SBAS932 March   2024 DAC39RF10-SEP , DAC39RF10-SP , DAC39RFS10-SEP , DAC39RFS10-SP

PRODMIX  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Device Comparison
  6. 5 Pin Configuration and Functions
  7. 6 Specifications
    1. 6.1  Absolute Maximum Ratings
    2. 6.2  ESD Ratings
    3. 6.3  Recommended Operating Conditions
    4. 6.4  Thermal Information
    5. 6.5  Electrical Characteristics - DC Specifications
    6. 6.6  Electrical Characteristics - AC Specifications
    7. 6.7  Electrical Characteristics - Power Consumption
    8. 6.8  Timing Requirements
    9. 6.9  Switching Characteristics
    10. 6.10 SPI and FRI Timing Diagrams
    11. 6.11 Typical Characteristics: Bandwidth and DC Linearity
    12. 6.12 Typical Characteristics: Single Tone Spectra
    13. 6.13 Typical Characteristics: Dual Tone Spectra
    14. 6.14 Typical Characteristics: Noise Spectral Density
    15. 6.15 Typical Characteristics: Power Dissipation and Supply Currents
    16. 6.16 Typical Characteristics: Linearity Sweeps
    17. 6.17 Typical Characteristics: Modulated Waveforms
    18. 6.18 Typical Characteristics: Phase and Amplitude Noise
  8. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagrams
    3. 7.3 Feature Description
      1. 7.3.1 DAC Output Modes
        1. 7.3.1.1 NRZ Mode
        2. 7.3.1.2 RTZ Mode
        3. 7.3.1.3 RF Mode
        4. 7.3.1.4 DES Mode
      2. 7.3.2 DAC Core
        1. 7.3.2.1 DAC Output Structure
        2. 7.3.2.2 Full-Scale Current Adjustment
      3. 7.3.3 DEM and Dither
      4. 7.3.4 Offset Adjustment
      5. 7.3.5 Clocking Subsystem
        1. 7.3.5.1 SYSREF Frequency Requirements
        2. 7.3.5.2 SYSREF Position Detector and Sampling Position Selection (SYSREF Windowing)
      6. 7.3.6 Digital Signal Processing Blocks
        1. 7.3.6.1 Digital Upconverter (DUC)
          1. 7.3.6.1.1 Interpolation Filters
          2. 7.3.6.1.2 Numerically Controlled Oscillator (NCO)
            1. 7.3.6.1.2.1 Phase-Continuous NCO Update Mode
            2. 7.3.6.1.2.2 Phase-coherent NCO Update Mode
            3. 7.3.6.1.2.3 Phase-sync NCO Update Mode
            4. 7.3.6.1.2.4 NCO Synchronization
              1. 7.3.6.1.2.4.1 JESD204C LSB Synchonization
            5. 7.3.6.1.2.5 NCO Mode Programming
          3. 7.3.6.1.3 Mixer Scaling
        2. 7.3.6.2 Channel Bonder
        3. 7.3.6.3 DES Interpolator
      7. 7.3.7 JESD204C Interface
        1. 7.3.7.1  Deviation from JESD204C Standard
        2. 7.3.7.2  Transport Layer
        3. 7.3.7.3  Scrambler and Descrambler
        4. 7.3.7.4  Link Layer
        5. 7.3.7.5  Physical Layer
        6. 7.3.7.6  Serdes PLL Control
        7. 7.3.7.7  Serdes Crossbar
        8. 7.3.7.8  Multi-Device Synchronization and Deterministic Latency
          1. 7.3.7.8.1 Programming RBD
        9. 7.3.7.9  Operation in Subclass 0 Systems
        10. 7.3.7.10 Link Reset
      8. 7.3.8 Alarm Generation
    4. 7.4 Device Functional Modes
      1. 7.4.1 DUC and DDS Modes
      2. 7.4.2 JESD204C Interface Modes
        1. 7.4.2.1 JESD204C Interface Modes
        2. 7.4.2.2 JESD204C Format Diagrams
          1. 7.4.2.2.1 16-bit Formats
          2. 7.4.2.2.2 12-bit Formats
          3. 7.4.2.2.3 8-bit Formats
      3. 7.4.3 NCO Synchronization Latency
      4. 7.4.4 Data Path Latency
    5. 7.5 Programming
      1. 7.5.1 Using the Standard SPI Interface
        1. 7.5.1.1 SCS
        2. 7.5.1.2 SCLK
        3. 7.5.1.3 SDI
        4. 7.5.1.4 SDO
        5. 7.5.1.5 Serial Interface Protocol
        6. 7.5.1.6 Streaming Mode
      2. 7.5.2 Using the Fast Reconfiguration Interface
      3. 7.5.3 SPI Register Map
  9. 8 Application and Implementation
    1. 8.1 Application Information
      1. 8.1.1 Startup Procedure for DUC/Bypass Mode
      2. 8.1.2 Startup Procedure for DDS Mode
      3. 8.1.3 Understanding Dual Edge Sampling Modes
      4. 8.1.4 Eye Scan Procedure
      5. 8.1.5 Pre/Post Cursor Analysis Procedure
      6. 8.1.6 Sleep and Disable Modes
      7. 8.1.7 Radiation Environment Recommendations
        1. 8.1.7.1 SPI Programming
        2. 8.1.7.2 JESD204C Reliability
        3. 8.1.7.3 NCO Reliability
          1. 8.1.7.3.1 NCO Frequency and Phase Correction (Strategy #1)
          2. 8.1.7.3.2 NCO Frequency Correction (Strategy No. 2)
    2. 8.2 Typical Application
      1. 8.2.1 S-Band Radar Transmitter
      2. 8.2.2 Design Requirements
      3. 8.2.3 Detailed Design Procedure
      4. 8.2.4 Detailed Clocking Subsystem Design Procedure
        1. 8.2.4.1 Example 1: SWAP-C Optimized
        2. 8.2.4.2 Example 2: Improved Phase Noise LMX2820 with External VCO
        3. 8.2.4.3 Example 3: Discrete Analog PLL for Best DAC Performance
        4. 8.2.4.4 10GHz Clock Generation
      5. 8.2.5 Application Curves
    3. 8.3 Power Supply Recommendations
      1. 8.3.1 Power Up and Down Sequence
    4. 8.4 Layout
      1. 8.4.1 Layout Guidelines and Example
  10. 9 Device and Documentation Support
    1. 9.1 Receiving Notification of Documentation Updates
    2. 9.2 Support Resources
    3. 9.3 Trademarks
    4. 9.4 Electrostatic Discharge Caution
    5. 9.5 Glossary
  11. 10Revision History
  12. 11Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

8.1.7 Radiation Environment Recommendations

Careful consideration must be given to the environmental conditions when using a product in a radiation environment. Table 8-2 provides a summary of radiation tolerance for device features.

Table 8-2 Summary of Radiation Tolerance
Feature Radiation Tolerance

Writable SPI registers

(excluding write-to-clear registers)

 Implemented with upset immune flip flops. Radiation does not alter the state.
Read-only SPI registers that return constant values Radiation does not alter the state (that is, CHIP_TYPE, CHIP_ID, CHIP_VERSION, VENDOR_ID)
Read-only SPI status registers associated with JESD204C physical or link layers (excluding write-to-clear registers) The value returned can be affected by radiation (SYSREF_POS, LINK_UP, JSYNC_STATE, PLL_LOCKED, LANE_ARR, FIFO_STATUS, JCAP_STATUS, JCAP, BER_CNT, LANE_EQS, ESDONE, ESVO_S, ECOUNT, RXDMUX, CDRPHASE, RXCSA_S).
FUSE_DONE register FUSE_DONE is upset-immune.
OCSTS register Once the PHY is initialized and offset calibration is completed, OCSTS returns offset values that are upset immune. However, an upset can cause a PHY PLL to lose lock which can re-trigger the offset calibration process, generating new offset calibration values.

Sticky SPI status registers

(write-to-clear)

These bits are set when certain events occur in upset-vulnerable logic. An upset can cause the event to occur, and set the sticky bit. An upset can also prevent an event from setting the sticky bit; however this is unlikely as the window of time that this can occur is small. Once the sticky bit is set, an upset does not clear the bit (the flop that is read by SPI is upset immune).

Examples: LANE_ERR, PLL_LOCK_LOST, SYS_ALM, REALIGNED, CLK_REALIGNED.
JESD204C Receiver The JESD204C receiver is not upset immune, but is designed to be free from functional interrupts (can recover automatically from upsets). See JESD204C Reliability.
Interpolation Filters (DUC and DES2X filters) The interpolation filters are not upset immune and can generate glitches when upset. The filters do not suffer from functional interrupts.
NCOs in DUCs The radiation sensitivity of the NCO is TBD.
Temperature Sensor The ADC inside the temperature sensor is not upset immune. To improve reliability, the recommendation is to read TS_TEMP three or more times, and compute the median value.