SWRS206E March 2017 – May 2021 CC3220MOD , CC3220MODA
PRODUCTION DATA
Refer to the PDF data sheet for device specific package drawings
The Joint Test Action Group (JTAG) port is an IEEE standard that defines a test access port (TAP) and boundary scan architecture for digital integrated circuits and provides a standardized serial interface to control the associated test logic. For detailed information on the operation of the JTAG port and TAP controller, see the IEEE Standard 1149.1,Test Access Port and Boundary-Scan Architecture.
Figure 8-14 shows the JTAG timing diagram.
Table 8-12 lists the JTAG timing parameters.
ITEM | NAME | DESCRIPTION | MIN | MAX | UNIT |
---|---|---|---|---|---|
T1 | fTCK | Clock frequency | 15 | MHz | |
T2 | tTCK | Clock period | 1 / fTCK | ns | |
T3 | tCL | Clock low period | tTCK / 2 | ns | |
T4 | tCH | Clock high period | tTCK / 2 | ns | |
T7 | tTMS_SU | TMS setup time | 1 | ns | |
T8 | tTMS_HO | TMS hold time | 16 | ns | |
T9 | tTDI_SU | TDI setup time | 1 | ns | |
T10 | tTDI_HO | TDI hold time | 16 | ns | |
T11 | tTDO_HO | TDO hold time | 15 | ns |