SNAS734F July 2017 – January 2024 CDCI6214
PRODUCTION DATA
Refer to the PDF data sheet for device specific package drawings
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|---|
VIH | Input high voltage | 0.8 × VDDREF | V | |||
VIL | Input low voltage | 0.2 × VDDREF | V | |||
IIH | Input high level current | VIH = VDDREF | –0.02 | μA | ||
IIH | Input high level current | VIH = VDDREF, Pin 12, 19 | 0.004 | μA | ||
IIL | Input low level current | VIL = GND | –50 | μA | ||
IIL | Input low level current | VIL = GND, Pin 12, 19 | –0.004 | μA | ||
dVIN/dT | Input slew rate | 20% – 80% | 0.5 | V/ns | ||
CIN_GPIO | Input Capacitance | 10 | pF | |||
VOH | Output high voltage | only capacitive load | 0.8 × VDDREF | V | ||
VOL | Output low voltage | only capacitive load | 0.2 × VDDREF | V | ||
dVOUT/dT | Output slew rate | 20% - 80%, at 10pF | 0.3 | V/ns | ||
RPU | Pullup resistance | Pin 11, 20 | 77 | kΩ |