| VALUE | UNIT |
---|
V(ESD)(1) | Electrostatic discharge | Human body model (HBM)(2) | ±2000 | V |
Charged device model (CDM)(3) | 800 |
(1) Electrostatic discharge (ESD) to measure device sensitivity and immunity to damage caused by assembly line electrostatic discharges in to the device.
(2) JEDEC document JEP155 states that 500 V HBM allows safe manufacturing with a standard ESD control process.
(3) JEDEC document JEP157 states that 250 V CDM allows safe manufacturing with a standard ESD control process.