SLAS555B June 2012 – September 2018 CC430F5123 , CC430F5125 , CC430F5143 , CC430F5145 , CC430F5147 , CC430F6147
PRODUCTION DATA.
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT |
---|---|---|---|---|---|
Programmed frequency resolution(1) | 26- to 27-MHz crystal | 397 | fXOSC / 216 | 412 | Hz |
Synthesizer frequency tolerance(2) | ±40 | ppm | |||
RF carrier phase noise | 50-kHz offset from carrier | –95 | dBc/Hz | ||
100-kHz offset from carrier | –94 | ||||
200-kHz offset from carrier | –94 | ||||
500-kHz offset from carrier | –98 | ||||
1-MHz offset from carrier | –107 | ||||
2-MHz offset from carrier | –112 | ||||
5-MHz offset from carrier | –118 | ||||
10-MHz offset from carrier | –129 | ||||
PLL turnon and hop time(3) | Crystal oscillator running | 85.1 | 88.4 | µs | |
PLL RX to TX settling time(4) | 9.3 | 9.6 | µs | ||
PLL TX to RX settling time(5) | 20.7 | 21.5 | µs | ||
PLL calibration time(6) | 694 | 721 | µs |