SLPS582B July 2016 – March 2024 CSD19538Q2
PRODUCTION DATA
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | ||
---|---|---|---|---|---|---|---|
STATIC CHARACTERISTICS | |||||||
BVDSS | Drain-to-source voltage | VGS = 0V, ID = 250μA | 100 | V | |||
IDSS | Drain-to-source leakage current | VGS = 0V, VDS = 80V | 1 | μA | |||
IGSS | Gate-to-source leakage current | VDS = 0V, VGS = 20V | 100 | nA | |||
VGS(th) | Gate-to-source threshold voltage | VDS = VGS, ID = 250μA | 2.8 | 3.2 | 3.8 | V | |
RDS(on) | Drain-to-source on resistance | VGS = 6V, ID = 5A | 58 | 72 | mΩ | ||
VGS = 10V, ID = 5A | 49 | 59 | |||||
gfs | Transconductance | VDS = 10V, ID = 5A | 19 | S | |||
DYNAMIC CHARACTERISTICS | |||||||
Ciss | Input capacitance | VGS = 0V, VDS = 50V, ƒ = 1MHz | 349 | 454 | pF | ||
Coss | Output capacitance | 69 | 90 | pF | |||
Crss | Reverse transfer capacitance | 12.6 | 16.4 | pF | |||
RG | Series gate resistance | 4.6 | 9.2 | Ω | |||
Qg | Gate charge total (10V) | VDS = 50V, ID = 5A | 4.3 | 5.6 | nC | ||
Qgd | Gate charge gate-to-drain | 0.8 | nC | ||||
Qgs | Gate charge gate-to-source | 1.6 | nC | ||||
Qg(th) | Gate charge at Vth | 1.0 | nC | ||||
Qoss | Output charge | VDS = 50V, VGS = 0V | 12.3 | nC | |||
td(on) | Turnon delay time | VDS =
50V, VGS = 10V, IDS = 5A, RG = 0Ω | 5 | ns | |||
tr | Rise time | 3 | ns | ||||
td(off) | Turnoff delay time | 7 | ns | ||||
tf | Fall time | 2 | ns | ||||
DIODE CHARACTERISTICS | |||||||
VSD | Diode forward voltage | ISD = 5A, VGS = 0V | 0.85 | 1.0 | V | ||
Qrr | Reverse recovery charge | VDS=
50V, IF = 5A, di/dt = 300A/μs | 94 | nC | |||
trr | Reverse recovery time | 32 | ns |