This 100-V, 49-mΩ, SON 3.3-mm × 3.3-mm NexFET™ power MOSFET is designed to minimize conduction losses and reduce board footprint in PoE applications.
TA = 25°C | TYPICAL VALUE | UNIT | ||
---|---|---|---|---|
VDS | Drain-to-Source Voltage | 100 | V | |
Qg | Gate Charge Total (10 V) | 4.3 | nC | |
Qgd | Gate Charge Gate to Drain | 0.8 | nC | |
RDS(on) | Drain-to-Source On Resistance | VGS = 6 V | 58 | mΩ |
VGS = 10 V | 49 | |||
VGS(th) | Threshold Voltage | 3.2 | V |
DEVICE | MEDIA | QTY | PACKAGE | SHIP |
---|---|---|---|---|
CSD19538Q3A | 13-Inch Reel | 3000 | SON 3.30-mm × 3.30-mm Plastic Package |
Tape and Reel |
CSD19538Q3AT | 7-Inch Reel | 250 |
TA = 25°C | VALUE | UNIT | |
---|---|---|---|
VDS | Drain-to-Source Voltage | 100 | V |
VGS | Gate-to-Source Voltage | ±20 | V |
ID | Continuous Drain Current (Package Limited) | 15 | A |
Continuous Drain Current (Silicon Limited), TC = 25°C | 14 | ||
Continuous Drain Current(1) | 4.9 | ||
IDM | Pulsed Drain Current(2) | 37 | A |
PD | Power Dissipation(1) | 2.8 | W |
Power Dissipation, TC = 25°C | 23 | ||
TJ, Tstg |
Operating Junction Temperature, Storage Temperature |
–55 to 150 | °C |
EAS | Avalanche Energy, Single Pulse ID = 12.7 A, L = 0.1 mH, RG = 25 Ω |
8.1 | mJ |
Changes from * Revision (May 2016) to A Revision
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | ||
---|---|---|---|---|---|---|---|
STATIC CHARACTERISTICS | |||||||
BVDSS | Drain-to-source voltage | VGS = 0 V, ID = 250 μA | 100 | V | |||
IDSS | Drain-to-source leakage current | VGS = 0 V, VDS = 80 V | 1 | μA | |||
IGSS | Gate-to-source leakage current | VDS = 0 V, VGS = 20 V | 100 | nA | |||
VGS(th) | Gate-to-source threshold voltage | VDS = VGS, ID = 250 μA | 2.8 | 3.2 | 3.8 | V | |
RDS(on) | Drain-to-source on resistance | VGS = 6 V, ID = 5 A | 58 | 72 | mΩ | ||
VGS = 10 V, ID = 5 A | 49 | 59 | |||||
gfs | Transconductance | VDS = 10 V, ID = 5 A | 6.1 | S | |||
DYNAMIC CHARACTERISTICS | |||||||
Ciss | Input capacitance | VGS = 0 V, VDS = 50 V, ƒ = 1 MHz | 349 | 454 | pF | ||
Coss | Output capacitance | 69 | 90 | pF | |||
Crss | Reverse transfer capacitance | 12.6 | 16.4 | pF | |||
RG | Series gate resistance | 4.6 | 9.2 | Ω | |||
Qg | Gate charge total (10 V) | VDS = 50 V, ID = 5 A | 4.3 | nC | |||
Qgd | Gate charge gate-to-drain | 0.8 | nC | ||||
Qgs | Gate charge gate-to-source | 1.6 | nC | ||||
Qg(th) | Gate charge at Vth | 1 | nC | ||||
Qoss | Output charge | VDS = 50 V, VGS = 0 V | 12.3 | nC | |||
td(on) | Turnon delay time | VDS = 50 V, VGS = 10 V, IDS = 5 A, RG = 0 Ω |
5 | ns | |||
tr | Rise time | 3 | ns | ||||
td(off) | Turnoff delay time | 7 | ns | ||||
tf | Fall time | 2 | ns | ||||
DIODE CHARACTERISTICS | |||||||
VSD | Diode forward voltage | ISD = 5 A, VGS = 0 V | 0.85 | 1 | V | ||
Qrr | Reverse recovery charge | VDS= 50 V, IF = 5 A, di/dt = 300 A/μs |
94 | nC | |||
trr | Reverse recovery time | 32 | ns |
THERMAL METRIC | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|
RθJC | Junction-to-case thermal resistance(1) | 5.5 | °C/W | ||
RθJA | Junction-to-ambient thermal resistance(1)(2) | 55 | °C/W |
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Max RθJA = 55°C/W when mounted on 1-in2 (6.45-cm2) of 2-oz (0.071-mm) thick Cu. |
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Max RθJA = 195°C/W when mounted on a minimum pad area of 2-oz (0.071-mm) thick Cu. |
ID = 250 µA | ||
ID = 5 A | ||
Single pulse, max RθJC = 5.5°C/W | ||
VDS = 5 V | ||
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These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam during storage or handling to prevent electrostatic damage to the MOS gates.
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