SCHS354D August   1998  – March 2025 CD4051B-Q1

PRODUCTION DATA  

  1.   1
  2. Features
  3. Applications
  4. Description
  5. Pin Configuration and Functions
  6. Specifications
    1. 5.1 Absolute Maximum Ratings
    2. 5.2 ESD Ratings
    3. 5.3 Recommended Operating Conditions
    4. 5.4 Thermal Information
    5. 5.5 Electrical Characteristics - CD4051B-Q1
    6. 5.6 AC Performance Characteristics - CD4051B-Q1
    7. 5.7 Typical Characteristics
  7. Parameter Measurement Information
  8. Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagrams
    3. 7.3 Feature Description
    4. 7.4 Device Functional Modes
  9. Application and Implementation
    1. 8.1 Application Information
    2. 8.2 Typical Application
      1. 8.2.1 Design Requirements
      2. 8.2.2 Detailed Design Procedure
      3. 8.2.3 Application Curve
    3. 8.3 Power Supply Recommendations
    4. 8.4 Layout
      1. 8.4.1 Layout Guidelines
      2. 8.4.2 Layout Example
  10. Device and Documentation Support
    1. 9.1 Documentation Support
      1. 9.1.1 Related Documentation
    2. 9.2 Receiving Notification of Documentation Updates
    3. 9.3 Support Resources
    4. 9.4 Trademarks
    5. 9.5 Electrostatic Discharge Caution
    6. 9.6 Glossary
  11. 10Revision History
  12. 11Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

Parameter Measurement Information

CD4051B-Q1 Typical Bias VoltagesFigure 6-1 Typical Bias Voltages
Note:

The ADDRESS (digital-control inputs) and INHIBIT logic levels are: 0 = VSS
and 1 = VDD. The analog signal (through the TG) may swing from VEE to VDD.

CD4051B-Q1 Waveforms, Channel Being Turned ON (RL = 1 kΩ)Figure 6-2 Waveforms, Channel Being Turned ON (RL = 1 kΩ)
CD4051B-Q1 Waveforms, Channel Being Turned OFF (RL = 1 kΩ)Figure 6-3 Waveforms, Channel Being Turned OFF (RL = 1 kΩ)
CD4051B-Q1 OFF Channel Leakage Current – Any Channel OFFFigure 6-4 OFF Channel Leakage Current – Any Channel OFF
CD4051B-Q1 On Channel Leakage Current – Any Channel OnFigure 6-5 On Channel Leakage Current – Any Channel On
CD4051B-Q1 OFF Channel Leakage Current – All Channels OFFFigure 6-6 OFF Channel Leakage Current – All Channels OFF
CD4051B-Q1 Propagation Delay – Address Input to Signal OutputFigure 6-7 Propagation Delay – Address Input to Signal Output
CD4051B-Q1 Propagation Delay – Inhibit Input to Signal OutputFigure 6-8 Propagation Delay – Inhibit Input to Signal Output
CD4051B-Q1 Input Voltage Test Circuits (Noise Immunity)Figure 6-9 Input Voltage Test Circuits (Noise Immunity)
CD4051B-Q1 Quiescent Device CurrentFigure 6-10 Quiescent Device Current
CD4051B-Q1 Channel ON Resistance Measurement CircuitFigure 6-11 Channel ON Resistance Measurement Circuit
CD4051B-Q1 Input CurrentFigure 6-12 Input Current
CD4051B-Q1 Feed-Through (All Types)Figure 6-13 Feed-Through (All Types)
CD4051B-Q1 Crosstalk Between Any Two Channels (All Types)Figure 6-14 Crosstalk Between Any Two Channels (All Types)
CD4051B-Q1 Crosstalk Between Duals or Triplets ()Figure 6-15 Crosstalk Between Duals or Triplets ()
CD4051B-Q1 24-to-1 MUX AddressingFigure 6-16 24-to-1 MUX Addressing