SBVS014C August   2000  – August 2021 DCV010505 , DCV010505D , DCV010512 , DCV010512D , DCV010515 , DCV010515D , DCV011512D , DCV011515D , DCV012405 , DCV012415D

PRODUCTION DATA  

  1. 1 Features
  2. 2 Applications
  3. 3 Description
  4. 4 Revision History
  5. 5 Device Comparison Table
  6. 6 Pin Configuration and Functions
  7. 7 Specifications
    1. 7.1 Absolute Maximum Ratings
    2. 7.2 ESD Ratings
    3. 7.3 Recommended Operating Conditions
    4. 7.4 Thermal Information
    5. 7.5 Electrical Characteristics
    6. 7.6 Switching Characteristics
    7. 7.7 Typical Characteristics
  8. 8 Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagrams
    3. 8.3 Feature Description
      1. 8.3.1  Isolation
        1. 8.3.1.1 Operation or Functional Isolation
        2. 8.3.1.2 Basic or Enhanced Isolation
        3. 8.3.1.3 Working Voltage
        4. 8.3.1.4 Isolation Voltage Rating
        5. 8.3.1.5 Repeated High-Voltage Isolation Testing
      2. 8.3.2  Power Stage
      3. 8.3.3  Oscillator and Watchdog Circuit
      4. 8.3.4  Thermal Shutdown
      5. 8.3.5  Synchronization
      6. 8.3.6  Light Load Operation (< 10%)
      7. 8.3.7  Load Regulation (10% to 100%)
      8. 8.3.8  Construction
      9. 8.3.9  Thermal Management
      10. 8.3.10 Power-Up Characteristics
    4. 8.4 Device Functional Modes
      1. 8.4.1 Disable and Enable (SYNCIN Pin)
      2. 8.4.2 Decoupling
        1. 8.4.2.1 Ripple Reduction
        2. 8.4.2.2 Connecting the DCV01 in Series
        3. 8.4.2.3 Connecting the DCV01 in Parallel
  9. 9 Application and Implementation
    1. 9.1 Application Information
    2. 9.2 Typical Application
      1. 9.2.1 Design Requirements
      2. 9.2.2 Detailed Design Procedure
        1. 9.2.2.1 Input Capacitor
        2. 9.2.2.2 Output Capacitor
        3. 9.2.2.3 SYNCIN Pin
        4. 9.2.2.4 PCB Design
        5. 9.2.2.5 Decoupling Ceramic Capacitors
        6. 9.2.2.6 Input Capacitor and the Effects of ESR
        7. 9.2.2.7 Ripple and Noise
          1. 9.2.2.7.1 Output Ripple Calculation Example
        8. 9.2.2.8 Dual DCV01 Output Voltage
        9. 9.2.2.9 Optimizing Performance
      3. 9.2.3 Application Curves
  10. 10Power Supply Recommendations
  11. 11Layout
    1. 11.1 Layout Guidelines
    2. 11.2 Layout Example
  12. 12Device and Documentation Support
    1. 12.1 Device Support
      1. 12.1.1 Device Nomenclature
    2. 12.2 Documentation Support
      1. 12.2.1 Related Documentation
    3. 12.3 Receiving Notification of Documentation Updates
    4. 12.4 Support Resources
    5. 12.5 Trademarks
    6. 12.6 Electrostatic Discharge Caution
    7. 12.7 Glossary
  13. 13Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

12.6 Electrostatic Discharge Caution

GUID-D6F43A01-4379-4BA1-8019-E75693455CED-low.gif This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.