SPRSP57E april   2020  – june 2023 DRA821U , DRA821U-Q1

PRODUCTION DATA  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
    1. 3.1 Functional Block Diagram
  5. 4 Revision History
  6. 5 Device Comparison
    1. 5.1 Related Products
  7. 6 Terminal Configuration and Functions
    1. 6.1 Pin Diagram
    2. 6.2 Pin Attributes
    3. 6.3 Signal Descriptions
      1. 6.3.1  ADC
        1. 6.3.1.1 MCU Domain
      2. 6.3.2  DDRSS
        1. 6.3.2.1 MAIN Domain
        2. 6.3.2.2 DDRSS Mapping
      3. 6.3.3  GPIO
        1. 6.3.3.1 MAIN Domain
        2. 6.3.3.2 WKUP Domain
      4. 6.3.4  I2C
        1. 6.3.4.1 MAIN Domain
        2. 6.3.4.2 MCU Domain
        3. 6.3.4.3 WKUP Domain
      5. 6.3.5  I3C
        1. 6.3.5.1 MAIN Domain
        2. 6.3.5.2 MCU Domain
      6. 6.3.6  MCAN
        1. 6.3.6.1 MAIN Domain
        2. 6.3.6.2 MCU Domain
      7. 6.3.7  MCSPI
        1. 6.3.7.1 MAIN Domain
        2. 6.3.7.2 MCU Domain
      8. 6.3.8  UART
        1. 6.3.8.1 MAIN Domain
        2. 6.3.8.2 MCU Domain
        3. 6.3.8.3 WKUP Domain
      9. 6.3.9  MDIO
        1. 6.3.9.1 MCU Domain
        2. 6.3.9.2 MAIN Domain
      10. 6.3.10 CPSW2G
        1. 6.3.10.1 MCU Domain
      11. 6.3.11 CPSW5G
        1. 6.3.11.1 MAIN Domain
      12. 6.3.12 ECAP
        1. 6.3.12.1 MAIN Domain
      13. 6.3.13 EQEP
        1. 6.3.13.1 MAIN Domain
      14. 6.3.14 EPWM
        1. 6.3.14.1 MAIN Domain
      15. 6.3.15 USB
        1. 6.3.15.1 MAIN Domain
      16. 6.3.16 SERDES
        1. 6.3.16.1 MAIN Domain
      17. 6.3.17 OSPI
        1. 6.3.17.1 MCU Domain
      18. 6.3.18 Hyperbus
        1. 6.3.18.1 MCU Domain
      19. 6.3.19 GPMC
        1. 6.3.19.1 MAIN Domain
      20. 6.3.20 MMC
        1. 6.3.20.1 MAIN Domain
      21. 6.3.21 CPTS
        1. 6.3.21.1 MAIN Domain
        2. 6.3.21.2 MCU Domain
      22. 6.3.22 MCASP
        1. 6.3.22.1 MAIN Domain
      23. 6.3.23 DMTIMER
        1. 6.3.23.1 MAIN Domain
        2. 6.3.23.2 MCU Domain
      24. 6.3.24 Emulation and Debug
        1. 6.3.24.1 MAIN Domain
      25. 6.3.25 System and Miscellaneous
        1. 6.3.25.1 Boot Mode Configuration
          1. 6.3.25.1.1 MAIN Domain
          2. 6.3.25.1.2 MCU Domain
        2. 6.3.25.2 Clock
          1. 6.3.25.2.1 MAIN Domain
          2. 6.3.25.2.2 WKUP Domain
        3. 6.3.25.3 System
          1. 6.3.25.3.1 MAIN Domain
          2. 6.3.25.3.2 WKUP Domain
          3. 6.3.25.3.3 VMON
        4. 6.3.25.4 EFUSE
      26. 6.3.26 Power Supply
    4. 6.4 Pin Multiplexing
    5. 6.5 Connections for Unused Pins
  8. 7 Specifications
    1. 7.1 Absolute Maximum Ratings
    2. 7.2 ESD Ratings
    3. 7.3 Recommended Operating Conditions
    4. 7.4 Power-On-Hours (POH)
    5. 7.5 Operating Performance Points
    6. 7.6 Electrical Characteristics
      1. 7.6.1  I2C, Open-Drain, Fail-Safe (I2C OD FS) Electrical Characteristics
      2. 7.6.2  Fail-Safe Reset (FS Reset) Electrical Characteristics
      3. 7.6.3  HFOSC Electrical Characteristics
      4. 7.6.4  eMMCPHY Electrical Characteristics
      5. 7.6.5  SDIO Electrical Characteristics
      6. 7.6.6  ADC12BT Electrical Characteristics
      7. 7.6.7  LVCMOS Electrical Characteristics
      8. 7.6.8  USB2PHY Electrical Characteristics
      9. 7.6.9  SERDES Electrical Characteristics
      10. 7.6.10 DDR Electrical Characteristics
    7. 7.7 VPP Specifications for One-Time Programmable (OTP) eFuses
      1. 7.7.1 Recommended Operating Conditions for OTP eFuse Programming
      2. 7.7.2 Hardware Requirements
      3. 7.7.3 Programming Sequence
      4. 7.7.4 Impact to Your Hardware Warranty
    8. 7.8 Thermal Resistance Characteristics
      1. 7.8.1 Thermal Resistance Characteristics
    9. 7.9 Timing and Switching Characteristics
      1. 7.9.1 Timing Parameters and Information
      2. 7.9.2 Power Supply Sequencing
        1. 7.9.2.1 Power Supply Slew Rate Requirement
        2. 7.9.2.2 Combined MCU and Main Domains Power- Up Sequencing
        3. 7.9.2.3 Combined MCU and Main Domains Power- Down Sequencing
        4. 7.9.2.4 Independent MCU and Main Domains Power- Up Sequencing
        5. 7.9.2.5 Independent MCU and Main Domains Power- Down Sequencing
        6. 7.9.2.6 Independent MCU and Main Domains, Entry and Exit of MCU Only Sequencing
        7. 7.9.2.7 Independent MCU and Main Domains, Entry and Exit of DDR Retention State
        8. 7.9.2.8 Independent MCU and Main Domains, Entry and Exit of GPIO Retention Sequencing
      3. 7.9.3 System Timing
        1. 7.9.3.1 Reset Timing
        2. 7.9.3.2 Safety Signal Timing
        3. 7.9.3.3 Clock Timing
      4. 7.9.4 Clock Specifications
        1. 7.9.4.1 Input Clocks / Oscillators
          1. 7.9.4.1.1 WKUP_OSC0 Internal Oscillator Clock Source
            1. 7.9.4.1.1.1 Load Capacitance
            2. 7.9.4.1.1.2 Shunt Capacitance
          2. 7.9.4.1.2 WKUP_OSC0 LVCMOS Digital Clock Source
          3. 7.9.4.1.3 Auxiliary OSC1 Internal Oscillator Clock Source
            1. 7.9.4.1.3.1 Load Capacitance
            2. 7.9.4.1.3.2 Shunt Capacitance
          4. 7.9.4.1.4 Auxiliary OSC1 LVCMOS Digital Clock Source
          5. 7.9.4.1.5 Auxiliary OSC1 Not Used
          6. 7.9.4.1.6 WKUP_LF_CLKIN Internal Oscillator Clock Source
          7. 7.9.4.1.7 WKUP_LF_CLKIN Not Used
        2. 7.9.4.2 Output Clocks
        3. 7.9.4.3 PLLs
        4. 7.9.4.4 Recommended Clock and Control Signal Transition Behavior
        5. 7.9.4.5 Interface Clock Specifications
          1. 7.9.4.5.1 Interface Clock Terminology
          2. 7.9.4.5.2 Interface Clock Frequency
      5. 7.9.5 Peripherals
        1. 7.9.5.1  ATL
          1. 7.9.5.1.1 ATL_PCLK Timing Requirements
          2. 7.9.5.1.2 ATL_AWS[x] Timing Requirements
          3. 7.9.5.1.3 ATL_BWS[x] Timing Requirements
          4. 7.9.5.1.4 ATCLK[x] Switching Characteristics
        2. 7.9.5.2  CPSW2G
          1. 7.9.5.2.1 CPSW2G RMII Timings
            1. 7.9.5.2.1.1 Timing Requirements for RMII[x]_REFCLK – RMII Mode
            2. 7.9.5.2.1.2 Timing Requirements for RMII[x]_RXD[1:0], RMII[x]_CRS_DV, and RMII[x]_RXER – RMII Mode
            3. 7.9.5.2.1.3 Switching Characteristics for RMII[x]_TXD[1:0], and RMII[x]_TXEN – RMII Mode
          2. 7.9.5.2.2 CPSW2G RGMII Timings
            1. 7.9.5.2.2.1 Timing Requirements for RGMII[x]_RCLK – RGMII Mode
            2. 7.9.5.2.2.2 Timing Requirements for RGMII[x]_RD[3:0], and RGMII[x]_RCTL – RGMII Mode
            3. 7.9.5.2.2.3 Switching Characteristics for RGMII[x]_TCLK – RGMII Mode
            4. 7.9.5.2.2.4 Switching Characteristics for RGMII[x]_TD[3:0], and RGMII[x]_TCTL – RGMII Mode
        3. 7.9.5.3  CPSW5G
          1. 7.9.5.3.1 CPSW5G MDIO Interface Timings
          2. 7.9.5.3.2 CPSW5G RMII Timings
            1. 7.9.5.3.2.1 Timing Requirements for RMII[x]_REFCLK – RMII Mode
            2. 7.9.5.3.2.2 Timing Requirements for RMII[x]_RXD[1:0], RMII[x]_CRS_DV, and RMII[x]_RXER – RMII Mode
            3. 7.9.5.3.2.3 Switching Characteristics for RMII[x]_TXD[1:0], and RMII[x]_TXEN – RMII Mode
          3. 7.9.5.3.3 CPSW5G RGMII Timings
            1. 7.9.5.3.3.1 Timing Requirements for RGMII[x]_RCLK – RGMII Mode
            2. 7.9.5.3.3.2 Timing Requirements for RGMII[x]_RD[3:0], and RGMII[x]_RCTL – RGMII Mode
            3. 7.9.5.3.3.3 Switching Characteristics for RGMII[x]_TCLK – RGMII Mode
            4. 7.9.5.3.3.4 Switching Characteristics for RGMII[x]_TD[3:0], and RGMII[x]_TCTL – RGMII Mode
        4. 7.9.5.4  DDRSS
        5. 7.9.5.5  ECAP
          1. 7.9.5.5.1 Timing Requirements for ECAP
          2. 7.9.5.5.2 Switching Characteristics for ECAP
        6. 7.9.5.6  EPWM
          1. 7.9.5.6.1 Timing Requirements for EPWM
          2. 7.9.5.6.2 Switching Characteristics for EPWM
        7. 7.9.5.7  EQEP
          1. 7.9.5.7.1 Timing Requirements for EQEP
          2. 7.9.5.7.2 Switching Characteristics for EQEP
        8. 7.9.5.8  GPIO
        9. 7.9.5.9  GPMC
          1. 7.9.5.9.1 GPMC and NOR Flash — Synchronous Mode
            1. 7.9.5.9.1.1 GPMC and NOR Flash Timing Requirements — Synchronous Mode
            2. 7.9.5.9.1.2 GPMC and NOR Flash Switching Characteristics – Synchronous Mode
          2. 7.9.5.9.2 GPMC and NOR Flash — Asynchronous Mode
            1. 7.9.5.9.2.1 GPMC and NOR Flash Timing Requirements – Asynchronous Mode
            2. 7.9.5.9.2.2 GPMC and NOR Flash Switching Characteristics – Asynchronous Mode
          3. 7.9.5.9.3 GPMC and NAND Flash — Asynchronous Mode
            1. 7.9.5.9.3.1 GPMC and NAND Flash Timing Requirements – Asynchronous Mode
            2. 7.9.5.9.3.2 GPMC and NAND Flash Switching Characteristics – Asynchronous Mode
        10. 7.9.5.10 HyperBus
          1. 7.9.5.10.1 Timing Requirements for HyperBus Initialization
          2. 7.9.5.10.2 HyperBus 166 MHz Switching Characteristics
          3. 7.9.5.10.3 HyperBus 100 MHz Switching Characteristics
        11. 7.9.5.11 I2C
        12. 7.9.5.12 I3C
        13. 7.9.5.13 MCAN
        14. 7.9.5.14 MCASP
          1. 7.9.5.14.1 Timing Requirements for MCASP
        15. 7.9.5.15 MCSPI
          1. 7.9.5.15.1 MCSPI — Controller Mode
          2. 7.9.5.15.2 MCSPI — Peripheral Mode
        16. 7.9.5.16 eMMC/SD/SDIO
          1. 7.9.5.16.1 MMCSD0 - eMMC Interface
            1. 7.9.5.16.1.1 Legacy SDR Mode
            2. 7.9.5.16.1.2 High Speed SDR Mode
            3. 7.9.5.16.1.3 High Speed DDR Mode
            4. 7.9.5.16.1.4 HS200 Mode
            5. 7.9.5.16.1.5 HS400 Mode
          2. 7.9.5.16.2 MMCSDi — MMCSD1 — SD/SDIO Interface
            1. 7.9.5.16.2.1 Default speed Mode
            2. 7.9.5.16.2.2 High Speed Mode
            3. 7.9.5.16.2.3 UHS–I SDR12 Mode
            4. 7.9.5.16.2.4 UHS–I SDR25 Mode
            5. 7.9.5.16.2.5 UHS–I SDR50 Mode
            6. 7.9.5.16.2.6 UHS–I DDR50 Mode
            7. 7.9.5.16.2.7 UHS–I SDR104 Mode
        17. 7.9.5.17 NAVSS
          1. 7.9.5.17.1 Timing Requirements for CPTS Input
          2. 7.9.5.17.2 Switching Characteristics for CPTS Output
        18. 7.9.5.18 OSPI
          1. 7.9.5.18.1 OSPI With Data Training
            1. 7.9.5.18.1.1 OSPI Switching Characteristics – Data Training
          2. 7.9.5.18.2 OSPI Without Data Training
            1. 7.9.5.18.2.1 OSPI Switching Characteristics – DDR Mode
            2. 7.9.5.18.2.2 OSPI Switching Characteristics – SDR Mode
            3. 7.9.5.18.2.3 OSPI Timing Requirements – DDR Mode
            4. 7.9.5.18.2.4 OSPI Timing Requirements – SDR Mode
        19. 7.9.5.19 PCIE
        20. 7.9.5.20 Timers
          1. 7.9.5.20.1 Timing Requirements for Timers
          2. 7.9.5.20.2 Switching Characteristics for Timers
        21. 7.9.5.21 UART
          1. 7.9.5.21.1 UART Timing Requirements
          2. 7.9.5.21.2 UART Switching Characteristics
        22. 7.9.5.22 USB
      6. 7.9.6 Emulation and Debug
        1. 7.9.6.1 Debug Trace
        2. 7.9.6.2 IEEE 1149.1 Standard–Test–Access Port (JTAG)
          1. 7.9.6.2.1 JTAG Electrical Data and Timing
            1. 7.9.6.2.1.1 Timing Requirements for IEEE 1149.1 JTAG
            2. 7.9.6.2.1.2 Switching Characteristics Over Recommended Operating Conditions for IEEE 1149.1 JTAG
  9. 8 Detailed Description
    1. 8.1 Overview
    2. 8.2 Processor Subsystems
      1. 8.2.1 Arm Cortex-A72
      2. 8.2.2 Arm Cortex-R5F
    3. 8.3 Other Subsystems
      1. 8.3.1 MSMC
      2. 8.3.2 NAVSS
        1. 8.3.2.1 NAVSS0
        2. 8.3.2.2 MCU_NAVSS
      3. 8.3.3 PDMA Controller
      4. 8.3.4 Peripherals
        1. 8.3.4.1  ADC
        2. 8.3.4.2  ATL
        3. 8.3.4.3  CPSW2G
        4. 8.3.4.4  CPSW5G
        5. 8.3.4.5  DCC
        6. 8.3.4.6  DDRSS
        7. 8.3.4.7  ECAP
        8. 8.3.4.8  EPWM
        9. 8.3.4.9  ELM
        10. 8.3.4.10 ESM
        11. 8.3.4.11 EQEP
        12. 8.3.4.12 GPIO
        13. 8.3.4.13 GPMC
        14. 8.3.4.14 Hyperbus
        15. 8.3.4.15 I2C
        16. 8.3.4.16 I3C
        17. 8.3.4.17 MCAN
        18. 8.3.4.18 MCASP
        19. 8.3.4.19 MCRC Controller
        20. 8.3.4.20 MCSPI
        21. 8.3.4.21 MMC/SD
        22. 8.3.4.22 OSPI
        23. 8.3.4.23 PCIE
        24. 8.3.4.24 SerDes
        25. 8.3.4.25 WWDT
        26. 8.3.4.26 Timers
        27. 8.3.4.27 UART
        28. 8.3.4.28 USB
  10. 9 Applications, Implementation, and Layout
    1. 9.1 Power Supply Mapping
    2. 9.2 Device Connection and Layout Fundamentals
      1. 9.2.1 Power Supply Decoupling and Bulk Capacitors
        1. 9.2.1.1 Power Distribution Network Implementation Guidance
      2. 9.2.2 External Oscillator
      3. 9.2.3 JTAG and EMU
      4. 9.2.4 Reset
      5. 9.2.5 Unused Pins
      6. 9.2.6 Hardware Design Guide for JacintoTM 7 Devices
    3. 9.3 Peripheral- and Interface-Specific Design Information
      1. 9.3.1 LPDDR4 Board Design and Layout Guidelines
      2. 9.3.2 OSPI and QSPI Board Design and Layout Guidelines
        1. 9.3.2.1 No Loopback and Internal Pad Loopback
        2. 9.3.2.2 External Board Loopback
        3. 9.3.2.3 DQS (only available in Octal Flash devices)
      3. 9.3.3 USB VBUS Design Guidelines
      4. 9.3.4 System Power Supply Monitor Design Guidelines
      5. 9.3.5 High Speed Differential Signal Routing Guidance
      6. 9.3.6 Thermal Solution Guidance
  11. 10Device and Documentation Support
    1. 10.1 Device Nomenclature
      1. 10.1.1 Standard Package Symbolization
      2. 10.1.2 Device Naming Convention
    2. 10.2 Tools and Software
    3. 10.3 Documentation Support
    4. 10.4 Support Resources
    5. 10.5 Trademarks
    6. 10.6 Electrostatic Discharge Caution
    7. 10.7 Glossary
  12. 11Mechanical, Packaging, and Orderable Information
    1. 11.1 Packaging Information

Package Options

Refer to the PDF data sheet for device specific package drawings

Mechanical Data (Package|Pins)
  • ALM|433
Thermal pad, mechanical data (Package|Pins)
Orderable Information

9.1 Power Supply Mapping

TPS6594x and LP8764x are the Power Management ICs (PMIC) that should be used for Power Distribution Network (PDN) designs to support this device. TI requires use of these PMICs for the following reasons:

  • TI has validated their use with the Device
  • Board level margins including transient response and output accuracy are analyzed and optimized for the entire system
  • Support for power sequencing requirements (refer to Section 7.9.2, Power Supply Sequences)
  • Support for Adaptive Voltage Scaling (AVS) Class 0 requirements, including TI provided software

When combining device voltage domains into a common power rail is allowed, the most strigent voltage domain PDN guideline must be implemented for the common power rail.

It is possible that some device voltage domains may be unused in some systems. In such cases, all unused voltage domain supply pins must still be connected to a valid power rail with a proper voltage level in order to ensure device reliability (refer to Section 4.3, Signal Descriptions). For example, if MCU is not used, then vdd_mcu domain can be combined with the CORE domain (vdd_core) that has the same voltage specifications. A buck converter power stage connected to the common power rail would then supply both CORE and MCU domains.

For the combined rail, the following relaxations apply:

  • The AVS voltage of active rail in the combined rail needs to be used to set the power supply
  • The decoupling capacitance should be set according to the active rail in the combined rail

Figure 9-1 shows an example of the detailed power mapping between the processor and TPS659414-Q1 and LP876441-Q1 PMICs. In this configuration, both PMIC devices use a 3.3V input voltage. For more details, refer to the appnote titled “User's Guide for Powering DRA821 with the TPS6594-Q1 and LP8764-Q1 PMICs".

GUID-2BE1C60F-BFD1-40A0-A27E-9DB925011FF0-low.gif Figure 9-1 TPS6594-Q1 and LP8764-Q1 Digital Connections
Table 9-1 Combined MCU and Main Voltage Domain Power Rail Mapping
TYPES VOLTAGE [V] DOMAIN NAMES DOMAIN TYPES POWER RAILS #
Digital IO 3.3 (VDDSHV0_MCU, VDDSHV1_MCU, VDDSHV2_MCU, VDDSHV0, VDDSHV2, VDDSHV5(3))(1), VDDA_3P3_USB(4) VDDSHVn_MCU,VDDSHVn, VDDA_3P3_USB(1) VDD_IO_3V3 1
Digital IO 1.8 (VDDSHV0_MCU, VDDSHV1_MCU, VDDSHV2_MCU, VDDSHV0, VDDSHV2, VDDSHV5(3))(2) , VDDS_MMC0 VDDSHVn_MCU3 VDDSHVn(2), (3) VDD_IO_1V8 2
Analog PHY 1.8

(VDDA_MCU_PLLGRP0, VDDA_MCU_TEMP, VDDA_ADC_MCU, VDDA_POR_WKUP, VDDA_WKUP,

VDDA_OSC1, VDDA_PLLGRP8,6,4,0, VDDA_TEMP1:0)(5), VDDA_1P8_USB, VDDA_1P8_SERDES)(6)		 VDDA_1P8_<clk/meas>(5) VDDA_1P8_<phy>(6) VDA_LN_1V8(6), (7) 3
Analog, low voltage 0.80 (VDDA_0P8_PLL_DDR, VDDA_0P8_DLL_MMC0)(7) VDDA_0P8_DPLL VDA_DPLL_0V8 4
Digital, AVS low voltage 0.77 – 0.84 VDD_CPU VDD_CPU VDD_CPU_AVS 5
Digital, low voltage 0.80 VDD_MCU9, VDD_MCU_WAKE1,VDD_CORE,VDD_WAKE0, (VDDA_0P8_SERDES, VDDA_0P8_USB) VDD_MCU

VDD_CORE VDDA_0P8_<phy>

 VDD_CORE_0V8 6
Digital, low voltage 0.85 VDDAR_MCU,VDDAR_CORE, VDDAR_CPU VDDAR VDD_RAM_0V85 7
Digital, low voltage 1.1 VDDS_DDR_BIAS, VDDS_DDR, VDDS_DDR_C VDDS_DDR VDD_DDR_1V1 8
(1) Any MCU or Main dual voltage IO domains (VDDSHVn_MCU or VDDSHVn) being supplied by 3.3V to support 3.3V digital interfaces
(2) Any MCU or Main dual voltage IO domains (VDDSHVn_MCU or VDDSHVn) being supplied by 1.8V to support 1.8V digital interfaces
(3) VDDSHV5 supports MMC1 signaling for SD memory cards. A dual voltage (3.3/1.8V) power rail is required for compliant, high-speed SD card operations. If SD card is not needed or standard data rates with fixed 3.3V operation is acceptable, then domain can be grouped with digital IO 3.3V power rail. If a SD card is capable of operating with fixed 1.8V, then domain can be grouped with digital IO 1.8V power rail.
(4) VDDA_3P3_USB is 3.3V analog domain used for USB 2.0 differential interface signaling. A low noise, analog supply is recommended to provide best signal integrity for USB data eye mask compliance. If USB interface is not needed or data bit errors can be tolerated, then domain can be grouped with 3.3V digital IO power rail either directly or through a supply filter.
(5) VDDA_1P8_<clk/pll/ana> are 1.8V analog domains supporting clock oscillator, PLL and analog circuitry needing a low noise supply for optimal performance. It is not recommended to combine digital VDDSHVn_MCU and VDDSHVn IO domains since high frequency switching noise could negatively impact jitter performance of clock, PLL and DLL signals. Combining analog VDDA_1p8_<phy> domains should be avoided but if grouped, then in-line ferrite bead supply filtering is required.
(6) VDDA_1P8_<phy> are 1.8V analog domains supporting multiple serial PHY interfaces. A low noise, analog supply is recommended to provide best signal integrity, interface performance and spec compliance. If any of these interfaces are not needed, data bit errors or non-compliant operation can be tolerated, then domains can be grouped with digital IO 1.8V power rail either directly or through an in-line supply filter is allowed.
(7) VDDA_0P8_<dll/pll> are 0.8V analog domains supporting PLL and DLL circuitry needing a low noise supply for optimal performance. It is not recommended to combine these domains with any other 0.8V domains since high frequency switching noise could negatively impact jitter performance of PLL and DLL signals.
Table 9-2 Independent MCU and Main Voltage Domain Power Rail Mapping
TYPES VOLTAGE [V] DOMAIN NAMES DOMAIN GROUPS POWER RAILS #
Digital IO 3.3 (VDDSHV0_MCU, VDDSHV1_MCU, VDDSHV2_MCU)1 VDDSHVn_MCU VDD_MCUIO_3V3 1
Digital IO 3.3 (VDDSHV0, VDDSHV2, VDDSHV53)2, VDDA_3P3_USB4 VDDSHVn, VDDA_3P3_USB11 VDD_IO_3V3 2
Digital IO 1.8 (VDDSHV0_MCU, VDDSHV1_MCU, VDDSHV2_MCU)2 VDDSHVn_MCU2 VDD_MCUIO_1V8 3
Digital IO 1.8 (VDDSHV0, VDDSHV2, VDDSHV53)2, VDDS_MMC0 VDDSHVn23 VDD_IO_1V8 4
Analog Clk, Meas 1.8 (VDDA_MCU_PLLGRP0, VDDA_MCU_TEMP, VDDA_ADC_MCU, VDDA_POR_WKUP, VDDA_WKUP)2 VDDA_MCU1P8_<clk/meas> VDA_MCU_1V8 5
Analog Clk, Meas 1.8 VDDA_OSC1, VDDA_PLLGRP8,6,4,0, VDDA_TEMP1:0 VDDA_1P8_<clk/meas> VDA_PLL_1V8 6
Analog PHY 1.8 (VDDA_1P8_USB, VDDA_1P8_SERDES)6 VDDA_1P8_<phy>6 VDA_PHY_1V87 7
Analog, low voltage 0.80 (VDDA_0P8_PLL_DDR, VDDA_0P8_DLL_MMC0)7 VDDA_0P8_DPLL VDA_DLL_0V8 8
Digital, low voltage 0.85 VDD_MCU8, VDD_MCU_WAKE1, VDDAR_MCU VDD_MCU VDDAR_MCU VDD_MCU_0V8
Digital, AVS low voltage 0.77 – 0.84 VDD_CPU VDD_CPU VDD_CPU_AVS 9
Digital, low voltage 0.80 VDD_CORE,VDD_WAKE0, (VDDA_0P8_SERDES, VDDA_0P8_USB) VDD_CORE VDDA_0P8_<phy> VDD_CORE_0V8 10
Digital, low voltage 0.85 VDDAR_CORE, VDDAR_CPU VDDAR VDD_RAM_0V85 11
Digital, low voltage 1.1 VDDS_DDR_BIAS, VDDS_DDR, VDDS_DDR_C VDDS_DDR VDD_DDR_1V1 12
  1. Any MCU or Main dual voltage IO domains (VDDSHVn_MCU or VDDSHVn) being supplied by 3.3V to support 3.3V digital interfaces
  2. Any MCU or Main dual voltage IO domains (VDDSHVn_MCU or VDDSHVn) being supplied by 1.8V to support 1.8V digital interfaces
  3. VDDSHV5 supports MMC1 signaling for SD memory cards. A dual voltage (3.3/1.8V) power rail is required for compliant, high-speed SD card operations. If SD card is not needed or standard data rates with fixed 3.3V operation is acceptable, then domain can be grouped with digital IO 3.3V power rail. If a SD card is capable of operating with fixed 1.8V, then domain can be grouped with digital IO 1.8V power rail.
  4. VDDA_3P3_USB is 3.3V analog domain used for USB 2.0 differential interface signaling. A low noise, analog supply is recommended to provide best signal integrity for USB data eye mask compliance. If USB interface is not needed or data bit errors can be tolerated, then domain can be grouped with 3.3V digital IO power rail either directly or through a supply filter.
  5. VDDA_1P8_<clk/pll/ana> are 1.8V analog domains supporting clock oscillator, PLL and analog circuitry needing a low noise supply for optimal performance. It is not recommended to combine digital VDDSHVn_MCU and VDDSHVn IO domains since high frequency switching noise could negatively impact jitter performance of clock, PLL and DLL signals. Combining analog VDDA_1p8_<phy> domains should be avoided but if grouped, then in-line ferrite bead supply filtering is required.
  6. VDDA_1P8_<phy> are 1.8V analog domains supporting multiple serial PHY interfaces. A low noise, analog supply is recommended to provide best signal integrity, interface performance and spec compliance. If any of these interfaces are not needed, data bit errors or non-compliant operation can be tolerated, then domains can be grouped with digital IO 1.8V power rail either directly or through an in-line supply filter is allowed.
  7. VDDA_0P8_<dll/pll> are 0.8V analog domains supporting PLL and DLL circuitry needing a low noise supply for optimal performance. It is not recommended to combine these domains with any other 0.8V domains since high frequency switching noise could negatively impact jitter performance of PLL and DLL signals.
  8. VDD_MCU is a digital voltage domain with a wide range enabling it to be grouped and ramped-up with either 0.8V VDD_CORE or 0.85V RAM array (VDDAR_xxx) domains.