DLPS015G april   2010  – june 2023 DLPA200

PRODUCTION DATA  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Revision History
  6. 5 Device Configurations Table
  7. 6 Pin Configuration and Functions
  8. 7 Specifications
    1. 7.1  Absolute Maximum Ratings
    2. 7.2  ESD Ratings
    3. 7.3  Recommended Operating Conditions
    4. 7.4  Thermal Information
    5. 7.5  Electrical Characteristics Control Logic
    6. 7.6  5-V Linear Regulator
    7. 7.7  Bias Voltage Boost Converter
    8. 7.8  Reset Voltage Buck-Boost Converter
    9. 7.9  VOFFSET/DMDVCC2 Regulator
    10. 7.10 Switching Characteristics
  9. 8 Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagram
    3. 8.3 Feature Description
      1. 8.3.1 5-V Linear Regulator
      2. 8.3.2 Bias Voltage Boost Converter
      3. 8.3.3 Reset Voltage Buck-Boost Converter
      4. 8.3.4 VOFFSET/DMDVCC2 Regulator
      5. 8.3.5 Serial Communications Port (SCP)
  10. 9 Application and Implementation
    1. 9.1 Application Information
      1. 9.1.1 Component Selection Guidelines
  11. 10Power Supply Recommendations
    1. 10.1 Power Supply Rail Guidelines
  12. 11Layout
    1. 11.1 Layout Guidelines
      1. 11.1.1 Grounding Guidelines
    2. 11.2 Thermal Considerations
  13. 12Device and Documentation Support
    1. 12.1 Device Support
      1. 12.1.1 Device Nomenclature
    2. 12.2 Documentation Support
      1. 12.2.1 Related Documentation
    3. 12.3 Support Resources
    4. 12.4 Trademarks
    5. 12.5 Electrostatic Discharge Caution
    6. 12.6 Glossary
  14. 13Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

12.5 Electrostatic Discharge Caution

GUID-D6F43A01-4379-4BA1-8019-E75693455CED-low.gif This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.