SPRS976E November   2016  – May 2018 DM505

PRODUCTION DATA.  

  1. 1Device Overview
    1. 1.1 Features
    2. 1.2 Applications
    3. 1.3 Description
    4. 1.4 Functional Block Diagram
  2. 2Revision History
  3. 3Device Comparison
    1. 3.1 Device Comparison Table
  4. 4Terminal Configuration and Functions
    1. 4.1 Pin Diagram
    2. 4.2 Pin Attributes
    3. 4.3 Signal Descriptions
      1. 4.3.1  VIP
      2. 4.3.2  DSS
      3. 4.3.3  SD_DAC
      4. 4.3.4  ADC
      5. 4.3.5  Camera Control
      6. 4.3.6  CPI
      7. 4.3.7  CSI2
      8. 4.3.8  EMIF
      9. 4.3.9  GPMC
      10. 4.3.10 Timers
      11. 4.3.11 I2C
      12. 4.3.12 UART
      13. 4.3.13 McSPI
      14. 4.3.14 QSPI
      15. 4.3.15 McASP
      16. 4.3.16 DCAN and MCAN
      17. 4.3.17 GMAC_SW
      18. 4.3.18 SDIO Controller
      19. 4.3.19 GPIO
      20. 4.3.20 ePWM
      21. 4.3.21 Emulation and Debug Subsystem
      22. 4.3.22 System and Miscellaneous
        1. 4.3.22.1 Sysboot
        2. 4.3.22.2 Power, Reset and Clock Management (PRCM)
        3. 4.3.22.3 Enhanced Direct Memory Access (EDMA)
        4. 4.3.22.4 Interrupt Controllers (INTC)
      23. 4.3.23 Power Supplies
    4. 4.4 Pin Multiplexing
    5. 4.5 Connections for Unused Pins
  5. 5Specifications
    1. 5.1 Absolute Maximum Ratings
    2. 5.2 ESD Ratings
    3. 5.3 Power on Hour (POH) Limits
    4. 5.4 Recommended Operating Conditions
    5. 5.5 Operating Performance Points
      1. 5.5.1 AVS Requirements
      2. 5.5.2 Voltage And Core Clock Specifications
      3. 5.5.3 Maximum Supported Frequency
    6. 5.6 Power Consumption Summary
    7. 5.7 Electrical Characteristics
      1. Table 5-6   LVCMOS DDR DC Electrical Characteristics
      2. Table 5-7   Dual Voltage LVCMOS I2C DC Electrical Characteristics
      3. Table 5-8   IQ1833 Buffers DC Electrical Characteristics
      4. Table 5-9   IHHV1833 Buffers DC Electrical Characteristics
      5. Table 5-10 LVCMOS Analog OSC Buffers DC Electrical Characteristics
      6. Table 5-11 LVCMOS CSI2 DC Electrical Characteristics
      7. Table 5-12 Dual Voltage LVCMOS DC Electrical Characteristics
      8. Table 5-13 Analog-to-Digital ADC Subsystem Electrical Specifications
    8. 5.8 Thermal Characteristics
      1. 5.8.1 Package Thermal Characteristics
    9. 5.9 Timing Requirements and Switching Characteristics
      1. 5.9.1 Timing Parameters and Information
        1. 5.9.1.1 Parameter Information
          1. 5.9.1.1.1 1.8V and 3.3V Signal Transition Levels
          2. 5.9.1.1.2 1.8V and 3.3V Signal Transition Rates
          3. 5.9.1.1.3 Timing Parameters and Board Routing Analysis
      2. 5.9.2 Interface Clock Specifications
        1. 5.9.2.1 Interface Clock Terminology
        2. 5.9.2.2 Interface Clock Frequency
      3. 5.9.3 Power Supply Sequences
      4. 5.9.4 Clock Specifications
        1. 5.9.4.1 Input Clocks / Oscillators
          1. 5.9.4.1.1 OSC0 External Crystal
          2. 5.9.4.1.2 OSC0 Input Clock
          3. 5.9.4.1.3 Auxiliary Oscillator OSC1 Input Clock
            1. 5.9.4.1.3.1 OSC1 External Crystal
            2. 5.9.4.1.3.2 OSC1 Input Clock
          4. 5.9.4.1.4 RC On-die Oscillator Clock
        2. 5.9.4.2 Output Clocks
        3. 5.9.4.3 DPLLs, DLLs
          1. 5.9.4.3.1 DPLL Characteristics
          2. 5.9.4.3.2 DLL Characteristics
            1. 5.9.4.3.2.1 DPLL and DLL Noise Isolation
      5. 5.9.5 Recommended Clock and Control Signal Transition Behavior
      6. 5.9.6 Peripherals
        1. 5.9.6.1  Timing Test Conditions
        2. 5.9.6.2  VIP
        3. 5.9.6.3  DSS
        4. 5.9.6.4  ISS
          1. 5.9.6.4.1 CSI-2 MIPI D-PHY—1.5 V and 1.8 V
        5. 5.9.6.5  EMIF
        6. 5.9.6.6  GPMC
          1. 5.9.6.6.1 GPMC/NOR Flash Interface Synchronous Timing
          2. 5.9.6.6.2 GPMC/NOR Flash Interface Asynchronous Timing
          3. 5.9.6.6.3 GPMC/NAND Flash Interface Asynchronous Timing
        7. 5.9.6.7  GP Timers
          1. 5.9.6.7.1 GP Timer Features
        8. 5.9.6.8  I2C
          1. Table 5-41 Timing Requirements for I2C Input Timings
          2. Table 5-42 Switching Characteristics Over Recommended Operating Conditions for I2C Output Timings
        9. 5.9.6.9  UART
          1. Table 5-43 Timing Requirements for UART
          2. Table 5-44 Switching Characteristics Over Recommended Operating Conditions for UART
        10. 5.9.6.10 McSPI
        11. 5.9.6.11 QSPI
        12. 5.9.6.12 McASP
          1. Table 5-52 Timing Requirements for McASP1
          2. Table 5-53 Timing Requirements for McASP2
          3. Table 5-54 Timing Requirements for McASP3
          4. Table 5-55 Switching Characteristics Over Recommended Operating Conditions for McASP1
          5. Table 5-56 Switching Characteristics Over Recommended Operating Conditions for McASP2
          6. Table 5-57 Switching Characteristics Over Recommended Operating Conditions for McASP3
        13. 5.9.6.13 DCAN and MCAN
          1. 5.9.6.13.1  DCAN
          2. 5.9.6.13.2  MCAN
          3. Table 5-60 Timing Requirements for CAN Receive
          4. Table 5-61 Switching Characteristics Over Recommended Operating Conditions for CAN Transmit
        14. 5.9.6.14 GMAC_SW
          1. 5.9.6.14.1 GMAC MDIO Interface Timings
          2. 5.9.6.14.2 GMAC RGMII Timings
            1. Table 5-65 Timing Requirements for rgmiin_rxc - RGMIIn Operation
            2. Table 5-66 Timing Requirements for GMAC RGMIIn Input Receive for 10/100/1000 Mbps
            3. Table 5-67 Switching Characteristics Over Recommended Operating Conditions for rgmiin_txctl - RGMIIn Operation for 10/100/1000 Mbit/s
            4. Table 5-68 Switching Characteristics for GMAC RGMIIn Output Transmit for 10/100/1000 Mbps
        15. 5.9.6.15 SDIO Controller
          1. 5.9.6.15.1 MMC, SD Default Speed
          2. 5.9.6.15.2 MMC, SD High Speed
          3. 5.9.6.15.3 MMC, SD and SDIO SDR12 Mode
          4. 5.9.6.15.4 MMC, SD SDR25 Mode
        16. 5.9.6.16 GPIO
      7. 5.9.7 Emulation and Debug Subsystem
        1. 5.9.7.1 JTAG Electrical Data/Timing
          1. Table 5-79 Timing Requirements for IEEE 1149.1 JTAG
          2. Table 5-80 Switching Characteristics Over Recommended Operating Conditions for IEEE 1149.1 JTAG
          3. Table 5-81 Timing Requirements for IEEE 1149.1 JTAG With RTCK
          4. Table 5-82 Switching Characteristics Over Recommended Operating Conditions for IEEE 1149.1 JTAG With RTCK
        2. 5.9.7.2 Trace Port Interface Unit (TPIU)
          1. 5.9.7.2.1 TPIU PLL DDR Mode
  6. 6Detailed Description
    1. 6.1  Description
    2. 6.2  Functional Block Diagram
    3. 6.3  DSP Subsystem
    4. 6.4  IPU
    5. 6.5  EVE
    6. 6.6  Memory Subsystem
      1. 6.6.1 EMIF
      2. 6.6.2 GPMC
      3. 6.6.3 ELM
      4. 6.6.4 OCMC
    7. 6.7  Interprocessor Communication
      1. 6.7.1 Mailbox
      2. 6.7.2 Spinlock
    8. 6.8  Interrupt Controller
    9. 6.9  EDMA
    10. 6.10 Peripherals
      1. 6.10.1  VIP
      2. 6.10.2  DSS
      3. 6.10.3  ADC
      4. 6.10.4  ISS
      5. 6.10.5  Timers
        1. 6.10.5.1 General-Purpose Timers
        2. 6.10.5.2 32-kHz Synchronized Timer (COUNTER_32K)
      6. 6.10.6  I2C
      7. 6.10.7  UART
        1. 6.10.7.1 UART Features
      8. 6.10.8  McSPI
      9. 6.10.9  QSPI
      10. 6.10.10 McASP
      11. 6.10.11 DCAN
      12. 6.10.12 MCAN
      13. 6.10.13 GMAC_SW
      14. 6.10.14 SDIO
      15. 6.10.15 GPIO
      16. 6.10.16 ePWM
      17. 6.10.17 eCAP
      18. 6.10.18 eQEP
    11. 6.11 On-Chip Debug
  7. 7Applications, Implementation, and Layout
    1. 7.1  Introduction
      1. 7.1.1 Initial Requirements and Guidelines
    2. 7.2  Power Optimizations
      1. 7.2.1 Step 1: PCB Stack-up
      2. 7.2.2 Step 2: Physical Placement
      3. 7.2.3 Step 3: Static Analysis
        1. 7.2.3.1 PDN Resistance and IR Drop
      4. 7.2.4 Step 4: Frequency Analysis
      5. 7.2.5 System ESD Generic Guidelines
        1. 7.2.5.1 System ESD Generic PCB Guideline
        2. 7.2.5.2 Miscellaneous EMC Guidelines to Mitigate ESD Immunity
        3. 7.2.5.3 ESD Protection System Design Consideration
      6. 7.2.6 EMI / EMC Issues Prevention
        1. 7.2.6.1 Signal Bandwidth
        2. 7.2.6.2 Signal Routing
          1. 7.2.6.2.1 Signal Routing—Sensitive Signals and Shielding
          2. 7.2.6.2.2 Signal Routing—Outer Layer Routing
        3. 7.2.6.3 Ground Guidelines
          1. 7.2.6.3.1 PCB Outer Layers
          2. 7.2.6.3.2 Metallic Frames
          3. 7.2.6.3.3 Connectors
          4. 7.2.6.3.4 Guard Ring on PCB Edges
          5. 7.2.6.3.5 Analog and Digital Ground
    3. 7.3  Core Power Domains
      1. 7.3.1 General Constraints and Theory
      2. 7.3.2 Voltage Decoupling
      3. 7.3.3 Static PDN Analysis
      4. 7.3.4 Dynamic PDN Analysis
      5. 7.3.5 Power Supply Mapping
      6. 7.3.6 DPLL Voltage Requirement
      7. 7.3.7 Loss of Input Power Event
      8. 7.3.8 Example PCB Design
        1. 7.3.8.1 Example Stack-up
        2. 7.3.8.2 vdd_dspeve Example Analysis
    4. 7.4  Single-Ended Interfaces
      1. 7.4.1 General Routing Guidelines
      2. 7.4.2 QSPI Board Design and Layout Guidelines
        1. 7.4.2.1 If QSPI is operated in Mode 0 (POL=0, PHA=0):
        2. 7.4.2.2 If QSPI is operated in Mode 3 (POL=1, PHA=1):
    5. 7.5  Differential Interfaces
      1. 7.5.1 General Routing Guidelines
      2. 7.5.2 CSI2 Board Design and Routing Guidelines
        1. 7.5.2.1 CSI2_0 MIPI CSI-2 (1.5 Gbps)
          1. 7.5.2.1.1 General Guidelines
          2. 7.5.2.1.2 Length Mismatch Guidelines
            1. 7.5.2.1.2.1 CSI2_0 MIPI CSI-2 (1.5 Gbps)
          3. 7.5.2.1.3 Frequency-domain Specification Guidelines
    6. 7.6  Clock Routing Guidelines
      1. 7.6.1 Oscillator Ground Connection
    7. 7.7  LPDDR2 Board Design and Layout Guidelines
      1. 7.7.1 LPDDR2 Board Designs
      2. 7.7.2 LPDDR2 Device Configurations
      3. 7.7.3 LPDDR2 Interface
        1. 7.7.3.1 LPDDR2 Interface Schematic
        2. 7.7.3.2 Compatible JEDEC LPDDR2 Devices
        3. 7.7.3.3 LPDDR2 PCB Stackup
        4. 7.7.3.4 LPDDR2 Placement
        5. 7.7.3.5 LPDDR2 Keepout Region
        6. 7.7.3.6 LPDDR2 Net Classes
        7. 7.7.3.7 LPDDR2 Signal Termination
        8. 7.7.3.8 LPDDR2 DDR_VREF Routing
      4. 7.7.4 Routing Specification
        1. 7.7.4.1 DQS[x] and DQ[x] Routing Specification
        2. 7.7.4.2 CK and ADDR_CTRL Routing Specification
    8. 7.8  DDR2 Board Design and Layout Guidelines
      1. 7.8.1 DDR2 General Board Layout Guidelines
      2. 7.8.2 DDR2 Board Design and Layout Guidelines
        1. 7.8.2.1 Board Designs
        2. 7.8.2.2 DDR2 Interface
          1. 7.8.2.2.1  DDR2 Interface Schematic
          2. 7.8.2.2.2  Compatible JEDEC DDR2 Devices
          3. 7.8.2.2.3  PCB Stackup
          4. 7.8.2.2.4  Placement
          5. 7.8.2.2.5  DDR2 Keepout Region
          6. 7.8.2.2.6  Bulk Bypass Capacitors
          7. 7.8.2.2.7  High-Speed Bypass Capacitors
          8. 7.8.2.2.8  Net Classes
          9. 7.8.2.2.9  DDR2 Signal Termination
          10. 7.8.2.2.10 VREF Routing
        3. 7.8.2.3 DDR2 CK and ADDR_CTRL Routing
    9. 7.9  DDR3 Board Design and Layout Guidelines
      1. 7.9.1 DDR3 General Board Layout Guidelines
      2. 7.9.2 DDR3 Board Design and Layout Guidelines
        1. 7.9.2.1  Board Designs
        2. 7.9.2.2  DDR3 Device Combinations
        3. 7.9.2.3  DDR3 Interface Schematic
          1. 7.9.2.3.1 32-Bit DDR3 Interface
          2. 7.9.2.3.2 16-Bit DDR3 Interface
        4. 7.9.2.4  Compatible JEDEC DDR3 Devices
        5. 7.9.2.5  PCB Stackup
        6. 7.9.2.6  Placement
        7. 7.9.2.7  DDR3 Keepout Region
        8. 7.9.2.8  Bulk Bypass Capacitors
        9. 7.9.2.9  High-Speed Bypass Capacitors
          1. 7.9.2.9.1 Return Current Bypass Capacitors
        10. 7.9.2.10 Net Classes
        11. 7.9.2.11 DDR3 Signal Termination
        12. 7.9.2.12 VTT
        13. 7.9.2.13 CK and ADDR_CTRL Topologies and Routing Definition
          1. 7.9.2.13.1 Three DDR3 Devices
            1. 7.9.2.13.1.1 CK and ADDR_CTRL Topologies, Three DDR3 Devices
            2. 7.9.2.13.1.2 CK and ADDR_CTRL Routing, Three DDR3 Devices
          2. 7.9.2.13.2 Two DDR3 Devices
            1. 7.9.2.13.2.1 CK and ADDR_CTRL Topologies, Two DDR3 Devices
            2. 7.9.2.13.2.2 CK and ADDR_CTRL Routing, Two DDR3 Devices
          3. 7.9.2.13.3 One DDR3 Device
            1. 7.9.2.13.3.1 CK and ADDR_CTRL Topologies, One DDR3 Device
            2. 7.9.2.13.3.2 CK and ADDR/CTRL Routing, One DDR3 Device
        14. 7.9.2.14 Data Topologies and Routing Definition
          1. 7.9.2.14.1 DQS and DQ/DM Topologies, Any Number of Allowed DDR3 Devices
          2. 7.9.2.14.2 DQS and DQ/DM Routing, Any Number of Allowed DDR3 Devices
        15. 7.9.2.15 Routing Specification
          1. 7.9.2.15.1 CK and ADDR_CTRL Routing Specification
          2. 7.9.2.15.2 DQS and DQ Routing Specification
    10. 7.10 CVIDEO/SD-DAC Guidelines and Electrical Data/Timing
  8. 8Device and Documentation Support
    1. 8.1 Device Nomenclature
      1. 8.1.1 Standard Package Symbolization
      2. 8.1.2 Device Naming Convention
    2. 8.2 Tools and Software
    3. 8.3 Documentation Support
      1. 8.3.1 FCC Warning
      2. 8.3.2 Information About Cautions and Warnings
    4. 8.4 Receiving Notification of Documentation Updates
    5. 8.5 Community Resources
    6. 8.6 Trademarks
      1. 8.6.1 Electrostatic Discharge Caution
    7. 8.7 Export Control Notice
    8. 8.8 Glossary
  9. 9Mechanical Packaging Information
    1. 9.1 Mechanical Data

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

7.10 CVIDEO/SD-DAC Guidelines and Electrical Data/Timing

The device's analog video CVIDEO/SD-DAC TV analog composite output can be operate in one of two modes: Normal mode and TVOUT Bypass mode. In Normal mode, the device’s internal video amplifier is used. In TVOUT Bypass mode, the internal video amplifier is bypassed and an external amplifier is required.

Figure 7-72 shows a typical circuit that permits connecting the analog video output from the device to standard 75-Ω impedance video systems in Normal mode.

DM505 dg_dac_tvo_norm_prs647.gif
A. Reconstruction Filter (optional)
B. AC coupling capacitor (optional)
Figure 7-72 TV Output (Normal Mode)

Figure 7-73 shows a typical circuit that permits connecting the analog video output from the device to standard 75-Ω impedance video systems in TVOUT Bypass mode.

DM505 dg_dac_tvo_bypass_prs647.gif
A. Reconstruction Filter (optional). Note: An amplifier with an integrated reconstruction filter can alternatively be used instead of a discrete reconstruction filter.
B. AC coupling capacitor (optional)
Figure 7-73 TV Output (TVOUT Bypass Mode)

During board design, the onboard traces and parasitics must be matched for the channel. The video DAC output pins (cvideo_tvout / cvideo_vfb) are very high-frequency analog signals and must be routed with extreme care. As a result, the paths of these signals must be as short as possible, and as isolated as possible from other interfering signals. In TVOUT Bypass mode, the load resistor and amplifier/buffer should be placed as close as possible to the cvideo_vfb pin. Other layout guidelines include:

  • Take special care to bypass the vdda_dac power supply pin with a capacitor.
  • In TVOUT Bypass mode, place the RLOAD resistor as close as possible to the Reconstruction Filter and Amplifier. In addition, place the 75-Ω resistor as close as possible (< 0.5 inch) to the Amplifier/buffer output pin. To maintain a high-quality video signal, the onboard traces after the 75-Ω resistor should have a characteristic impedance of 75 Ω (± 20%).
  • In Normal mode,cvideo_vfb is the most sensitive pin in the TV out system. The ROUT resistor should be placed as close as possible to the device pins. To maintain a high-quality video signal, the onboard traces leading to the cvideo_tvout pin should have a characteristic impedance of 75 Ω (± 20%) starting from the closest possible place to the device pin output.
  • Minimize input trace lengths to the device to reduce parasitic capacitance.
  • Include solid ground return paths.
  • Match trace lengths as close as possible within a video format group.

Table 7-46 and Table 7-47 present the Static and Dynamic CVIDEO / SD-DAC TV analog composite output specifications

Table 7-46 Static CVIDEO/SD-DAC Specifications

PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
Reference Current Setting Resistor (RSET) Normal Mode 4653 4700 4747 Ω
TVOUT Bypass Mode 9900 10000 10100 Ω
Output resistor between cvideo_tvout and cvideo_vfb pins (ROUT) Normal Mode 2673 2700 2727 Ω
TVOUT Bypass Mode N/A
Load Resistor (RLOAD) Normal Mode 75-Ω Inside the Display
TVOUT Bypass Mode 1485 1500 1515 Ω
AC-Coupling Capacitor (Optional) [CAC] Normal Mode 220 uF
TVOUT Bypass Mode See External Amplifier Specification
Total Capacitance from cvideo_tvout to vssa_dac Normal Mode 300 pF
TVOUT Bypass Mode N/A
Resolution 10 Bits
Integral Non-Linearity (INL), Best Fit Normal Mode -4 4 LSB
TVOUT Bypass Mode -1 1 LSB
Differential Non-Linearity (DNL) Normal Mode -2.5 2.5 LSB
TVOUT Bypass Mode -1 1 LSB
Full-Scale Output Voltage Normal Mode (RLOAD = 75 Ω) 1.3 V
TVOUT Bypass Mode (RLOAD = 1.5 kΩ) 0.7 V
Full-Scale Output Current Normal Mode N/A
TVOUT Bypass Mode 470 uA
Gain Error Normal Mode (Composite) and TVOUT Bypass Mode -10 10 %FS
Normal Mode (S-Video) -20 20 %FS
Gain Mismatch (Luma-to-Chroma) Normal Mode (Composite) N/A
Normal Mode (S-Video) -10 10 %
Output Impedance Looking into cvideo_tvout nodes 75 Ω

Table 7-47 Dynamic CVIDEO/SD-DAC Specifications

PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
Output Update Rate (FCLK) 54 60 MHz
Signal Bandwidth 3 dB 6 MHz
Spurious-Free Dynamic Range (SFDR) within bandwidth FCLK = 54 MHz, FOUT = 1 MHz 50 dBc
Signal-to-Noise Ration (SNR) FCLK = 54 MHz, FOUT = 1 MHz 54 dB
Power Supply Rejection (PSR) Normal Mode, 100 mVpp @ 6 MHz on vdda_dac 6 dB
TVOUT Bypass Mode, 100 mVpp @ 6 MHz on vdda_dac 20