Refer to the PDF data sheet for device specific package drawings
This 40-V, 1.8-mΩ, 5 mm × 6 mm NexFET™ power MOSFET is designed to minimize losses in power conversion applications.
TA = 25°C | TYPICAL VALUE | UNIT | ||
---|---|---|---|---|
VDS | Drain to source voltage | 40 | V | |
Qg | Gate charge total (4.5 V) | 25 | nC | |
Qgd | Gate charge gate to drain | 8.4 | nC | |
RDS(on) | Drain to source on resistance | VGS = 4.5 V | 2.5 | mΩ |
VGS = 10 V | 1.8 | mΩ | ||
VGS(th) | Threshold voltage | 1.8 | V |
DEVICE | QTY | MEDIA | PACKAGE | SHIP |
---|---|---|---|---|
CSD18502Q5B | 2500 | 13-Inch Reel | SON 5 mm × 6 mm Plastic Package | Tape and Reel |
CSD18502Q5BT | 250 | 7-Inch Reel |
TA = 25°C | VALUE | UNIT | |
---|---|---|---|
VDS | Drain to source voltage | 40 | V |
VGS | Gate to source voltage | ±20 | V |
ID | Continuous drain current (package limited) | 100 | A |
Continuous drain current (silicon limited), TC = 25°C | 204 | ||
Continuous drain current(1) | 26 | ||
IDM | Pulsed drain current(2) | 400 | A |
PD | Power dissipation(1) | 3.2 | W |
Power dissipation, TC = 25°C | 156 | ||
TJ | Operating junction temperature | –55 to 150 | °C |
Tstg | Storage temperature | –55 to 150 | °C |
EAS | Avalanche energy, single pulse ID = 88 A, L = 0.1 mH, RG = 25 Ω |
387 | mJ |
RDS(on) vs VGS![]() |
Gate Charge![]() |
Changes from A Revision (May 2015) to B Revision
Changes from * Revision (November 2012) to A Revision
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | ||
---|---|---|---|---|---|---|---|
STATIC CHARACTERISTICS | |||||||
BVDSS | Drain to source voltage | VGS = 0 V, ID = 250 μA | 40 | V | |||
IDSS | Drain to source leakage current | VGS = 0 V, VDS = 32 V | 1 | μA | |||
IGSS | Gate to source leakage current | VDS = 0 V, VGS = 20 V | 100 | nA | |||
VGS(th) | Gate to source threshold voltage | VDS = VGS, ID = 250 μA | 1.5 | 1.8 | 2.2 | V | |
RDS(on) | Drain to source on resistance | VGS = 4.5 V, ID = 30 A | 2.5 | 3.3 | mΩ | ||
VGS = 10 V, ID = 30 A | 1.8 | 2.3 | mΩ | ||||
gfs | Transconductance | VDS = 20 V, ID = 30 A | 143 | S | |||
DYNAMIC CHARACTERISTICS | |||||||
Ciss | Input capacitance | VGS = 0 V, VDS = 20 V, ƒ= 1 MHz | 3900 | 5070 | pF | ||
Coss | Output capacitance | 900 | 1170 | pF | |||
Crss | Reverse transfer capacitance | 21 | 27 | pF | |||
RG | Series gate resistance | 1.2 | 2.4 | Ω | |||
Qg | Gate charge total (4.5 V) | VDS = 20 V, ID = 30 A | 25 | 33 | nC | ||
Qg | Gate charge total (10 V) | 52 | 68 | nC | |||
Qgd | Gate charge gate to drain | 8.4 | nC | ||||
Qgs | Gate charge gate to source | 10.3 | nC | ||||
Qg(th) | Gate charge at Vth | 6.9 | nC | ||||
Qoss | Output charge | VDS = 20 V, VGS = 0 V | 59 | nC | |||
td(on) | Turn on delay time | VDS = 20 V, VGS = 10 V, IDS = 30 A, RG = 0 Ω |
5.3 | ns | |||
tr | Rise time | 6.8 | ns | ||||
td(off) | Turn off delay time | 23 | ns | ||||
tf | Fall time | 4 | ns | ||||
DIODE CHARACTERISTICS | |||||||
VSD | Diode forward voltage | ISD = 30 A, VGS = 0 V | 0.8 | 1 | V | ||
Qrr | Reverse recovery charge | VDS= 20 V, IF = 30 A, di/dt = 300 A/μs |
88 | nC | |||
trr | Reverse recovery time | 44 | ns |
THERMAL METRIC | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|
RθJC | Junction-to-case (top of package) thermal resistance(1) | 0.8 | °C/W | ||
RθJA | Junction-to-ambient thermal resistance(1)(2) | 50 | °C/W |
![]() |
Max RθJA = 50°C/W when mounted on 1 inch2 (6.45 cm2) of 2 oz. (0.071 mm thick) Cu. |
![]() |
Max RθJA = 125°C/W when mounted on a minimum pad area of 2 oz. (0.071 mm thick) Cu. |
ID = 30 A | VDS = 20 V |
ID = 250 µA |
ID = 30 A |
VDS = 5 V |
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These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam during storage or handling to prevent electrostatic damage to the MOS gates.
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