over operating free-air temperature range (unless otherwise noted) (1) | MIN | MAX | UNIT |
---|
SUPPLY VOLTAGES (2) |
VCC | Supply voltage for LVCMOS core logic | –0.5 | 4 | V |
VREF | Supply voltage for LVCMOS DDR interface | –0.5 | 4 | V |
VOFFSET | Supply voltage for high voltage CMOS and micromirror electrode | –0.5 | 8.75 | V |
VBIAS (3) | Supply voltage for micromirror electrode | –0.5 | 17 | V |
VRESET | Supply voltage for micromirror electrode | –11 | 0.5 | V |
|VBIAS - VOFFSET| (3) | Supply voltage delta (absolute value) | | 8.75 | V |
INPUT VOLTAGES (2) |
| Input voltage to all other input pins | –0.5 | VREF + 0.5 | V |
INPUT CURRENTS |
| Current required from a high-level output | VOH = 1.4 V | | –9 | mA |
| Current required from a low-level output | VOL = 0.4 V | | 18 | mA |
CLOCKS |
fCLK | DCLK clock frequency | 80 | 120 | MHz |
ENVIRONMENTAL |
TCASE | Case temperature - operational (4) | –20 | 90 | °C |
Case temperature - non-operational (4) | –40 | 90 | °C |
TDP | Dew Point (operation and non-operational) | | 81 | °C |
| Operating Relative Humidity (non-condensing) | 0 | 95 | %RH |
(1) Operation outside the Absolute Maximum Ratings may cause permanent device
damage. Absolute Maximum Ratings do not imply functional operation of the device
at these or any other conditions beyond those listed under Recommended Operating
Conditions. If outside the Recommended Operating Conditions but within the
Absolute Maximum Ratings, the device may not be fully functional, and this may
affect device reliability, functionality, performance, and shorten the device
lifetime.
(2) All voltage values are referenced to common ground VSS. Supply voltages VCC, VREF, VOFFSET, VBIAS, and VRESET are all required for proper DMD operation. VSS must also be connected.
(3) To prevent excess current, the supply voltage delta |VBIAS – VOFFSET| must be less than the specified limit.
(4) DMD Temperature is the worst-case of any test point shown in or
Figure 8-3, or the active array as calculated by the Micromirror Array Temperature
Calculation, or any point along the Window Edge as defined in or
Figure 8-3. The locations of thermal test point TP2 is intended to measure the highest
window edge temperature. If a particular application causes another point on the
window edge to be at a higher temperature, a test point should be added to that
location.