SLPS422B March 2013 – August 2016 CSD97376Q4M
PRODUCTION DATA.
MOSFET centric parameters such as RDS(ON) and Qgd are primarily needed by engineers to estimate the loss generated by the devices. In an effort to simplify the design process for engineers, Texas Instruments has provided measured power loss performance curves. Figure 1 plots the power loss of the CSD97376Q4M as a function of load current. This curve is measured by configuring and running the CSD97376Q4M as it would be in the final application (see Figure 15). The measured power loss is the CSD97376Q4M device power loss which consists of both input conversion loss and gate drive loss. Equation 1 is used to generate the power loss curve.
The power loss curve in Figure 1 is measured at the maximum recommended junction temperature of
TJ = 125°C under isothermal test conditions.