Configuration and Functions
    1. 3.1 Pin Diagram
    2. 3.2 Pin Configuration
  4. 4Specifications
    1. 4.1  Absolute Maximum Ratings
    2. 4.2  ESD Ratings
    3. 4.3  Recommended Operating Conditions
    4. 4.4  RF Transmit
    5. 4.5  RF Receive
    6. 4.6  RSSI / Carrier Sense
    7. 4.7  Intermediate Frequency (IF)
    8. 4.8  Crystal Oscillator
    9. 4.9  Frequency Synthesizer
    10. 4.10 Digital Inputs and Outputs
    11. 4.11 Current Consumption
    12. 4.12 Thermal Resistance Characteristics for VQFNP Package
  5. 5Detailed Description
    1. 5.1  Overview
    2. 5.2  Functional Block Diagram
    3. 5.3  Configuration Overview
      1. 5.3.1 Configuration Software
    4. 5.4  Microcontroller Interface
      1. 5.4.1 Configuration Interface
      2. 5.4.2 Signal Interface
      3. 5.4.3 PLL Lock Signal
    5. 5.5  4-wire Serial Configuration Interface
    6. 5.6  Signal Interface
      1. 5.6.1 Synchronous NRZ Mode
      2. 5.6.2 Transparent Asynchronous UART Mode
      3. 5.6.3 Synchronous Manchester Encoded Mode
        1. 5.6.3.1 Manchester Encoding and Decoding
    7. 5.7  Data Rate Programming
    8. 5.8  Frequency Programming
      1. 5.8.1 Dithering
    9. 5.9  Receiver
      1. 5.9.1  IF Frequency
      2. 5.9.2  Receiver Channel Filter Bandwidth
      3. 5.9.3  Demodulator, Bit Synchronizer, and Data Decision
      4. 5.9.4  Receiver Sensitivity Versus Data Rate and Frequency Separation
      5. 5.9.5  RSSI
      6. 5.9.6  Image Rejection Calibration
      7. 5.9.7  Blocking and Selectivity
      8. 5.9.8  Linear IF Chain and AGC Settings
      9. 5.9.9  AGC Settling
      10. 5.9.10 Preamble Length and Sync Word
      11. 5.9.11 Carrier Sense
      12. 5.9.12 Automatic Power-up Sequencing
      13. 5.9.13 Automatic Frequency Control
      14. 5.9.14 Digital FM
    10. 5.10 Transmitter
      1. 5.10.1 FSK Modulation Formats
      2. 5.10.2 Output Power Programming
      3. 5.10.3 TX Data Latency
      4. 5.10.4 Reducing Spurious Emission and Modulation Bandwidth
    11. 5.11 Input and Output Matching and Filtering
    12. 5.12 Frequency Synthesizer
      1. 5.12.1 VCO, Charge Pump and PLL Loop Filter
      2. 5.12.2 VCO and PLL Self-Calibration
      3. 5.12.3 PLL Turn-on Time Versus Loop Filter Bandwidth
      4. 5.12.4 PLL Lock Time Versus Loop Filter Bandwidth
    13. 5.13 VCO and LNA Current Control
    14. 5.14 Power Management
    15. 5.15 On-Off Keying (OOK)
    16. 5.16 Crystal Oscillator
    17. 5.17 Built-in Test Pattern Generator
    18. 5.18 Interrupt on Pin DCLK
      1. 5.18.1 Interrupt Upon PLL Lock
      2. 5.18.2 Interrupt Upon Received Signal Carrier Sense
    19. 5.19 PA_EN and LNA_EN Digital Output Pins
      1. 5.19.1 Interfacing an External LNA or PA
      2. 5.19.2 General Purpose Output Control Pins
      3. 5.19.3 PA_EN and LNA_EN Pin Drive
    20. 5.20 System Considerations and Guidelines
      1. 5.20.1 SRD Regulations
      2. 5.20.2 Narrowband Systems
      3. 5.20.3 Low Cost Systems
      4. 5.20.4 Battery Operated Systems
      5. 5.20.5 High Reliability Systems
      6. 5.20.6 Frequency Hopping Spread Spectrum Systems (FHSS)
    21. 5.21 Antenna Considerations
    22. 5.22 Configuration Registers
      1. 5.22.1 Memory
  6. 6Applications, Implementation, and Layout
    1. 6.1 Application Information
      1. 6.1.1 Typical Application
    2. 6.2 Design Requirements
      1. 6.2.1 Input and Output Matching
      2. 6.2.2 Bias Resistor
      3. 6.2.3 PLL Loop Filter
      4. 6.2.4 Crystal
      5. 6.2.5 Additional Filtering
      6. 6.2.6 Power Supply Decoupling and Filtering
    3. 6.3 PCB Layout Recommendations
  7. 7Device and Documentation Support
    1. 7.1 Device Support
      1. 7.1.1 Device Nomenclature
    2. 7.2 Documentation Support
      1. 7.2.1 Community Resources
    3. 7.3 Trademarks
    4. 7.4 Electrostatic Discharge Caution
    5. 7.5 Export Control Notice
    6. 7.6 Glossary
  8. 8Mechanical Packaging and Orderable Information
    1. 8.1 Packaging Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

5.12.2 VCO and PLL Self-Calibration

To compensate for supply voltage, temperature and process variations, the VCO and PLL must be calibrated. The calibration is performed automatically and sets the maximum VCO tuning range and optimum charge pump current for PLL stability. After setting up the device at the operating frequency, the self-calibration can be initiated by setting the CAL_START bit in the CALIBRATE register. The calibration result is stored internally in the chip, and is valid as long as power is not turned off. If large supply voltage drops (typically more than 0.25 V) or temperature variations (typically more than 40°C) occur after calibration, a new calibration should be performed.

The nominal VCO control voltage is set by the CAL_ITERATE[2:0] bits in the CALIBRATE register.

The CAL_COMPLETE bit in the STATUS register indicates that calibration has finished. The calibration wait time (CAL_WAIT) is programmable and is inverse proportional to the internal PLL reference frequency. The highest possible reference frequency should be used to get the minimum calibration time. It is recommended to use CAL_WAIT[1:0] = 11 in order to get the most accurate loop bandwidth.

Table 5-11 Typical Calibration Times

CALIBRATION TIME [ms] REFERENCE FREQUENCY [MHz]
CAL_WAIT 1.8432 7.3728 9.8304
00 49 ms 12 ms 10 ms
01 60 ms 15 ms 11 ms
10 71 ms 18 ms 13 ms
11 109 ms 27 ms 20 ms

The CAL_COMPLETE bit can also be monitored at the LOCK pin, configured by LOCK_SELECT[3:0] = 0101, and used as an interrupt input to the microcontroller.

To check that the PLL is in lock the user should monitor the LOCK_CONTINUOUS bit in the STATUS register. The LOCK_CONTINUOUS bit can also be monitored at the LOCK pin, configured by LOCK_SELECT[3:0] = 0010.

There are separate calibration values for the two frequency registers. However, dual calibration is possible if all of the below conditions apply:

  • The two frequencies A and B differ by less than 1 MHz.
  • Reference frequencies are equal (REF_DIV_A[2:0] = REF_DIV_B[2:0] in the CLOCK_A/CLOCK_B registers).
  • VCO currents are equal (VCO_CURRENT_A[3:0] = VCO_CURRENT_B[3:0] in the VCO register).

The CAL_DUAL bit in the CALIBRATE register controls dual or separate calibration.

The single calibration algorithm (CAL_DUAL=0) using separate calibration for RX and TX frequency is illustrated in Figure 5-26. The same algorithm is applicable for dual calibration if CAL_DUAL=1. Refer to Application Note AN023 CC1020 MCU Interfacing (SWRA069), which includes example source code for single calibration.

TI recommends that single calibration be used for more robust operation.

There is a small, but finite, possibility that the PLL self-calibration will fail. The calibration routine in the source code should include a loop so that the PLL is re-calibrated until PLL lock is achieved if the PLL does not lock the first time. Refer to CC1020 Errata Note 004, available in the CC1020 product folder.

CC1020 sngl_calib_algor_rx_tx_swrs046.gifFigure 5-26 Single Calibration Algorithm for RX and TX