DLPS159D April   2019  – December 2024 DLP470NE

PRODUCTION DATA  

  1.   1
  2. Features
  3. Applications
  4. Description
  5. Pin Configuration and Functions
  6. Specifications
    1. 5.1  Absolute Maximum Ratings
    2. 5.2  Storage Conditions
    3. 5.3  ESD Ratings
    4. 5.4  Recommended Operating Conditions
    5. 5.5  Thermal Information
    6. 5.6  Electrical Characteristics
    7. 5.7  Capacitance at Recommended Operating Conditions
    8. 5.8  Timing Requirements
    9. 5.9  System Mounting Interface Loads
    10. 5.10 Micromirror Array Physical Characteristics
    11. 5.11 Micromirror Array Optical Characteristics
    12. 5.12 Window Characteristics
    13. 5.13 Chipset Component Usage Specification
  7. Detailed Description
    1. 6.1 Overview
    2. 6.2 Functional Block Diagram
    3. 6.3 Feature Description
      1. 6.3.1 Power Interface
      2. 6.3.2 Timing
    4. 6.4 Device Functional Modes
    5. 6.5 Optical Interface and System Image Quality Considerations
      1. 6.5.1 Numerical Aperture and Stray Light Control
      2. 6.5.2 Pupil Match
      3. 6.5.3 Illumination Overfill
    6. 6.6 Micromirror Array Temperature Calculation
    7. 6.7 Micromirror Power Density Calculation
    8. 6.8 Micromirror Landed-On/Landed-Off Duty Cycle
      1. 6.8.1 Definition of Micromirror Landed-On/Landed-Off Duty Cycle
      2. 6.8.2 Landed Duty Cycle and Useful Life of the DMD
      3. 6.8.3 Landed Duty Cycle and Operational DMD Temperature
      4. 6.8.4 Estimating the Long-Term Average Landed Duty Cycle of a Product or Application
  8. Application and Implementation
    1. 7.1 Application Information
    2. 7.2 Typical Application
      1. 7.2.1 Design Requirements
      2. 7.2.2 Detailed Design Procedure
      3. 7.2.3 Application Curves
    3. 7.3 DMD Die Temperature Sensing
  9. Power Supply Recommendations
    1. 8.1 DMD Power Supply Power-Up Procedure
    2. 8.2 DMD Power Supply Power-Down Procedure
  10. Layout
    1. 9.1 Layout Guidelines
    2. 9.2 Layout Example
      1. 9.2.1 Layers
      2. 9.2.2 Impedance Requirements
      3. 9.2.3 Trace Width, Spacing
        1. 9.2.3.1 Voltage Signals
  11. 10Device and Documentation Support
    1. 10.1 Third-Party Products Disclaimer
    2. 10.2 Device Support
      1. 10.2.1 Device Nomenclature
      2. 10.2.2 Device Markings
    3. 10.3 Documentation Support
      1. 10.3.1 Related Documentation
    4. 10.4 Receiving Notification of Documentation Updates
    5. 10.5 Support Resources
    6. 10.6 Trademarks
    7. 10.7 Electrostatic Discharge Caution
    8. 10.8 Glossary
  12. 11Revision History
  13.   Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

Micromirror Power Density Calculation

The calculation of the optical power density of the illumination on the DMD in the different wavelength bands uses the total measured optical power on the DMD, percent illumination overfill, area of the active array, and the ratio of the spectrum in the wavelength band of interest to the total spectral optical power.

  • ILLUV = [OPUV-RATIO × QINCIDENT] × 1000mW/W ÷ AILL (mW/cm2)
  • ILLVIS = [OPVIS-RATIO × QINCIDENT] ÷ AILL (W/cm2)
  • ILLIR = [OPIR-RATIO × QINCIDENT] × 1000mW/W ÷ AILL (mW/cm2)
  • ILLBLU = [OPBLU-RATIO × QINCIDENT] ÷ AILL (W/cm2)
  • ILLBLU1 = [OPBLU1-RATIO × QINCIDENT] ÷ AILL (W/cm2)
  • AILL = AARRAY ÷ (1 ­- OVILL) (cm2)

where:

  • ILLUV = UV illumination power density on the DMD (mW/cm2)
  • ILLVIS = VIS illumination power density on the DMD (W/cm2)
  • ILLIR = IR illumination power density on the DMD (mW/cm2)
  • ILLBLU = BLU illumination power density on the DMD (W/cm2)
  • ILLBLU1 = BLU1 illumination power density on the DMD (W/cm2)
  • AILL = illumination area on the DMD (cm2)
  • QINCIDENT = total incident optical power on DMD (W) (measured)
  • AARRAY = area of the array (cm 2) (data sheet)
  • OVILL = percent of total illumination on the DMD outside the array (%) (optical model)
  • OPUV-RATIO = ratio of the optical power for wavelengths <410nm to the total optical power in the illumination spectrum (spectral measurement)
  • OPVIS-RATIO = ratio of the optical power for wavelengths ≥410 and ≤800nm to the total optical power in the illumination spectrum (spectral measurement)
  • OPIR-RATIO = ratio of the optical power for wavelengths >800nm to the total optical power in the illumination spectrum (spectral measurement)
  • OPBLU-RATIO = ratio of the optical power for wavelengths ≥410nm and ≤475nm to the total optical power in the illumination spectrum (spectral measurement)
  • OPBLU1-RATIO = ratio of the optical power for wavelengths ≥410nm and ≤440nm to the total optical power in the illumination spectrum (spectral measurement)

The illumination area varies and depends on the illumination overfill. The total illumination area on the DMD is the array area and the overfill area around the array. The optical model is used to determine the percent of the total illumination on the DMD that is outside the array (OVILL) and the percent of the total illumination that is on the active array. From these values, the illumination area (AILL) is calculated. The illumination is assumed to be uniform across the entire array.

From the measured illumination spectrum, the ratio of the optical power in the wavelength bands of interest to the total optical power is calculated.

Sample calculation:

QINCIDENT = 31W (measured)
AARRAY = (10.3680mm × 5.8320mm) ÷ 100mm2/cm2 = 0.6047cm2 (data sheet)
OVILL = 16.3% (optical model)
OPUV-RATIO = 0.00017 (spectral measurement)
OPVIS-RATIO = 0.99977 (spectral measurement)
OPIR-RATIO = 0.00006 (spectral measurement)
OPBLU-RATIO = 0.28100 (spectral measurement)
OPBLU1-RATIO = 0.03200 (spectral measurement)
AILL = 0.6047cm2 ÷ (1 - 0.163) = 0.7224cm2
ILLUV = [0.00017 × 31W] × 1000mW/W ÷ 0.7224cm2 = 7.295mW/cm2
ILLVIS = [0.99977 × 31W] ÷ 0.7224cm2 = 42.90W/cm2
ILLIR = [0.00006 × 31W] × 1000mW/W ÷ 0.7224cm2 = 2.575mW/cm2
ILLBLU = [0.28100 × 31W] ÷ 0.7224cm2 = 12.06W/cm2
ILLBLU1 = [0.03200 × 31W] ÷ 0.7224cm2 = 1.37W/cm2