SLASEA3D December 2016 – December 2023 DAC38RF80 , DAC38RF83 , DAC38RF84 , DAC38RF85 , DAC38RF90 , DAC38RF93
PRODUCTION DATA
Refer to the PDF data sheet for device specific package drawings
15 | 14 | 13 | 12 | 11 | 10 | 9 | 8 |
0 | 0 | 0 | 0 | 0 | 0 | 0 | x |
R/W | R/W | R/W | R/W | R/W | R/W | R/W | R/W |
7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
0 | 0 | 0 | 1 | 1 | 0 | 1 | 1 |
R/W | R/W | R/W | R/W | R/W | R/W | R/W | R/W |
LEGEND: R/W = Read/Write; R = Read only; -n = value after reset |
Bit | Field | Type | Reset | Description |
---|---|---|---|---|
15 | Reserved | R/W | 0 | Reserved |
14:12 | DTEST_LANE | R/W | 000 | Selects the lane to check for the signals selected by field DTEST |
11:8 | DTEST | R/W | 0x0 | Allows digital test signals to come out the ALARM pin. 0000 : Test disabled; normal ALARM pin function 0001 : SERDES lanes 0 – 3 PLL clock/80 0010 : SERDES lanes 4 – 7 PLL clock/80 0011 : TESTFAIL (lane selected by field DTEST_LANE) 0100 : SYNC (lane selected by field DTEST_LANE) 0101 : OCIP (lane selected by field DTEST_LANE) 0110 : EQUNDER (lane selected by field DTEST_LANE) 0111 : EQOVER (lane selected by field DTEST_LANE) 1000 – 1111 : not used |
7:0 | Reserved | R/W | 0x00 | Reserved |